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Phenom ParticleX TC Desktop SEM

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Phenom ParticleX TC Desktop SEM

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Product Code: ParticleX TC
Manufacturer: Thermo Fisher Scientific


The Thermo Scientific™ Phenom ParticleX Scanning Electron Microscope (SEM) for Technical Cleanliness. The Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling cleanliness at the microscale.


Take in-house control of your data:



  • Versatile solution

  • VDA19 or ISO16232 confirmation


It is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

A growing number of manufacturing companies are establishing scanning electron microscopy (SEM) systems in-house. This trend, from outsourcing to in-house analysis, is growing and the benefits, such as the ability to perform a broad range of automated desktop analyses, chemical classification and verification according to specific norms are clear. Timely and accurate quality control are prerequisites for today’s manufacturing. The Thermo Scientific™ Phenom™ ParticleX Desktop SEM is a versatile solution for high-quality analysis in-house. It gives you the ability to carry out speedy analysis, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is automated and offers multiple sample analysis, making testing and classification up to 10 times faster. Outsourcing typically takes up to 10 working days, whereas the Phenom ParticleX Desktop SEM gives you certainty within one day. The system is simple to operate and fast to learn, opening up the use of particle and material analysis to a wider group of users in-house. In addition to eliminating the need to outsource, the ease-of-use and automation of the Phenom ParticleX Desktop SEM allows you to offload sample analysis from other SEMs in your laboratory.

The Phenom ParticleX Desktop SEM not only provides high quality SEM analysis, it is also designed to perform a number of specific functions. These include particle analysis of metal powders at the microscale for the additive industry, and confirming that components fulfill technical cleanliness specifications according to VDA19 or ISO16232 standards. All now made possible in-house and on your desktop.

Phenom ParticleX Desktop SEM:
The Phenom ParticleX Desktop SEM features a chamber which includes an accurate and fast motorised stage that allows analysis of samples of up to 100 mm x 100 mm. In spite of this larger sample size, a proprietary loading shuttle keeps the vent/load cycle to an industry-leading sample loading time of 40 seconds or less.  In practice this improves the throughput factors higher than other SEM systems.

The user interface is based on the proven ease-of-use technology applied in the successful Phenom desktop SEM products. The interface enables both existing and new users to quickly become familiar with the system with a minimum of training. The standard detector in the Phenom ParticleX Desktop SEM is a four-segment backscattered electron detector (BSD) that yields sharp images and provides chemical contrast information together with a fully integrated energy dispersive X-ray (EDX) system for elemental analysis. A secondary electron detector (SED) for surface sensitive imaging is optional.Elemental analysis is provided by EDX technology, which allows users to analyze the chemical composition of their samples. Detailed chemical composition can be obtained from a micro volume via a spot analysis. Elemental distribution can be visualised with the elemental mapping option. 

Elemental Mapping and Line ScanFor the user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX Desktop SEM. The elemental mapping functionality visualizes the distribution of elements throughout the sample, and selected elements can be mapped at a user-specified pixel resolution and acquisition time. The real-time mapping algorithm shows live build-up of the selected elements. The line scan functionality shows the quantified element distribution in a line plot. This is especially useful for coatings, paints and other applications with multiple layers for analysing edges, coatings, cross sections and other. Results of both the elemental mapping and line scan functionality can be easily exported by using an automated report template.Secondary Electron DetectorA secondary electron detector (SED) is optionally available on the Phenom ParticleX Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample, making it the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.

Phenom ParticleX Desktop SEM - Technical Cleanliness
With the growing demand for analysis of smaller particles beyond the scope of light microscopy within automotive industries, the Phenom ParticleX Desktop SEM - Technical Cleanliness enables automated Scanning Electron Microscopy with EDX Spectrometry. This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 are available.Industry-standard 47 mm filters can be automatically analysed by starting an Automated Feature Analysis run. Standard recipes can be applied while specific parameters like particle size range, chemical classification rules, area of interest and stop criteria can be set for your application.

Once the data is acquired, a report can be created according to automotive industry standards or user specific reports.Afterwards, every particle can be revisited for further analysis.

Additional Information

IMAGING SPECIFICATIONS  
Imaging Modes
Light optical Magnification range: 3-16x
Electron optical

Magnification range: 80-100,000x
Digital zoom max. 12x

Illumination
Light optical Bright field/dark field modes
Electron optical Long lifetime thermionic source (CeB6)
Multiple beam currents
Acceleration voltages - Phenom UI

Default: 5 kV, 10 kV and 15 kV
Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mod

Vacuum levels Low - medium - high
Resolution <14 nm
Acceleration voltages Technical cleanliness EDX analyses

15 kV

Detector  FEG
Standard Backscattered electron detector
Energy Dispersive  Spectroscopy detector
Optional Secondary electron detector
Digital image detection 
Light optical Proprietary high resolution color navigation camera, single shot
Electron optical High sensitivity backscattered electron detector (compositional and topographical modes)
Image formats

JPEG, TIFF, BMP

Image resolution options 456 x 456, 684 x 684, 1024 x 1024 and 2048 x 2048 pixels
Data storage

USB flash drive, Network, Workstation

Sample stage

Computer-controlled motorized X and Y

 Sample size

Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
Max. 65 mm (h)

Scan area

50 mm x 50 mm
100 mm x 100 mm (optional)

Sample loading time
Light optical <5 s
Electron optical <40 s
EDX Specifications
Hardware

Detector type Silicon Drift Detector (SDD)
Thermoelectrically cooled (LN2 free)
Detector active area 25mm2
X-ray window Ultra thin Silicon Nitride (Si3N4) window allowing detection of elements B to Am
Energy resolution Mn Ka ≤132 eV
Processing capabilities Multi-channel analyser with 2048 channels at 10 eV/ch
Max. input count rate 300,000 cps

Hardware integration Fully embedded
Software Integrated column and stage control
Auto-peak ID
Iterative strip peak deconvolution
Confidence of analysis indicator
Export functions: CSV, JPG, TIFF, ELID, EMSA
Report Doc format
Elemental Mapping & Line Scan Specifications
Elemental Mapping
Element selection 10 individual user specified maps, plus backscatter image and mix-image
Backscatter image and mix-range
Selected area Any size, rectangular
Mapping resolution range 16 x 16 - 1024 x 1024 pixels
Pixel dwell time range 1 - 250 ms
Line Scan
Line Scan resolution range 16 - 512 pixels
Points dwell time range 50 - 250 ms
Total number of lines 12
Report Docx format
SED Specifications
Detector type Everhart Thornley
System Specifications
Dimensions & weight
Imaging module 316(w) x 587(d) x 625(h) mm, 75 kg
Diaphragm vacuum pump 145(w) x 220(d) x 213(h) mm, 4.5 kg
Power supply 156(w) x 300(d) x 74(h) mm, 3 kg
Monitor 531.5(w) x 515.4(h) x 250(d) mm,6.7 kg
Workstation 169(w) x 456(d) x 432(h) mm,15 kg
Requirements
Ambient conditions
Temperature 15°C ~ 30°C (59°F ~ 86°F)
Humidity <80% RH
Power Single phase AC 110 - 240 Volt, 50/60 Hz, 300 W (max.)
Recommended table size 150 x 75 cm, load rating of 150 kg
Workstation specifications HP-PC Tower PC
CPU Intel Xeon E5-1620• RAM 16 GB
SSD 2 x 1TB
USB Keyboard; USB Mouse
Microsoft Windows® 10 Enterprise Edition (64-bit)
ParticleX Software preinstalled, full license code included
ProSuite Framework preinstalled, full license code included
Automated Image Mapping
Remote UI

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