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Phenom SEM
With its market-leading Phenom Desktop Scanning Electron Microscope (SEM), Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom benchtop systems give direct access to the high-resolution and high-quality imaging ...
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Phenom Delphi all-in-one solution for correlative microscopy
The Delphi is an all-in-one solution for correlative microscopy. It is an integrated tabletop scanning electron microscope and inverted fluorescence microscope. This integration enables scientists to do correlative microscopy without the challenges typically associated with CLEM:
Learn More- The Region Of Interest (ROI) does not need to be retrieved, as you are working in the same ROI switching from LM to EM and vice versa.
- The sample does not need to be transferred from one microscope to the other, saving sample quality as well as time.
- Correlation accuracy is fully automated and highly precise
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Phenom XL Desktop SEM for Large Samples
The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. Next to this, it is equipped with a chamber that allows analysis of large samples up to 100mm x 100mm. The XL allows for in-situ testing with a tensile and compression holder up to 150N or 1000N. Optional eucentric and compucentric stage and vibration isolation platform only for the XL.
- All-in-one imaging and analysis system (BSE, SE -optional and EDS)
- Motorised scan of samples up to 100 mm x 100 mm
- Elemental analysis is as easy as imaging, with fully integrated EDS
- Fastest loading cycle in the world
- Variable vacuum modes for all samples without the need to sputter coat.
- Permanent optical overview for swift navigation to any region on the sample
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NEW Phenom (G5) ProX Desktop SEM with EDX
The new Phenom ProX is a complete desktop analysis tool, offering 150,000x magnification and easy to use EDS X-ray analysis. Although powerful, it also retains the super-fast load times and innovative user interface to produce high-quality electron microscope images with minimal training. Now with the option for secondary electron imaging.
- 150,000x magnification, ≤10 nm resolution (BSE), ≤8 nm resolution (SE).
- Integrated EDS system for X-ray Elemental Analysis
- Range of in-situ holders for SEM analysis (electrical feedthrough and temperature)
- 30 second load time
- Charge reduction mode
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Phenom Pro Desktop SEM
The Phenom Pro is the most powerful desktop SEM available providing an unsurpassed 150,000x magnification. Although powerful, it also retains the super-fast load times and innovative user interface to produce high-quality electron microscope images with minimal training. Now with the option for secondary electron imaging.
- 150,000x magnification
- ≤10nm resolution (BSE), ≤8nm resolution (SE).
- 30 second load time
- Motorised stage for easy navigation
- Charge reduction mode
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Phenom Pure Desktop SEM
The Phenom Pure is an entry-level desktop SEM, enabling users to simplify the crossover from light microscopy to electron microscopy. It is the perfect system for microscopists on a budget and its 30,000x magnification provides 20 times that of a conventional microscope. The Pure system is upgradable to Pure+ with its magnification up to 65,000x, resolution of 25nm, a selectable accelerating voltage of 5kV and 10kV and an optional secondary electron detector.
- 30,000x magnification
- 30nm resolution
- 30 second load time
- Motorised stage for easy navigation
- Upgradable to Phenom Pro
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