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Lambda News

Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.

  • Keysight Technologies - Score 2 Scopes for the Price of 1

     

    Receive a complimentary InfiniiVision DSOX1102G 100 MHz Oscilloscope when you buy a qualifying InfiniiVision Oscilloscope.

     

    Our Keysight InfiniiVision Oscilloscopes simplify your debug. See more of your signal with the industry’s fastest waveform update. Do more with up to 6 instruments in 1; oscilloscope, frequency response analyzer, function generator, DVM, counter, and protocol analyzer. You get more with fully upgradeable bandwidth and loads of applications.

    For more details please download the flyer or contact us on 01582 764334 or contact@lambdaphoto.co.uk

  • Lambda Photometrics partners with Keysight Technologies UK

    Lambda, a leading distributor and service provider of test and measurement equipment, today announces the signing of a distribution agreement with Keysight UK to supply Keysight’s comprehensive range of test and measurement products and semiconductor test solutions to customers across the UK.

    As part of the agreement, Lambda will sell, support and maintain stock of a comprehensive range of Keysight products, for electronics manufacturers, high performance production testing, product development, fundamental research and teaching labs, included are:

    • Oscilloscopes with compliance and debugging software. Bandwidths from 50MHz to 1.5GHz with 5GSa/s sample rates.
    • Low level measurement and sourcing, including femto, picometer, electrometer and high resistance meters
    • High performance DC Power Supplies, AC Power Sources and Electronic Loads
    • BenchVue software for design and validation work
    • Digital Multimeters and Data acquisition products
    • Waveform generators and Frequency Counters
    • Source and measure units, SMU products
    • Semiconductor and materials test systems
    • Hand held instruments including: DMM’s, Insulation Resistance meters, Clamp Meters and Thermal imagers.

    New Keysight products now available are:

    • Ultra-Low cost oscilloscopes from 50-100MHz. The InfiniiVision 1000 X-Series uses Keysight’s unique MegaZoom IV custom ASIC technology, which enables a high 50,000 waveforms per second update rate. This makes it easier to see random and infrequent glitches and anomalies that similarly-priced oscilloscopes might miss. The 1000 X-Series also has a high sampling rate of up to 2 GSa/s and comes as standard, with two probes.
    • The Model B2900A series source measure units (SMU’s) provide best-in-class performance for a modest price. They have broad voltage (210V) and current (3A DC and 10.5A pulsed) sourcing capability, excellent precision (minimum 10fA/100nV sourcing and measuring resolution) and possess a superior colour LCD graphical user interface. In addition, several task-based viewing modes dramatically improve productivity for test, debug and characterisation.
    • BenchVue software for the PC reinvents your bench testing by making it simple to connect and record results from your instruments with no programming. You will derive answers faster than ever by easily viewing, logging and exporting measurement data and screen images with a few clicks from a single environment. Use BenchVue to: – Visualise multiple measurements simultaneously – Easily log data, screen images and system state – Recall past state of your bench to replicate results.

    Ian Ramsay, Lambda’s Managing Director, said: “We are delighted that Keysight have chosen to work with us in the UK.  Their name and products significantly enhance our portfolio and can only be of benefit to our customers.  We are all excited about this opportunity and are looking forward to working with the Keysight team”.

    Martin Dinmore, Sales Manager for the UK and Ireland at Keysight, added: “We were really impressed with the technical expertise and customer focused setup at Lambda. Their strong understanding of our products and  customers’ applications will provide an excellent complement to Keysight’s existing sales infrastructure.  I’m delighted to welcome Lambda on board”.

    For further information, please contact Lambda at 01582 764 334 or contact@lambdaphoto.co.uk

    -Ends-

    About Lambda Photometrics

    Lambda Photometrics Ltd (www.lambdaphoto.co.uk) is a leading supplier of test and measurement equipment, for the characterisation, measurement and analysis of materials and devices. Celebrating 40 years of sales and support in the UK and Ireland, Lambda staff pride themselves on understanding customers applications and providing excellent communication, support and advice.

    About Keysight Technologies

    Keysight Technologies (NYSE: KEYS) helps customers bring breakthrough electronic products and systems to market faster and at a lower cost. Keysight’s solutions go where the electronic signal goes, from design simulation, to prototype validation, to manufacturing test, to optimization in the network. Customers span the worldwide communications ecosystem, internet infrastructure, aerospace & defence, automotive, semiconductor and general electronics end markets. Keysight generated revenues of $2.9B in fiscal year 2016. More information is available at www.keysight.com.

  • Onefive releases a new 100W picosecond laser, the Genki – 10 XP, for advanced material processing

    Lambda Photometrics are pleased to announce release of the new Genki – 10 XP picosecond laser from Onefive GmbH, featuring 100W output power in a new and compact package for optimal and cost-effective workstation integration.

    The Genki – 10 XP platform further advances the industrialisation of high energy and high power picosecond lasers. Based on Onefive’s ultra-stable Genki seed laser, this new laser provides clean pulses shorter than 10 ps, which is an optimal pulse duration for many micromachining applications. To satisfy the increasing demand for picosecond laser workstations, the Genki – 10 XP has been optimised to provide up to 100 W of average power and 300 μJ pulse energy at the industry-standard wavelength of 1064 nm. Wavelength conversion options are available for 532nm and 355nm. Pulse repetition rates from single-shot up to 80 MHz can be achieved, together with burst-mode operation, and this laser can also be tailored to work at lower repetition rates with even higher pulse energies.

    The Genki – 10 XP has been designed to provide the simplest and most cost-effective possible system integration. It is an all-in-one design containing seed laser, amplifier and driving/timing electronics in one box. The laser can be completely controlled by RS232 offering full remote control capability. It offers excellent pointing stability and is maintenance-free.

    Picosecond laser-based micromachining and industrial production is proven to have several advantages for quality control, high-precision, and lack of post production needs. Nevertheless high-power pulsed lasers remain expensive and complex for many standard industrial processes. The Genki – 10 XP has been developed to remove these constraints offering a compact, cost-effective and long lasting product. It has been especially designed for micro-machining and several other industrial applications, and was shown for the first time at Photonics West 2017 in San Francisco.

    Click here for more information. To speak with a Sales & Applications Engineer please call 01582 764334 or click here to email.

  • SMU selection guide

    If you need help in deciding which is the best source measure unit for you application, the Keysight Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. This selection guide will help you select the right instrument for your requirement.

    If you have further questions please contact our Test & Measurement team on 01582 764334  or send an email.

     

  • Customer Testimonial: Researching the chemical nature of production faults

    Mosa creators of award-winning, leading edge, high tech tile for walls, floors and terraces, began barely a year ago to work with SEM, an advanced electron microscopy technology. In that short space of time, however, the device that is the size of an old PC has proved its effectiveness, helping Mosa achieve a significant step in its efforts to research the chemical nature of production faults.

    Berry Veltman, who works in process technology in the floor tile factory, is an enthusiastic speaker. Not only does he explain with verve and SEM-techniek | SEM technology 37 conviction what SEM does, he also explains how the device puts an end to speculations about disruptions to production and how it can show us the ‘way to truth,’ as Barry puts it. The editorial office spoke with the 26-year-old chemist, and tried to get to the bottom of how the SEM technology could deliver added value for Mosa.

    How does SEM technology work?
    ‘The sample we want to investigate is placed into a vacuum chamber, in which it is shot with a focused beam of electrons. By using detectors, it is possible to form an image with the ‘reflected’ or ‘backscattered’ electrons. The advantage of this image lies in its high magnification factor: being able to magnify an image by up to 100,000 times enables us to see even the primary clay plates, which are just a couple of tens of nanometres thick.

    It even allows us to see the smallest pores that are present on the tile surface which we would be unable to see with an optical microscope. We can also use this technology to conduct topographical analyses of features such as the roughness of a surface. However, the device’s major advantage is that it enables us to conduct localized chemical analyses on, for instance, an impurity which causes our end products to be rejected. This means that we can carry out more targeted improvements in the production process, which in turn allows us to reduce the number of defective tiles.’

    What do you mean by ‘defective’ tiles?
    ‘One of the most important things for us as a tile producer is that we maintain constant quality in our tiles. However, removing defective tiles from the process at the end of the production process is a costly procedure. In 2015, an average of 91.9% tiles produced in VTF were approved the first time round. In the past, investigating the origin of these faults was often problematic: whilst there would be lots of discussion, hard facts and evidence were often lacking.’

    Could you give us a concrete example?
    ‘One of the frequently occurring problems is minuscule irregularities in the top layer of our tiles. You could imagine these as minuscule nodules. These are a recurrent problem, and we assumed that they were linked to inhomogeneous features. SEM enables us to carry out a chemical analysis of these nodular defects. This technology has provided us with the answer to questions such as: what is the chemical nature of these nodules or cavities?

    In which component of the production process can the cause be identified? What is the mass’s composition at that point and to what extent does this deviate from the rest of the top layer? In the past, we were often unable to answer similar essential questions. Thanks to SEM technology, we have been able to conduct analyses in greater detail and identify increased concentrations of carbon or iron in many cases with similar nodular defects. Thanks to these analyses, 2016 saw the beginning of a project which uses magnets to effectively remove iron from these masses.’

    But carrying out analyses is surely nothing new?
    ‘That’s true, but SEM enables us to conduct analyses up to a nanoscale. What’s more, the device also provides us with information about the material composition of the nodules. This information is used to investigate whether the composition contains unusual substances, whether there’s an excess of a certain substance, or whether the concentration of a substance deviates from the norm. Data such as this is essential in order to understand and tackle the problem.’

    Together with his colleague Stan Szreder, Berry Veltman is applying the SEM technology in various research projects. The duo say that SEM technology can be used in many areas and is in no way restricted to analyses on samples. Both chemists are convinced that the device can make a substantial contribution to the optimisation of the production process.

    Pollution in carbonic irregularity in floor tile / Analysis spectrum with peaks which are characteristic of the measured elements

     

    Reference: This interview was published in the Mosa Magazine, Nr. 1, December 2015, pages 36-37.

  • Automating a Laser Induced Damage Threshold test (LIDT)

    Intense laser light can damage optical components like mirrors, optical coatings, or fibres. For the selection of the right optical components, it is important to find out at what dose of energy causes damage to a component, or permanently changes its optical characteristics.

    BSD SEM image of laser-induced damage on an optical coating

    To determine the exact effect of specific doses of energy, a Laser Induced Damage Threshold test is performed. The optical component is exposed to different intensities and wavelengths of laser light in a grid pattern. After the exposure to laser light, the component is inspected for damage using different types of optical microscopes and SEM. The grid can contain hundreds of different points — and each point has to be inspected. Performing this test manually would demand a lot of your time.

    With the Phenom Programmable Interface, a script is created to acquire images automatically for each point. The script works by uploading a list of coordinates that is created by the laser. You then calibrate the stage on two points, after which the script proceeds to image each point at a selected magnification.

    User interface of the LIDT scan script: the small red and green dots represent points where the optical coating was exposed to laser light.

    All the images are stored in the selected folder for you to inspect. If a specific point requires closer inspection, that point can easily be found by clicking on it in the user interface. Automating this process saves you time; time that you would normally invest in the acquisition of your images. Now, you can just click on the images and check if there is any damage.

    If you would like to know how the Phenom XL and Programming Interface will help you save significant amounts of time, Learn how you can become a more efficient operator by automating your SEM work.

    Click here to download  our free Programming Interface specification sheet.

     

    About the author: Ruud Bernsen is Technical Sales Engineer at Phenom-World, the world’s leading supplier of desktop scanning electron microscopes. He provides training and product support to his customers in The Netherlands. In addition Ruud arranges product demonstrations for companies and universities to show the possibilities of the Phenom product range.

  • Lamdamap 12th International Conference & Exhibition

    The 12th International Conference and Exhibition on Laser Metrology, Coordinate Measuring Machine and Machine Tool Performance, (LAMDAMAP 2017)

    Wednesday-Thursday, 15-16th March 2017.

    Renishaw Innovation Centre, Wotton-under-Edge, Gloucestershire

    Click here for more information

  • Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF

    BSE-SEM images and EDS mapping were acquired on a Phenom ProX Desktop microscope with an accelerating voltage of 5–15 kV for BSE-SEM images and 15 kV for EDS mapping.

    Tiesheng Wang, Meisam Farajollahi, Sebastian Henke, Tongtong Zhu, Sneha R. Bajpe,a Shijing Sun,a Jonathan S. Barnard, June Sang Lee, John D. W. Madden, Anthony K. Cheethama and Stoyan K. Smoukov

    Reactions inside the pores of metal–organic frameworks (MOFs) offer potential for controlling polymer structures with regularity to sub-nanometre scales. We report a wet-chemistry route to poly-3,4-ethylenedioxythiophene (PEDOT)–MOF composites. After a twostep removal of the MOF template we obtain unique and stable macroscale structures of this conductive polymer with some nanoscale regularity.

    Click here to read full article.

     

     

    Article courtesy of The Royal Society of Chemistry, Materials Horizons publication

  • Compliant list for Baumer industrial cameras - USB 3.0

    The equipment listed below has been tested successfully with the following Baumer camera models featuring the USB 3.0 interface.

    Products

    • VCXU cameras
    • VEXU cameras
    • MXU cameras
    • VLU cameras
    • PXU cameras

     

    Click here for more information

  • Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)

    The equipment listed below has been tested successfully with the following Baumer camera models featuring GigE interface.

    Products

    • VisiLine® cameras
    • VisiLine® IP cameras
    • HXG cameras
    • SXG cameras
    • TXG cameras
    • LXG cameras
    • EXG cameras
    • VCXG cameras
    • MXG cameras
    • VEXG cameras

     

    Click here for more information

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