Enhanced performance for the Phenom desktop SEM
21 Jan 2010
We are pleased to announce a new range of enhancements to the Phenom desktop Scanning Electron Microscope which greatly improve performance and extend the Phenom's measuring capability for a wide variety of sample types:
Charge Reduction Sample Holder
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The Charge Reduction Sample Holder is an optional extra available for any Phenom which significantly reduces the effects of sample charging. The Charge Reduction Sample Holder works by reducing the pressure in the sample chamber, thereby significantly reducing sample charging effects that can be seen on non-conductive samples. Benefit: Fast & easy imaging of non-conductive samples |
Micro Tool Holder
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The Micro Tool Holder is a new type of sample holder that can be retro-fitted to any Phenom. Primarily designed for imaging micro machined tools and parts, it can clamp axial shaped tools with a diameter of 1 - 10mm and maximum length of 100mm and provides sample tilt of -10 to +45° and 90° rotation. Benefit: High degree of control when imaging micro tools & parts |
Micro Electronics Sample Holder
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The Micro Electronics Sample Holder eliminates problems when trying to mount microelectronics Its unique clamping mechanism ensures microelectronics can be mounted quickly and easily without the need for adhesives. Benefit: No contamination of the sample with instant preparation and loading |
X-View Sample Holder
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The X-View Sample Holder is designed to look at cross-sections of samples and uses a clamping mechanism that does away with the need for screws. It is suitable for a wide range of samples including thin coatings and paints, fractured surfaces, screws and machined parts. Benefit: Ease of use when imaging sample cross sections |
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Phenom Remote Assistant, or PRA, is a secure, user-initiated service enhancement, that allows Phenom World Service Technicians to remotely connect to your Phenom to check and diagnose problems. Phenom Remote Assistant enhances productivity by providing reduced time to repair, and increased reliability and up-time of the system. Benefit: Available as standard, increases reliability and reduces downtime. |
Click here for more information on the Phenom desktop Scanning Electron Microscope
Need to measure micro or nano fibres or pores? Then check out the Phenom Fibermetric System
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