Electron Probe Microanalysis (EPMA) is a powerful analytical technique used to determine the elemental composition of solid materials with exceptional spatial resolution and quantitative accuracy.Using a focused electron beam, EPMA enables precise measurement of both major and trace elements across microscopic features, making it an essential tool in materials science, geology, semiconductor research, and advanced manufacturing. Achieving reliable EPMA results...
Knowledge Base
Welcome to the Lambda Knowledge Base
-
Battery Solutions at Lambda Photometrics
Advances in battery research and development depend on a combination of precise materials preparation, detailed structural and chemical analysis, and robust electrical testing. Together, these capabilities enable researchers and engineers to better understand performance, durability, and failure mechanisms in modern battery systems. Lambda Photometrics offers a variety of technologies used across the workflow; from sample preparation and imaging to electrochemical... -
Rigol For Education: Modernise Your Electronics Teaching Lab
At Lambda Photometrics, we understand the critical role advanced instruments play in teaching future engineers. For over 45 years, we’ve partnered with university research and teaching labs, delivering industry-leading performance and value to help institutions provide both theoretical instruction and hands-on experimentation. Equip your students to tackle todays and tomorrow’s design challenges with ease. Whether it’s an Oscilloscope, Spectrum Analyser... -
Application Note: USB 3.0 Compliance Testing with the RIGOL DS80000 Series Oscilloscope
With the proliferation of high-speed peripherals in systems design, interface compliance has become a non-negotiable requirement. In particular, the USB 3.0 (SuperSpeed USB) standard demands stringent verification of physical-layer parameters, signal integrity and jitter performance. The RIGOL DS80000 Series oscilloscope, paired with the dedicated USB 3.0 Compliance Test software option, offers a powerful platform for performing full physical-layer compliance testing... -
White Paper: CS548 Double Pulse Testing
The CS548 isolated-channel oscilloscope can be used for Double Pulse Testing (DPT). This white paper illustrates the measurements that can be made, and how to interpret them. This paper should be read in conjunction with the CS1501 Insertion Inductance white paper, which identified the insertion inductance of the CS1501 1 mΩ current sensor to be 163 pH. Click HERE to... -
Precision in the heat: measuring jet engine turbine blades with a Zygo™ 3D Optical Profiler
A jet engine is a marvel of engineering. Its seamless orchestration of components enables takeoff, flight, and landing—events we’ve come to expect with confidence. But behind this reliability lies a world of extreme conditions and uncompromising standards.Jet engines operate at temperatures exceeding 3000°F, and this heat is not just a byproduct but a necessity for fuel efficiency and performance. Advances... -
Wafer Probe Tip Selection
Probe Tips or Probe Needles come in a variety of materials, lengths, shapes and tip diameter or radii (Everbeing are stated in tip diameter). They provide direct electrical contact to the circuit under test. Probe tips are specified to suit each individual application. Considerations should be made regarding the material to be probed, temperature, bond pad size and bond pad... -
How Zygo delivers high-performance optics from an unmatched range of substrates
To make sure high-performance optical systems don’t crack under pressure, selecting the right material is not a secondary consideration, it is foundational. The substrate used for an optical window or mirror governs the system’s optical performance, thermal stability, and resilience under operational conditions. Zygo™, a global leader in precision optics, distinguishes itself through a material-agnostic capability, manufacturing from an exceptionally... -
OSA: Optical Amplifier (EDFA) Measurement Guide
Outline of Optical amplifier measurementWith the increase in communication traffic, the importance of optical amplifiers such as EDFAs (erbium-doped fiber amplifiers) that can directly amplify optical signals without converting them into electrical signals has been widely deployed in traditional backbone optical transmission networks. This proven amplification technique has expanded to a next generation application to boost free space communication laser... -
Three Ways to Measure Pulsed Light with an Optical Spectrum Analyser
Overview of Pulsed Light Measurement Why use pulsed light? A semiconductor laser emits light by a driving current. This drive current causes the semiconductor laser chip to generate heat, causing a shift in the output wavelength and potentially damaging the laser. To avoid such problems, pulse-driven light emission is widely used. Furthermore, high-power industrial lasers may require an energy accumulation...



