Phenom Desktop SEM

Phenom Pharos Desktop SEM. Resolution. Re-imagined.

The Thermo Scientific^TM Phenom Pharos is a desktop SEM with a FEG source that makes crisp, high-brightness images and the benefits of a FEG source accessible to everyone. It is also easy to operate, from the initial installation to the actual usage, thanks to its intuitive and compact design.

The advanced hardware design and detectors enable a fast time to image and easy, foolproof handling.

The Thermo Scientific™ Phenom™ ParticleX Scanning Electron Microscope (SEM) for Additive Manufacturing. The Phenom ParticleX AM Desktop SEM is a multi-purpose desktop SEM delivering purity at the microscale.

Take in-house control of your data:

• Monitor critical characteristics of metal powders
• Suited for powder-bed and powder-fed additive manufacturing processes
• Identify particle size distributions, individual particle morphology, and foreign particles

It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

The Thermo Scientific™ Phenom™ ParticleX Scanning Electron Microscope (SEM) for Technical Cleanliness. The Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling cleanliness at the microscale.

Take in-house control of your data:

• Versatile solution
• VDA19 or ISO16232 confirmation

It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system. Next to this, it is equipped with a chamber that allows analysis of large samples up to 100mm x 100mm. The XL allows for in-situ testing with a tensile and compression holder up to 150N or 1000N. Optional eucentric and compucentric stage and vibration isolation platform only for the XL.

The new Phenom ProX is a complete desktop analysis tool, offering 150,000x magnification and easy to use EDS X-ray analysis. Although powerful, it also retains the super-fast load times and innovative user interface to produce high-quality electron microscope images with minimal training. Now with the option for secondary electron imaging.

• 150,000x magnification, ≤10 nm resolution (BSE), ≤8 nm resolution (SE). 
• Integrated EDS system for X-ray Elemental Analysis
• Range of in-situ holders for SEM analysis (electrical feedthrough and temperature)
• 30 second load time
• Charge reduction mode

The Phenom Pro is the most powerful desktop SEM available providing an unsurpassed 150,000x magnification. Although powerful, it also retains the super-fast load times and innovative user interface to produce high-quality electron microscope images with minimal training. Now with the option for secondary electron imaging.

• 150,000x magnification
• ≤10nm resolution (BSE), ≤8nm resolution (SE). 
• 30 second load time
• Motorised stage for easy navigation
• Charge reduction mode