Characterisation, Measurement & Analysis
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Fischione Model 1080 PicoMill® TEM specimen preparation system

A guide for preparing TEM specimens for a demonstration of the Model 1080 PicoMill® TEM specimen preparation system at Fischione Instruments.

The Fischione Model 1080 PicoMill® TEM specimen preparation system is ideal for specimen processing following focused ion beam (FIB) milling. The PicoMill system’s concentrated argon ion beam, typically in the energy range of 50 to 2000eV, excels at targeted milling and specimen surface damage removal. Ion induced secondary electron imaging is used to locate the FIB-produced lamella and then to target the region that will receive low energy milling in either raster or spot modes. Only the lamella is targeted during ion milling. Ion bombardment of the supporting grid is eliminated, which helps to prevent redeposition. The PicoMill system can also remove damage from electro polished or broad beam ion milled specimens.

CLICK HERE to download the full Model 1080 PicoMill® TEM Specimen Preparation System Application Note.

For further information, application support, demo or quotation requests  please contact us on 01582 764334 or click here to email.

Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Machine Vision, Optical Metrology, Fibre Optics and Microscopy.