Sample preparation techniques for large-area data acquisition Large-area transmission Kikuchi diffraction (TKD) analysis of nanostructured nickel. Inverse pole figure (IPF) color-coded orientation maps with 8 nm twin boundaries are shown. Data was collected from defect-free, ultrathin ~40 nm samples with a maximum of three grain layers. TKD analyses condition: 30 kV acceleration voltage and 1.6 nA beam current. To achieve optimal...
Knowledge Base
Welcome to the Lambda Knowledge Base
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Roughness Measurements — Let’s Take a Closer Look
Surface roughness refers to the fine texture of a part’s surface. Every manufactured part’s surface has three key components—form, waviness, and roughness. Together, they influence how well a part performs. The characteristics of these components are tied to the manufacturing process or processes used to create the part. This could be polishing, grinding, cutting, or edging to name a few.Surface... -
Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
Moving stages are essential but challenging components in semiconductor and nanotechnology manufacturing. These stages, used in wafer inspection, lithography, metrology ,and other applications can cause significant vibration that can affect tool performance and throughput if it is not mitigated properly.In this interview, Elias Brassitos, Senior Control Systems Engineer at AMETEK, talks to AZoMaterials about these challenges and solutions. TMC works... -
Vibration Control Solutions for Microscopy
The article "Vibration Control Solutions for Microscopy" focuses on the critical role of vibration control in ensuring accurate results in microscopy, especially for high-precision instruments like electron microscopes. Microscopes, particularly advanced models such as Scanning Electron Microscopes (SEM) or Atomic Force Microscopes (AFM), require extreme stability to capture high-resolution images. Even slight vibration from environmental factors such as nearby foot... -
Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
Lambda Photometrics is proud to serve as the exclusive B2B supplier of First Contact™ Polymer, further enhancing our product suite and reinforcing our commitment to comprehensive, high-quality solutions. This strategic partnership enriches Lambda's optical metrology portfolio by integrating a precise, reliable solution for optics cleaning, essential for accurate optical surface measurements. In this application note, we demonstrate the effectiveness of... -
Preparing APT Specimens in a Controlled Air Free Environment
In this webinar, Fischione presented sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation... -
Technical capabilities required to ensure successful vacuum window fabrication
There are many factors which contribute to the successful manufacture of vacuum windows. The understanding and use of cutting-edge technology, quality control via state-of-the-art metrology tools, and understanding of material properties are all critical to their design and manufacture. When combined with a culture of innovation and in-depth and broad experience of precision optics manufacture, these technical capabilities can be... -
Ex situ lift-out specimen thinning
Ar ion milling of specimens on carbon support grids The PicoMill system's scanning transmission electron microscope (STEM) detector images of EXLO specimens from a 20 nm NAND solid-state drive device. Before (first row, left) and after (first row, right) concentrated Ar ion beam milling images show an intact specimen while parts of the perforated carbon support were milled off. Bright-field TEM imaging before... -
Attosecond Timing Distribution
Ultra-stable distribution of timing signals plays a key role in many scientific experiments and research facilities like free electrons lasers or radio-telescope arrays. Timing distribution via optical fiber is convenient and it enables connection of very distant devices separated by distances of hundred meters. Such optical links achieve distribution of RF signals with sub-femtosecond synchronization-level over years. We describe here... -
Photonic Analog to Digital Conversion
Digitalization of data opens unprecedented opportunities in telecommunication, radar and signal processing. Almost all sensing systems in use today require analog signals to be converted to digital ones. Signal rates have grown at a rate that has outpaced electronic analog to digital conversion (ADC). This demand for higher bandwidth, speed or digitalization precision puts stringent requirements on the aperture jitter...