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Zygo Open Seminar in association with EMAN

Informative seminar on high performance optical surface metrology tools and their applications was well attended by industry and academia.

Dr Carol D Daniel welcoming attendees to seminar

The Zygo Open seminar held at NPL on the 6th February proved to be a resounding success with participation from a wide range of industry sectors and academia including: Teer Coatings, Crown Packaging, Taylor-Hobson, Brunel University, Arjo Wiggins, Glaxo-Smith Kline, Heriott Watt University, Cranfield Precision, over 50 participants attended the event. The seminar provided participants with an introduction to high performance surface measurement and metrology using non-contact optical surface profiling tools. Following a general introduction to how interferometers can be used to measure precision surfaces in a wide range of industry sectors examples were shown of how the technology is employed in specific areas including corrective polishing of optical surfaces by Roger Morton, Operations Director for Zeeko Ltd and the characterisation of MEMS devices by Dr John Hedley of Newcastle University. During the day participants were able to have their own samples measured on the two tools on display in the foyer at NPL: a Zygo NewView 600 scanning white light interferometer and the Zygo GPI Fizeau interferometer.

Downloads of the presentations delivered at the seminar are available below:

Introduction:

An introduction to high performance optical surface profiling using a scanning white light and Fizeau interferometer a presentation by Dr Carol David Daniel of Lambda Photometrics Ltd

Measurement and characterisation of MEMS (Micro Electro Mechanical Systems):

An overview of the application of scanning white light interferometry and other tools for the measurement and quality inspection of static and dynamic MEMS devices at Newcastle University a presentation by Dr John Hedley

Measurement and polishing of precision optical surfaces:

Describing how a Zygo GPI Fizeau interferometer is an essential surface metrology tool in the feedback loop for correctively polishing precision optical surfaces, a presentation by Roger Morton, Operations Director at Zeeko Ltd.

Physical limitations of scanning white light interferometry:

What users need to be aware of when making surface measurements, an overview by Dr Richard Leach of NPL.