Characterisation, Measurement & Analysis
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Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM)

AFM is a microscopic technique used to determine the surface topography of a specimen. Unlike LM or EM, AFM uses a cantilever with a very shape tip to scan over a samples surface to create a topographical image.
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  1. NanoMagnetics Instruments ezAFM™ – Portable Atomic Force Microscope

    NanoMagnetics Instruments ezAFM™ – Portable Atomic Force Microscope

    The ezAFM™ is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It is ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. Learn More

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  2. NanoMagnetics Instruments ezAFM+™ – Portable Atomic Force Microscope

    NanoMagnetics Instruments ezAFM+™ – Portable Atomic Force Microscope

    The ezAFM+™ is an all new Atomic Force Microscope which features excellent performance while being remarkably affordable. It is ideal for student laboratories, high schools, nanotechnology educations and basic research with its compact, high stability, user-friendly design. Learn More

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