3D Roughness

3D Roughness Reconstruction

The 3D Roughness Reconstruction application enables the Phenom to generate three-dimensional images and submicrometer roughness measurements. This fully automated application for the Phenom scanning electron microscope will help to communicate imaging results and will extract and visualize data normally hidden within a sample.

3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of users. It is often difficult, for example, to identify dents, scratches and burrs from flat 2D images.

Measuring the average roughness (Ra) and the roughness height (Rz) is critical for controlling and understanding production processes. By using SEM imaging for data collection, a much better resolution can be achieved than by using traditional (indirect) methods.

The 3D Roughness Reconstruction application is a desirable addition to any Phenom when one or more of the following arerequired:

• Quality control in machining
• Texture analysis
• Evidence characterization
• Defect & failure analysis
• Wear analysis - tribology

• Outperforms optical and mechanical measurement systems:
- High resolution
- Insensitive for reflective samples
- Direct method
- Non-destructive

• Intuitive fully automated user interface
• Based on ‘shape from shading’ technology, no stage tilt required
• Integrated solution
• Fast reconstruction
• Retrofit onto any Phenom

• Automated 3D image creation
- Full 3D
- 2D or 3D with colored height indication
- Filtered 3D for surface roughness

• Automated roughness measurement
- Ra (average roughness)
- Rz (roughness height)
- User-set waviness filtering
- Up to 5 line measurements

• Height profile
• Position identification
• CSV – automatically generated statistical data
• FOV 2 mm to 10 µm
• 3D reconstruction in just a few seconds
• 512x512 pixel resolution
• Output:
- Line profiles
- CSV files
- 2D/3D view images

• Part of the Phenom Pro Suite
- Network storage enabled
- Phenom integrated system

Drill bit, top view at 600x magnification

Drill bit, top view at 2900x magnification

The 3D Roughness Reconstruction view contains three profile measurement lines. The table on the right contains measurement results Rz and Ra.

Line profile chart

Fibermetric

Fibermetric

Now, direct observation and measurement of micro and nano fibres and pores is faster, better and easier than ever before, with the Fibermetric application. In combination with the Phenom desktop electron microscope, the Fibermetric application allows you to produce accurate size information from micro and nano fibre samples.

Automated image characterization means hundreds of measurements can be made automatically in seconds. In addition to more accurate data acquisition, the automated measurements of the Fibermetric application also ensure a rapid return on investment (time savings compared to previous manual measurements; operator independent; more accurate data).

Fibermetric uses hundreds of data points to provide a solid statistical analysis. An interactive fibre size distribution histogram is drawn for a graphical representation of the results. All data are exportable to common formats for further customized analysis.

Fibermetric is designed to measure fibres between 100 nm and 20 µm imaged with the Phenom. There is a wide range of applications where this can be used, from filtration materials to diaper padding to fibre research.

The Fibermetric application generates all the statistical data you need, without an elaborate laboratory infrastructure or specially trained operators. It is perfect for use in R&D or QA/QC applications both in industry and academia, for the automated measurement of micro fibres and nano fibres and pores, including:

• Non-woven & woven fibres
• Electrospun fibres
• Hepa Filters
• Membranes
• And many more...

• Save time by automated measurement
• Collect statistical data automatically
• View and measure micro/nano fibres
• Operator-independent measurements
• Real-time Phenom operation
• Data exportable to common formats

• Fibre Detection
- 100 nm to 20 µm
- 1 to 1000 measurements per image

• Output:
- Xml data file (incl. diameter measurements and pore surfaceareas)
- Jpeg or tiff image format
- Max. 2048 x 2048 pixel image
- Customized fiber ditribution histogram
- Minimum, maximum and average fiber size

• Part of the Phenom Pro Suite
- Network storage enabled
- Phenom integrated system

Hepa dust filter

Close up of several measurements in the Fibermetric user interface. A selection of fiber and pore measurements has been highlighted

Measurement results are presented in the histogram. The user can define the number of bins in the histogram. The min/max and average fiber size are displayed below the histogram.

Fibermetric user interface with fiber and pore measurements

Auto Image Map

Automated Image Mapping

The Automated Image Mapping application enables users to automatically collect multiple images in a regular grid. The Automated Image Mapping application enables user-defined collection of images with a large field of view on a high-resolution image map. After an area has been defined in the overview, Automated Image Mapping scans the area with the desired resolution and number of images.

The images are tiled to one large overview which can be stored and navigated for detailed observation. All images can be stored separately, for image analysis or as a reference database.

• Large field of view (FOV) images
- (min. magnification 31.8x, max. FOV 8.07 mm)
• Extremely high-resolution complete sample image maps
• Automated procedure for collecting all sample image data
• Intuitive single-page user interface
• Creation of low-magnification overviews
• Automated acquisition for fibremetric
• Part of the Phenom Pro Suite
- Network storage enabled
- Phenom integrated system

Automated Image Mapping can be used to collect an array of images from a fiber sample. The application can take 100 images at 1024 x 1024 pixel within minutes

A batch of these images can be loaded into Fibermetric for fibre and pore size measurements.

An overview of a 2.46 x 2.46 mm semiconductor scanned at high resolution, resulting in an 85 Megapixelimage.

A close up of the image map revealing small details on the surface of the chip.

Remote UI

Remote User Interface

Phenom Pro Suite’s Remote User Interface makes it possible to access the Phenom from a different location. This application is ideal for customers needing support from the Phenom-World Customer Support to optimize the performance of their Phenom. Customer Support can log on to the Phenom and help to adjust the necessary settings if access is granted from the customer’s location.

The Phenom can be controlled with all the common features from the Phenom User Interface. It is also a perfect application for interacting with colleagues based at a different location.

Samples can be imaged and stored on a USB, a network location or local hard drive. This is the ideal solution for showing live results during a presentation or customer demonstration.

• Real-time remote control
• Direct feedback from service
• Interaction with colleagues at various locations
• Part of the Phenom Pro Suite
- Network storage enabled
- Phenom integrated system

Measure IT

Measure IT

Olympus Measure IT software is included the Phenom Pro Suite. It enables users to measure features using the Phenom calibration, grey value modification, text annotations, along with loading, saving and printout options.