Conventional Specimen Preparation

Proper sample preparation plays an important role in obtaining the required information when using an electron microscope. You need to consider the sample’s size, shape, state, and conductive properties prior to sample preparation. To achieve the best results during examination in the Electron Microscope (EM), the perfect EM Sample Preparation (for TEM, SEM, AFM) is a prerequisite. The required techniques depend on the samples (biological samples, material samples) as well as on the application. Our range of Fischione electro polishers, specimen grinders, disk cutters and cross section TEM (XTEM) preparation kits are all listed below.