
Phenom Desktop SEM
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Phenom Pharos Desktop SEM
The Thermo Scientific™ Phenom Pharos is a desktop SEM with a FEG source that makes crisp, high-brightness images and the benefits of a FEG source accessible to everyone. It is also easy to operate, from the initial installation to the actual usage, thanks to its intuitive and compact design. The advanced hardware design and detectors enable a fast time to image and easy, fool proof handling.
Phenom Pharos Desktop SEM. Resolution. Re-imagined.
- The only desktop SEM with FEG source with 2 up to 15 kV acceleration voltage range
- <2.5 nm (SE) and <4.0 nm (BSE) resolution @ 15 kV; up to 1,000,000x magnification
- Optional fully integrated EDS and SE detector
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Phenom XL Desktop SEM for Large Samples
The Thermo Scientific™ Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. Next to this, it is equipped with a chamber that allows analysis of large samples up to 100mm x 100mm. The XL allows for in-situ testing with a tensile and compression holder up to 150N or 1000N. Optional eucentric and compucentric stage and vibration isolation platform only for the XL.
- For large samples (100x100 mm) and ideal for automation
- <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
- Optional fully integrated EDS and BSE detector
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Phenom ProX Desktop SEM
The Thermo Scientific™ Phenom ProX is a complete desktop analysis tool, offering 150,000x magnification and easy to use EDS X-ray analysis. Although powerful, it also retains the super-fast load times and innovative user interface to produce high-quality electron microscope images with minimal training. Now with the option for secondary electron imaging.
- High performance desktop SEM with integrated EDS detector
- Resolution ≤6 nm (SE) and ≤8 nm (BSE); magnification up to 350,000x
- Optional SE detector
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Phenom Pro Desktop SEM
The sixth-generation of Thermo Scientific™ Phenom Pro G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities.
- High performance desktop SEM
- Resolution ≤6 nm (SE) and ≤8 nm (BSE); magnification up to 350,000x
- Optional SE detector
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Phenom Pure Desktop SEM
The Thermo Scientific™ Phenom Pure G6 Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.
- Entry level desktop SEM
- Resolution <25nm; magnification up to 175,000x
- Longlife CeB6 source
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Phenom ParticleX AM Desktop SEM
The Thermo Scientific™ Phenom ParticleX Scanning Electron Microscope (SEM) for Additive Manufacturing. The Phenom ParticleX AM Desktop SEM is a multi-purpose desktop SEM delivering purity at the microscale.
Take in-house control of your data:
- Monitor critical characteristics of metal powders
- Suited for powder-bed and powder-fed additive manufacturing processes
- Identify particle size distributions, individual particle morphology, and foreign particles
It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.
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Phenom ParticleX TC Desktop SEM
The Thermo Scientific™ Phenom ParticleX Scanning Electron Microscope (SEM) for Technical Cleanliness. The Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling cleanliness at the microscale.
Take in-house control of your data:
- Versatile solution
- VDA19 or ISO16232 confirmation
It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.
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Phenom ParticleX Steel Desktop SEM
The Phenom ParticleX Steel Desktop SEM is a combined SEM imaging and EDS analysis instrument for quality control in steel manufacturing, with industry-specific software designed to quickly and easily provide high-quality data for inclusion, fault, and failure analysis.
Designed for stability and atomic resolution imaging
- Versatility—SEM and EDS integrated into one instrument to meet all needs in a steel plant.
- Ease of use—New operators should be able to produce quality data with minimal training.
- Industry-specific software—Operation is further simplified, providing practical insight on common inclusions.
- High brightness—The CeB6 source enables characterisation of sub-micrometer inclusions.
- Future-proof—Once you are comfortable with the tool, modify initial protocols to meet your specific analytical needs.