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Zygo NewView 7000 Series

Advanced 3D Surface Optical Profiling and Measurement Systems

Zygo NewView 7000 Series
The NewView 7000 Series optical profilers are powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are non-destructive, fast, and require no sample preparation.

  • Fast noncontact measurements
  • Sub-angstrom Z resolution
  • Leading-edge precision & gage capability
  • Enhanced optical imaging

Features

Profile heights ranging from <1 nm up to 20000 µm can be measured at high speeds. Based on patented scanning technology, only the NewView 7000 Series delivers 0.1 nm height resolution, independent of surface texture, magnification, or feature height - all in a single scan, and for every measurement!


Features

  • Non-contact, three-dimensional, scanning white light and optical phase-shifting interferometry
  • Measurement repeatability, ±0.1% at 1 Sigma
  • Vertical z-scan measurement range from 0.1 nm to 20000 µm
  • Optical microscope lateral resolution, > 0.36 µm to 9.5 µm
  • Data scan rate of up to 135 µm/sec with 0.1 nm height resolution
  • Step height accuracies of better than 0.75%
  • Step Height repeatability ≤0.1% @ 1 Sigma
  • RMS repeatability <0.1 RMS
  • Scan and display areas up to 150 mm x 150 mm
Automated X, Y and Z option available for production applications

  • The NewView 7000 includes Zygo's advanced and comprehensive, easy to use Metropro™ metrology software
  • Advanced surface metrology analysis: roughness, waviness, curvature, step heights, power spectra, bearing ratio, and much more
  • Windows XP operating system and latest generation Pentium-based PC
  • Accurate and quantitative surface characterisation with push button simplicity - just focus and measure
  • Non-destructive measurement - no sample contact or preparation required
  • User-definable pass/fail flagged results and password-protected applications

Specifications

NewView 7000 Series Product Comparison
Key Feature NewView 7300 NewView 7200 NewView 7100
Scan Speed ≤135 µm/sec ≤26 µm/sec ≤26 µm/sec
System Zoom Auto; multi. (3 pos) Manual (single) Fixed 0.75x
Max Scan Range ≤20 mm
RMS Repeatability <0.01 nm
Objectives From 1X to 100X
Max. Field of View 14 mm standard; 22 mm optional (with megapixel camera)
Turret Options Motorized or Manual (6 Position)
Z Stage Motorized (100 mm travel)
X-Y Stages Manual (100 mm travel) or Motorized (150 mm travel)
Tip/Tilt Stage Manual or Motorized
Encoded Z, X-Y Stage Yes (optional)

Applications

Zygo NewView 7000
  • Stress Analysis
  • Surface Structure Analysis
  • Inter-Process Control
  • Investigative Work
  • Final Inspection
  • MEMS
  • Flat panels
  • OLED
  • Cone Angles
  • Hole Positions
  • Component Behaviour
  • Etch Depths
  • Component Alignments
  • Failure Analysis
  • Film Analysis
  • MOEMS
  • Display Colour Filter
    Process Control
  • Line Widths
  • Orthopaedic Components
  • Diamond Machining Parts
  • Optical Surfaces