Phenom G2 series offers you complete flexibility with the most powerful desktop SEM currently available, the Phenom G2 Pro and the entry-level Phenom G2 Pure.

Both systems have a super-fast load time of 30 seconds and an intuitive, easy to use touch screen interface.

Phenom's easy to use sample cup holds the sample and positions it at the correct height for imaging.

Time from sample load to electron imaging is less than 30 seconds!

Both the Phenom G2 Pro and Phenom G2 Pure are compatible with the range of application specific passive sample holders.

Phenom G2's innovative touch screen user interface lets you quickly produce high-quality electron microscope images with minimal training.

The user can simply navigate around their sample by touching the areas of interest on the screen.

The location cross hairs, highlighted area boxes and overall optical image of the sample provide the user with never lost navigation.

The rotary control knob allows fast and easy adjustment of imaging parameters such as brightness, contrast and magnification.

The control knob also allows the user a fast an easy way of navigating through stored images in the image archive.

Combined with the touch screen interface, the rotary knob provides the user with greater control.

Dental Research into new composite materials used in fillings, veneers and false teeth continues apace, with focus on how these materials behave over a period of time.

The ease of use and minimal sample preparation of the Phenom enable it to image dental composite materials and microscopic tubules in dentine. The speed of sample loading ensures many samples can be measured quickly and easily.

As critical dimensions continue to decrease in the pharmaceutical and chemical industries, optical microscopes no longer have adequate resolving power to image these structures.

With an ultimate resolution of 25nm, the Phenom Desktop SEM will clearly identify and compare the morphology of fine particles, powders or deposits for new formulations.

Micromachining and Micro manufacturing are increasingly used to produce structured layers, MEMS devices and micro structures, using lasers, etching and depostion or micro tooling techniques.

With its 25nm resolution and 45,000x magnification the Phenom Desktop SEM can image a wide variety of micro engineered surfaces and devices and provides the user with an on screen feature measurement tool.

Failure analysis is crucial in many manufacturing industries, and has become a vital tool used to develop new products and for the continuous improvement of existing products.

The Phenom Desktop SEM can be used either in Compositional Mode or Topographic Mode to image fractured or failed materails to help determine the cause of the failure.

The Automotive industry combines many advanced technologies such as micro-electronics, micro-tooling, sintered materials and novel metallic structures, all of which can be imaged on with the Phenom Desktop SEM

Automotive customers find the fast sample turn-around and ease of use essential when imaging their samples on the Phenom as part of their critical QA and R&D applications.

Stent manufacturers are continously improving their designs with increasingly complex structures to improve stent integrity and strength and also coating the stents with various drugs.

The Phenom is perfectly suited to imaging both uncoated and coated stents. Stent samples require little or no preparation and the 30 second load time and ease of use ensures it is at home both in Stent QA and R&D applications.

The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology and distribution of key microstructural features.

These features can be observed with conventional optical microscopy. However, the Phenom exceeds the resolution of optical microscopes and eliminates the expense, delay and difficulty associated with operating a traditional SEM.

Processing raw cellulose fibres into finished paper products requires sophisticated lab tools to evaluate paper composition, bonding properties, coatings thicknesses and surface uniformity.

The Phenom Desktop SEM provides the extra magnification levels necessary to see paper fibers, fillers and coatings, and the depth-of-focus to clearly observe 3D surface phenomena.

The Phenom Desktop SEM can easily image a wide variety of forensic samples including gun shot residue, fibres, paint flakes, powders, pollen, bone fragments and epidermal cells.

As the Phenom Desktop SEM is a true walk-up tool, forensic experts can investigate their own samples without out-sourcing to conventional SEM.

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The Phenom Desktop SEM reveals microscopic insect anatomical detail and inter specie variations, going far beyond what can be imaged with a conventional optical microscope, but retaining the speed and ease of use.

It can provide high resolution images of these structures including compound eyes, ocelli, arolium, pulvillus, halteres, etc.

Imaging of micro-electronics, solar cells and other wafer-based samples is extremely easy with the Phenom, which has a Microelectronics Sample Holder.

The Microelectronics Sample Holder utilises a unique clamping mechanism, which makes glue or other adhesives obsolete is completely non-destructive and ensures the sample can be reused after imaging.

Introducing the Motorized Tilt & Rotation Sample Holder for the Phenom Desktop SEM, which enables computer-controlled smart rotation and tilting of your sample.

The Motorized Tilt & Rotation Sample Holder offers smart Compucentric Rotation at continuous 360° in 0.2° steps and smart p-seudo-eucentric tilt of -10° to + 45° tilt range in 0.2° steps.

Motorised Tilt & Rotate Sample Holder Specifications

We are pleased to introduce the Temperature Controlled Sample Holder option, which allows the user to easily adjust and monitor the temperature of a sample in the SEM via a dedicated digital display.

With a temperature range of -25°C to +50°C, it is perfectly suited to imaging wet or delicate samples in Biological, Pharmaceutical, Histology & Food Research applications.

Temperature Controlled Sample Holder Specifications

The Phenom Pro Suite Applications enable users to automatically or manually process their images in an effective way, generating measurements and answers not just images.

Pro Suite Applications include 3D Roughness Reconstruction, Fibermetric, Automated Image Mapping, Remote User Interface and Measure IT.

Phenom Pro Suite Application Information

The Charge Reduction Sample Holder is an optional extra available for any Phenom which significantly reduces the effects of sample charging.

The Charge Reduction Sample Holder works by reducing the pressure in the sample chamber, thereby significantly reducing sample charging effects that can be seen on non-conductive samples.

Charge Reduction Sample Holder Specifications

The Micro Tool Holder is a new type of sample holder that can be retro-fitted to any Phenom.

Primarily designed for imaging micro machined tools and parts, it can clamp axial shaped tools with a diameter of 1 - 10mm and maximum length of 100mm and provides sample tilt of -10 to +45° and 90° rotation.

Micro Tool Sample Holder Specifications

The Micro Electronics Sample Holder eliminates problems when trying to mount microelectronics

Its unique clamping mechanism ensures microelectronics can be mounted quickly and easily without the need for adhesives.

Microelectronics & X-view Sample Holder Inserts Specifications

The X-View Sample Holder is designed to look at cross-sections of samples and uses a clamping mechanism that does away with the need for screws.

It is suitable for a wide range of samples including thin coatings and paints, fractured surfaces, screws and machined parts.

Microelectronics & X-view Sample Holder Inserts Specifications

Phenom Remote Assistant, or PRA, is a secure, user-initiated service enhancement, that allows Phenom World Service Technicians to remotely connect to your Phenom to check and diagnose problems.

Phenom Remote Assistant enhances productivity by providing reduced time to repair, and increased reliability and up-time of the system.