Refractive Index and Thin film thickness Measurement
Metricon Model 2010/M Prism Coupler
The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both thickness and the refractive index/birefringence of dielectric and polymer films. For many thin film and optical waveguide applications, the Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry:
- Completely general - no advanced knowledge of optical properties of film/substrate required
- Routine index resolution of ±.0005 (accuracy of up to ±.0001 available for many applications)
- Routine index resolution of ±.0003 (resolution of up to ±.00005 available for many applications)
- High accuracy index measurement of bulk, substrate, or liquid materials including birefringence/anisotropy
- Rapid (20-second) characterization of thin film or diffused optical waveguides or SPR sensor structures
- Simple measurement of index vs wavelength
- Options to measure index vs temperature (dn/dT), and waveguide loss
- Wide index measurement range (1.0-3.35)
The Model 2010/M represents a significant improvement over its predecessor, the Model 2010, offering compatibility with Windows XP/Vista/Seven, a greatly improved and user-friendly Windows based control program, and new measurement features such as the ability to make accurate thickness and index measurements of very thick films as well as an option to measure index vs. temperature (dn/dT). It also eliminates the need for the now–obsolete ISA interface card required by the 2010.
Metricon Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide characterization since introducing the world's first commercial prism coupling instrument, the PC-200, in 1980. Over the years, more than 850 Metricon systems have been delivered to top universities, research institutes, and corporations in 38 countries and Metricon prism coupling systems have been referenced in hundreds of articles in scientific journals.