Knowledge Base

Welcome to the Lambda Knowledge Base

  1. Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer

    Lambda Photometrics is proud to serve as the exclusive B2B supplier of First Contact™ Polymer, further enhancing our product suite and reinforcing our commitment to comprehensive, high-quality solutions. This strategic partnership enriches Lambda's optical metrology portfolio by integrating a precise, reliable solution for optics cleaning, essential for accurate optical surface measurements. In this application note, we demonstrate the effectiveness of...
  2. Preparing APT Specimens in a Controlled Air Free Environment

    In this webinar, Fischione presented sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation...
  3. Technical capabilities required to ensure successful vacuum window fabrication

    There are many factors which contribute to the successful manufacture of vacuum windows. The understanding and use of cutting-edge technology, quality control via state-of-the-art metrology tools, and understanding of material properties are all critical to their design and manufacture. When combined with a culture of innovation and in-depth and broad experience of precision optics manufacture, these technical capabilities can be...
  4. Ex situ lift-out specimen thinning

    Ar ion milling of specimens on carbon support grids The PicoMill system's scanning transmission electron microscope (STEM) detector images of EXLO specimens from a 20 nm NAND solid-state drive device. Before (first row, left) and after (first row, right) concentrated Ar ion beam milling images show an intact specimen while parts of the perforated carbon support were milled off. Bright-field TEM imaging before...
  5. Attosecond Timing Distribution

    Ultra-stable distribution of timing signals plays a key role in many scientific experiments and research facilities like free electrons lasers or radio-telescope arrays. Timing distribution via optical fiber is convenient and it enables connection of very distant devices separated by distances of hundred meters. Such optical links achieve distribution of RF signals with sub-femtosecond synchronization-level over years. We describe here...
  6. Photonic Analog to Digital Conversion

    Digitalization of data opens unprecedented opportunities in telecommunication, radar and signal processing. Almost all sensing systems in use today require analog signals to be converted to digital ones. Signal rates have grown at a rate that has outpaced electronic analog to digital conversion (ADC). This demand for higher bandwidth, speed or digitalization precision puts stringent requirements on the aperture jitter...
  7. Designing the Electron Microscope of the Future

    How Siemens and Semplor democratized SEM and shrank it to fit on a desk. Traditional scanning electron microscopes (SEMs) are large, expensive and complex pieces of lab equipment. To use, maintain and repair them would require specialized knowledge and skills few companies and research outlets have. This didn’t sit well with Semplor, makers of NANOS — an easy-to-use SEM the...
  8. Quantum Computers: The Importance of Vibration Isolation

    What is the basic idea in quantum mechanics that quantum computers use?Quantum computers take advantage of quantum mechanics, an extremely successful fundamental theory in physics that describes the behavior of very small objects, objects at the atomic level and smaller. The theory states that small objects aren’t made up of solid particles like billiard balls but are fundamentally wavelike. It...
  9. Elastic strain measurements

    High-resolution electron backscatter diffraction Backscatter electron contrast images (left) and elastic strain (Ɛxx normal strain component) maps (right) associated with the ɣ/ɣ’ interfaces in Ni-superalloy measured by high-resolution electron backscatter diffraction technique. Data were collected from the same area after mechanical polishing and after broad argon ion beam milling. High-resolution electron backscatter diffraction (HR-EBSD) strain measurements are very sensitive to...
  10. HAROGIC Technologies introduces the SAE-200

    HAROGIC Technologies, a company that develops miniaturized, high-performance RF test instruments, has introduced the SAE-200, a USB-based real-time spectrum analyser that operates from 9 kHz to 20 GHz with a 100 MHz bandwidth. It is an advanced RF instrument that meets the SWaP-C requirements - (S) Small Size, (W) Lightweight, weighs less than 200 g, (P) high-performance and (C) The unit costs £7,500...

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