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Fizeau interferometry has come a long way in the last decade. Driven by the need to support production-floor applications and challenging test setups, interferometers have adapted to deal with all types of environments, while preserving their key attribute – precision. https://youtu.be/ez5JgYo1CoM Exactly what is possible, and what solutions are out there? This webinar explores that question, focusing on novel approaches and...

Complex asphere metrology ideally suited for production-level volumes. Advances in diamond turning and small-tool deterministic polishing have dramatically increased optical manufacturing capabilities to produce nearly any surface shape. Designers have leveraged these capabilities by increasingly designing aspheric optics into imaging, sensing and laser systems to improve performance and reduce size and weight of optical systems. However, it isn’t just the polishing equipment...

Here are some questions you must ask yourself when buying a new Sputter Coater for SEM sample preparation: Q. Is my trusty 25 years old coater really delivering the coating quality I need in the modern world of microscopy?A. Probably not Q. Is the quality of my SEM images being compromised by my substandard sputter coater performance?A. Definitely/Maybe  Q. Does the best coating quality really...

The synthetic fluoropolymer of tetrafluoroethylene AKA Polytetrafluoroethylene (PTFE) and its analogues are strongly hydrophobic and having low surface energies of less than 18 dyn/cm are perhaps best-known for their non-stick properties. This low surface energy along with PTFE’s high electrical insulating properties can make sputter coating with noble metals prior to SEM a real challenge. Not anymore. Image courtesy of...

This question is of interest to many manufacturers today. Why? Because more of them are making high precision, small-scale components that are critical to the function of a host of end products. A company’s livelihood may mandate that the components they use in their products are uniform, definable, and "high-precision". This is where an understanding of smoothness is helpful. So...

Your invitation... The growing diversity in the used materials in semiconductor packaging provides challenges for achieving good interconnection. Particularly the very soft substrates, such as paper and polymers, and very hard, such as silicon carbide, offer unique challenges to wire-bonding or the formation of vertical interconnects.  Complementary technologies are therefore needed.  Using the prototype of the VSP-P1 NanoPrinter, Joost van Ginkel developed a method...

The new LUNA OBR 6235 brings ultra-high resolution analysis of distributed loss and latency measurements to data centres with longer measurement range in a portable, easy-to-use system. The OBR 6235 extends the measurement length of the portable OBR family out to 500m, making it ideal for rack-to-rack connections and other intra-data centre links. The OBR 6235 is portable, battery-powered, features...

Ford Motor Company is an American multi-national automaker that recently announced a plan to invest US$22 billion through 2025 in the electrification of their mobility products. The ChallengeIn electric vehicles (EVs), new processing methods for gears must convert the high-force torque from electric motors to the RPMs at the wheel. This much be achieved while also reaching the consumer's intended...

The Resolv4K modular video microscope system has been designed for superior visible wavelength axial color correction; but did you know about our VIS-NIR (Visible through Near Infrared) and SWIR options? The coating choices and design efficiency make this system the ideal SWIR camera complement for use applications such as: SWIR MicroscopySemiconductor AnalysisThrough Silicon ImagingPCB InspectionSolar Cell InspectionSpectrometryForensicsChemical AnalysisResearch SWIR and Vis-NIR options...

SEM cross section contaminated during EBSD analysis (left); after plasma cleaning (right). Successful imaging and analyses depends upon the quality of the sample preparation. An integral step in the sample preparation to imaging workflow is contamination removal. The simplest and most effective method for removing surface contamination is plasma cleaning, which removes hydrocarbons without causing sample damage. By integrating plasma...