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Products
Lasers
-Accessories
-Alexandrite Lasers
-Argon Ion Lasers
-Beam Diagnostics
-Diode & Laser Modules
-DPSS Lasers
-Dye Lasers
-Femto & Pico Second Lasers
-Helium-Neon Lasers
-Laser Beam Expanders
-Laser Power & Energy Meters
-Laser Speed & Length Measurement
-Nd Glass Lasers
-Nd:YAG Lasers
--Brio
--Brilliant EaZy
--Brilliant
--Brilliant B
--YG980
--YG900
--Yasmin
--Ultra
---Ultra FOLA
--CFR200
--CFR400
--CFR800
--Centurion
--PIV Dual Systems
--Custom Systems
-Nitrogen Laser
-OPOs
--Opolette
--Vibrant
--Rainbow
--CFR & Ultra OPO
-Ultrafast
Optics & Spectroscopy
-Components
-Diffractive Optical Elements
-Optical Isolators
-Fibre Optics
-Modulators
-Spectroscopy
-Optical Metrology
-Laser Beam Expanders
Machine Vision
-Illumination
--Fibre Optic
--LED
---LAT elektronik LED Arrays
-Lenses
--Standard Video Lenses
--Macro Lenses
--High Magnification Zoom Systems
--Large Format
--Telecentric
-Cameras
--Camera Selection Guide
--Areascan
--Linescan
--Smart Cameras
--High Speed Cameras
-Frame Grabbers
--CameraLink
--Multi-input
--Analogue
--High Performance
-Digital Microscope Systems
-Machine Vision Software
-Product Update
-Digital Video Recording
Fibre Optics
-Test & Measurement
--Calmar Optcom
--Direct Optical Research Company (DORC)
--Fiberpro
--Greenlee
--Luna Technologies
--NetTest
--Sagitta
--Tempo/Rifocs
-Components
--APA Optics Inc
--DiCon Fiberoptics Inc
--Fiberpro
--Phoenix Photonics
--Sumitomo
Zygo Interferometer Systems and Optics - Surface Measurement without compromise
-How do Interferometers work
-Sample Measurement Programme
-Measurement Service
-Software Training
--MetroPro for NewView Training
--MetroPro for GPI Training
-Events
-Zygo PTI 250
--Zygo PTI 250 Models
--Zygo PTI 250 Accessories
-Zygo NewView 600
-Zygo NewView 7000
--Zygo NewView 6000 Specifications
-Zygo NewView Delta
--Zygo NewView Delta Specifications
-CP6300 Wafer Metrology System
-Zygo GPI Interferometers
-Zygo MESA
--Zygo MESA Specifications
--Zygo MESA PDFs
-Zygo ZMI Displacement Measurement Interferometers
-Zygo FlashPhase
-Zygo VeriFire Interferometers
--Zygo VeriFire AT
--Zygo VeriFire MST
-Zygo Custom Optics
-Zygo Product Update
--Zygo GPI & Verifire Update
--Zygo FlashPhase Update
--Zygo PTI 250 Update
-Zygo Accessories
Metricon Film Thickness & Refractive Index Measurement
PI High Precision Positioning Systems
-New Products
--PISeca Capacitive Position Sensors
--M-238 High-Load, High-Resolution Linear Actuator with Optional Linear Encoder
--PISeca™ single-electrode capacitive sensors
-PI in the UK
-Nanopositioning Systems
-Hexapods & Micropositioning Systems
-Applications & Solutions
--Metrology & Optical Inspection
--Life Science, Biotech & Pharmaceutical
--Aeronautical & Image Processing
--Microscopy
--Semiconductor
-Innovative Technology
--PICMA Ceramic Coated Multilayer Piezo Actuators
--Single and Dual Plate Capacitive Sensors
--Hexapod Multiaxis Positioning Systems
--NexLine Stepping Piezo Motor
--PILine Ultrasonic Piezo Motor
-Piezo Actuators and PZT Materials
Temperature Measurement
-Luxtron One
-Luxtron I652
-Luxtron FOT Lab Kit
-Luxtron m600
-Luxtron m3300 Biomedical Lab kit
-Luxtron WTS-22
-Luxtron ThermAsset2
-Luxtron PhotriX
-Stanford Research SR630
Stanford Research Systems Instrumentation
-Test & Measurement Instrumentation
--CG635 Synthesized Clock Generator
--DS345 Function & Waveform Generator
--DS340 Function & Waveform Generator
--DS335 Function Generator
--DS360 Function & Waveform Generator
--SR785 Dynamic Signal Analyzer
--SR780 Two Channel Dynamic Signal Analyzer
--SR760 and SR770 FFT Spectrum Analyzers
--SR715 and SR720 LCR Meters
--SR630 16 Channel Thermocouple Monitor
--SR600 Series Dual Channel Programmable Filters
-Scientific Instrumentation
--DG535 Digital Delay/Pulse Generator
--DG645 Digital Delay/Pulse Generator
--SR810 & SR830 DSP Lock-in Amplifiers
--SR850 DSP Lock-In Amplifier
--SR844 Lock-In Amplifier
--SR510 and SR530 Lock-In Amplifiers
--SR540 Optical Chopper System
--SR560 Low-Noise Voltage Preamplifier
--SR570 Low Noise Current Preamplifier
--SR445A 350 MHz Preamplifier
--SR550 FET Input Preamplifier
--SR552 BJT Input Preamplifier
--SR554 Transformer Preamplifier
--PS300 Series High Voltage Power Supply
--SR280 Boxcar Mainframe
--SR250 Gated Integrator
--SR255 Gated Integrator
--SR245 Computer Interface
--SR240A Preamplifier (4-channel)
--SR200 Gate Scanner
--SR235 Analog processor
--SR272 Data Acquisition Software
--SR400 Photon Counter
--SR430 Multichannel Scaler/Averager
--LDC501 Laser Diode Controller
--SR470 and SR474 Optical shutter systems
--PTC10 Programmable Temperature Controller
-Time & Frequency Instrumentation
--SR620 Time Interval / Frequency Counter
--SR625 Rubidium Stabilized Frequency Counter
--FS700 LORAN-C Frequency Standard
--FS710 7 Channel Distribution Amplifier
--FS725 Benchtop Rubidium Frequency Standard
--PRS10 Rubidium Frequency Standard
--SC10 10 MHz High Stability Ovenized Quartz Oscillator
-Vacuum & Analytical Instrumentation
--MPA100 OptiMelt Melting Point Apparatus
--MPA120 EZ-Melt Melting Point Apparatus
--QCM100 and QCM200 Quartz Crystal Microbalance
--NL100 Nitrogen Laser
--IGC100 Ion Gauge Controller
--PG105U Convection Enhanced Pirani Gauge
--Bayard-Alpert Ionization Gauges
--RGA100, 200, 300 Residual Gas Analyzers
--PPM100 Partial Pressure Monitor for RGA
--CIS100, CIS200 and CIS300 Closed Ion Source Gas Analyzers
--QMS100, 200, 300 High Pressure Sampling Systems
--PPR100, PPR200 and PPR300 Vacuum Process Monitoring Systems
-Small Instrumentation Modules
--SIM900 Mainframe
--SIM910 JFET & SIM911 BJT Voltage Preamplifiers
--SIM914 350 MHz Preamplifier
--SIM918 Current Preamplifier
--SIM921 AC Resistance Bridge
--SIM922 & SIM923 Temperature Monitors
--SIM922A & SIM923A Temperature Monitors
--SIM925 Four-Wire Multiplexer
--SIM928 Isolated Voltage Source
--SIM940 Rubidium Frequency Standard
--SIM960 Analog PID Controller
--SIM964 Analog Limiter
--SIM965 Bessel and Butterworth Filter
--SIM970 Quad Digital Voltmeter
--SIM980 Analog Summing Amplifier
--SIM983 Scaling Amplifier
Non-Contact Laser Speed & Length Measurement
-LSV 6000
-LSV-300
Non-Contact Vibration Measurement
-Single Point Vibrometers
-Differential Vibrometers
-Rotational Vibrometers
-In-Plane Vibrometers
-High Speed Vibrometers
-Digital Vibrometers
-3D Vibrometers
-Microscope Systems
-Scanning Vibrometers
-Laser Vibrometry Technology Day
-*** TechDayNotes ***
-Laser Vibrometer Users Meeting
-*** UserGroupNotes ***
Microscopy Products
-Scanning Probe Microscopy
A to Z Company & Product List

Applications

Applications
Laser Applications
-Ablation
-Alignment
-Circuit deflashing
-CARS: Coherent Antistoke Raman Scattering
-CRDS: Cavity Ring Down Spectroscopy
-EPR
-ESR
-Fluorescence Microscopy
-Holography
-Hyperspectral Imaging using a Tunable OPO Laser Source
-Jet-REMPI
-Laser Flash Photolysis
-LIBS: Laser Induced Breakdown Spectroscopy
-LIDAR: Light Detection & Ranging
-LIF: Laser Induced Fluorescence
-LII: Laser Induced Incandescence
-MALDI: Matrix Assisted Laser Desorption/Ionisation
-Particle Image Velocimetry
-PLD: Pulsed Laser Deposition
-Solar Panel Manufacture & Testing
-Spectroscopy
-Thompson Scattering
-Ultrasound Generation
Machine Vision Applications
-Using Emulated Shutter
PI Positioning Applications
-Metrology & Optical Inspection
-Life Science, Biotech & Pharmaceutical
-Aeronautical & Image Processing
-Microscopy
-Semiconductor
Velocimetry Applications
-Laser Surface Velocimetry Principle of Operation
-Car Speed Sensor
-High Speed Paper Manufacturing
-Motion measurement in steel manufacturing
-Motion regulation in steel rolling mills
Vibrometry Applications
-Types of Vibrometer
-Non-contact Laser Vibration Measurement Basics
-Automotive Vibration Testing
-Brake Squeal Analysis
-Car Body Structure-Borne Sound Intensity Analysis
-Vibration Analysis of Steering Systems
-MEMS Pressure Sensors Quality Control
-Reduction of Vehicle Interior Noise
-Dynamic Valvetrain Analysis
-Drive Trains Under Test
-Modal Analysis of Turbocharger Compressor Wheels
Zygo Applications
-Semiconductor and MEMS
--University of Newcastle MEMSens
--The Tyndall Institute SIMSWITCH
--MEMS Application Note
--Qinetiq Micromirror arrays
--Zygo Dynamic MEMS Workshop Results
--Zygo Application Notes - Measuring Dynamic MEMS Devices
--Accurately identifying defects
--Semiconductor wafer surface measurement
-Optics
--SLS Optics
--Ophthalmic Metrology
-Industrial
--Cranfield University
--Finsbury Orthopaedics Ltd
--University of Leeds
--Rousant Sherwood
-Software
--Cross Hatch Software
--Measuring Skin Surface
--Zip Scan and Zip Stitch
--Automation Meets Interferometry
--Correlation of NewView Profilers to Traceable Standards
--Zygo Application Notes - MetroPro PSD Analysis
--Zygo Application Notes - Identifying and Controlling Vibrations
--Zygo Application Notes - MetroPro Films Analysis Application
--Zygo Application Notes - Measuring Sub-Angstrom Surface Texture
--Zygo Application Notes - MultiSurf Application
--Zygo Application Notes - Advanced Texture Application
--Zygo Application Notes - Stitching MetroPro Application
--Zygo Application Notes - MetroPro Surface Texture Perameters
-General
--How do Interferometers work
--Surface Profile Quiz

Other

Company Information
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-Zygo Open Seminar
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