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Scanning Probe Microscopes from APE Research

21 January 2009

Lambda Photometrics is pleased to annouce the signing of a distribution contract with APE Research for sales, support and service of their high-resolution Scanning Probe Microscopes within the UK & Ireland.

APE Research are an Italian based manufacturer of high-resolution Scanning Probe Microscopes (SPM), whose range includes Atomic Force Microscopes (AFM), Scanning Tunnelling Microscopes (STM) and Scanning Near-field Optical Microscopes (SNOM)

Atomic Force Microscopes

AFM

The AFM range includes the A50-AFM which provides closed-loop X-Y positioning to achieve an absolute positioning accuracy of 2nm, and the low-cost R80-AFM with open-loop positioning.

AFM product page >

Scanning Tunnelling Microscopes

STM

APE Research can also provide Scanning Tunnelling Microscopes, for use in UHV or air, capable of scanning samples of almost any size and a simple-to-use acquisition and analysis software package.

STM product page >

Scanning Near-field Optical Microscopes

SNOM

APE Research's SNOM microscope can operate in reflection, transmission and back-reflection modes and is suitable for surface science, optics and biological applications.

SNOM product page >



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