The leading supplier of cutting edge technology

Non-contact multilayer film thickness measurement made easy

28 Sept 2011
MProbe

We are delighted to introduce the MProbe non-contact film thickness measurement system. Using well proven spectroscopic analysis methods MProbe can accurately measure the thickness of translucent multi-layer film stacks.

  • Non-contact spectroscopy technique
  • Multilayer film stacks
  • 1nm to 1mm layer thickness (system dependent)
  • Measure thickness, refractive index, surface roughness
  • Cost effective solution

A family of MProbe systems are available from the UV to IR, satisfying all thickness range and resolution requirements. Our fully featured TFCompanion control and analysis software package allows users to build layer stack models from an extensive materials library, as well as add customised materials. Stand-alone versions of TFCompanion software are also available for end-users and system integrators.

MProbe is an ideal solution for at-line, on-line and OEM scenarios as well as academic and industrial R&D. Typical application examples include solar cell PV coatings, polymer films, semiconductors, photoresists, thin oxide and nitride films, LCD and flat panel displays, optical coatings ... and many more.

Click here for further details.

Please contact us for more information and to arrange a demo: click here to contact us by email or call:

Matthew Ball on
01582 764334



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