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Zygo NewView 7000 Series

Advanced 3D Surface Optical Profiling and Measurement Systems

Zygo NewView 7000 Series
The NewView 7000 Series optical profilers are powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are non-destructive, fast, and require no sample preparation.

  • Fast noncontact measurements
  • Sub-angstrom Z resolution
  • Leading-edge precision & gage capability
  • Enhanced optical imaging

Features

Measurement

The NewView 7000 systems can measure profile heights ranging from <1 nm up to 20000 µm repeatably and at high speeds.

Based on patented scanning white light interferometry (SWLI) technology, only the NewView 7000 Series delivers 0.1 nm height resolution, independent of surface texture, magnification, or feature height - all in a single scan, and for every measurement.

The NewView™ 7000 series 3D optical surface profilers easily measure a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.

Two Models - Unlimited Potential

The 7100 and 7300 optical profilers both offer high-accuracy measurements, differing mainly in their standard features. The 7300 has several features that maximize capability and convenience and the 7100 provides affordable versatility in non-contact surface profiling.

Specifications

Feature NewView 7300 NewView 7100
Description Top of the range optical profiler Low cost optical profiler
Scan Speed ≤135 µm/sec ≤26 µm/sec
System Zoom Auto; multi. (3 pos) Fixed 0.75x
Max Scan Range ≤20 mm
RMS Repeatability <0.01 nm
Objectives From 1X to 100X
Max. Field of View 14 mm standard; 22 mm optional (with megapixel camera)
Turret Options Motorized or Manual (6 Position)
Z Stage Motorized (100 mm travel)
X-Y Stages Manual (100 mm travel) or Motorized (150 mm travel)
Tip/Tilt Stage Manual or Motorized
Encoded Z, X-Y Stage Yes (optional)

Applications

Zygo NewView 7000
  • Stress Analysis
  • Surface Structure Analysis
  • Inter-Process Control
  • Investigative Work
  • Final Inspection
  • MEMS
  • Flat panels
  • OLED
  • Cone Angles
  • Hole Positions
  • Component Behaviour
  • Etch Depths
  • Component Alignments
  • Failure Analysis
  • Film Analysis
  • MOEMS
  • Display Colour Filter
    Process Control
  • Line Widths
  • Orthopaedic Components
  • Diamond Machining Parts
  • Optical Surfaces