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Thin Film Thickness and Refractive Index

Thin Film Thickness and Refractive Index

We provide a range of measurement systems including a Prism Coupler for measuring Thin Film Thickness and Refractive Index and a Spectroscopic technique for single and multilayer translucent film stacks. We can also provide refractive index measurement services over a wide range of ...
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  1. Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

    Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

    The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:

    • Refractive index and birefringence of bulk materials
    • Refractive index and thickness of thin films
    • Optical waveguide loss
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  2. Optical Measurement Services - Refractive Index, Dispersion and dN/dT

    Optical Measurement Services - Refractive Index, Dispersion and dN/dT

    Optical Measurement Services - Refractive Index, Dispersion and dN/dT Learn More

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  3. MProbe Thin Film Measurement System

    MProbe Thin Film Measurement System

    The MProbe system is a complete solution for measuring the thickness of single and multilayer translucent film stacks.

    • Non-contact measurement
    • Spectroscopic technique
    • Multilayer film stacks
    • 1nm to 1mm layer thickness (system dependent)
    • Measure thickness, refractive index, surface roughness
    • Cost effective solution
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