Features

The NewView 700 continues to deliver the level of precision and quality that has become the trademark of ZYGO's NewView family of products. Simply put, the NewView 700 delivers optimal value, in combination with proven precision and quality.

Using ZYGO's patented scanning white-light interferometry technology the NewView 700 easily measures smooth, rough, and stepped surfaces. Profile heights ranging from < 1 nm up to 150 µm with <0.1 nm vertical resolution, independent of surface texture or magnification - all in a single scan! Get the precision you need in a single acquisition without the limitations associated with traditional phase measuring interferometry.

A key component of the NewView 700 is its configurability. Based on an open architecture, the system easily accommodates a wide range of sample sizes, materials, and textures. Standard accessories include a complete line of high quality interferometric objectives, manual and motorized turrets, and sample positioning stages. Also, a convenient breadboard is available to accept application specific custom fixturing. Whether you need a versatile system with all the options, or a dedicated production setup, the NewView 700 can be configured to meet your needs.

Many instruments claim to be easy to use but often fall short. Not the NewView 600! All measurements are fast, nondestructive and require no sample preparation. Areal surface data is rapidly acquired and processed, yielding more than 300,000 data points in seconds. Objectives are easily interchanged using quick-mount adapters or even faster when using a multi-position turret - providing you with the magnification, field-of-view, and resolution you need, when you need it.

Ergonomically positioned coarse, medium, and fine focus knobs, an on-screen Live Display, and automatic light level adjustment expedite sample setup. With the NewView 700, you won't find yourself continually reaching for frequently used controls.

And of course, the system is powered by ZYGO's comprehensive metrology software package, MetroPro , providing complete 3D and 2D surface characterization, visualization, and processing options. In addition to advanced analysis, user-friendly MetroPro includes instrument control, password protection, statistical databasing, programmable scripting, customizable layout, pass/fail criteria, and much more.

Not exactly sure what features you need today, or what you'll need tomorrow? The NewView 700 offers a full range of options and upgrades to meet your metrology and budgetary requirements, protecting your investment for years.

From cost-effective bench-top research tools, to dedicated production systems and sensors, the NewView 700 optical profiler offers a complete metrology solution for today's leading-edge research and production applications.

Specifications

Downloads

Zygo NewView 700s Specifications

Zygo NewView 700 Accessories Guide