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Atomic Force Microscopy (AFM)
AFM is a microscopic technique used to determine the surface topography of a specimen. Unlike LM or EM, AFM uses a cantilever with a very shape tip to scan over a samples surface to create a topographical image.
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NanoMagnetics Instruments ezAFM™ – Portable Atomic Force Microscope
The ezAFM™ is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It is ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. Learn More -
NanoMagnetics Instruments ezAFM+™ – Portable Atomic Force Microscope
The ezAFM+™ is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It is ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. Learn More -
NanoMagnetics Instruments ezSTM™ – Scanning Tunneling Microscope
The ezSTM™ is an all new Scanning Tunneling Microscope which features excellent performance while being remarkably affordable. It’s ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. Learn More -
NanoMagnetics Instruments hpAFM - High Performance AFM/MFM
The NanoMagnetics Instruments hpAFM™ is the most advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimise the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z scanner, 10 MP video microscope and flexible operating modes. Learn More
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