Zygo Open Seminar in association with EMAN

27 November 2007

High Performance Non-Contact Surface Metrology for Manufacturing and R&D

Wednesday 6th February 2008

Choice of morning or afternoon session to maximise use of your time
An introduction to interferometric surface metrology for managers and technical personnel engaged in manufacturing or R&D
Gain a better understanding of the application of interferometry
Demonstrations of Scanning White Light and Fizeau Interferometers for detailed surface profiling and surface form measurement
An opportunity to have samples measured – contact us in advance for more details
Industry sectors: Defence, Aerospace. Optics, Precision Diamond Machining, Automotive, Medical Devices, Semiconductor, MEMS
This event is FREE OF CHARGE

Choose Morning or Afternoon Session

9.30 - 2.00	Morning

09.30	Registration

10.00–10.30	An introduction to interferometric surface metrology – Dr Carol David Daniel, Lambda Photometrics Ltd

10.30–11.00	Characterising MEMS: A comparison of the techniques available Characterisation is an important process in the development of any MEMS sensor. Newcastle University, utilise the optical techniques of vibrometry, interferometry and Raman spectroscopy. Case studies will be discussed which highlights the advantages of each of these techniques – Dr John Hedley, University of Newcastle

11.00–11.30	Fundamental limitations when using vertical scanning white light interferometers. Vertical scanning white light interferometers are very versatile instruments for measuring the topography of a vast range of surfaces. However, when using such instruments one has to be aware that they have some fundamental limitations that are due to their operating principles and the way in which they are used. The talk will discuss these limitations and present some examples of comparisons that highlight the limitations – Dr Richard Leach, NPL

11.30–1.00	Tea & coffee break, demonstrations, Q & A session

1.00–2.00	Lunch – networking with morning and afternoon session’s delegates

12.45 - 5.00	Afternoon

12.45	Registration

1.00–2.00	Lunch – networking with morning and afternoon session’s delegates

2.00–2.30	An introduction to interferometric surface metrology – Dr Carol David Daniel, Lambda Photometrics Ltd

2.30–3.00	Application of interferometric metrology to corrective polishing of precision surfaces: Interferometry plays a key role in the process loop when polishing precision optics and other surfaces. The methodology used will be explored highlighting how to exploit its strengths together with how to use complementary metrology to mitigate some of its limitations – Roger Morton, Operations Director, Zeeko Ltd

3.00–3.30	Fundamental limitations when using vertical scanning white light interferometers. Vertical scanning white light interferometers are very versatile instruments for measuring the topography of a vast range of surfaces. However, when using such instruments one has to be aware that they have some fundamental limitations that are due to their operating principles and the way in which they are used. The talk will discuss these limitations and present some examples of comparisons that highlight the limitations – Dr Richard Leach, NPL

3.30–5.00	Tea & coffee break, demonstrations, Q & A session

Venue: National Physical Laboratory, Teddington, Middlesex TW11 0LW

Lambda Photometrics

The leading supplier of cutting edge technology

Zygo Open Seminar in association with EMAN

27 November 2007

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