19-21 August 2026 Royal Geographical Society in London nanoFabUK is a national collaborative platform led by Research Technical Professionals (RTPs), designed to support and enhance the UK’s nanofabrication infrastructure. CLICK HERE to register. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting.
News
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High-Performance Signal Validation: The New RIGOL MSO/DS9000 Series
MSO/DS9000 Series Digital Oscilloscope The release of the MSO/DS9000 Series marks a significant milestone in RIGOL’s high-performance instrument lineup. Built on a next-generation hardware platform, this series is engineered to meet the rigorous demands of advanced debugging, signal integrity validation, and high-speed serial analysis. With bandwidths up to 6 GHz and a real-time sampling rate of 20 GSa/s, the DS9000... -
Introducing the new RIGOL DNA5000 & DNA6000 Series 26.5 GHz 2/4 Port VNAs
Lambda Photometrics is pleased to announce the arrival of the RIGOL DNA5000 and DNA6000 Series Vector Network Analysers (VNAs). These next-generation instruments provide fully vector-corrected S-parameter measurements from 5 kHz up to 26.5 GHz, designed specifically for the characterisation of high-bandwidth passive and active RF devices. DNA5000 Series: Precision Portability The Rigol DNA5000 is a 2-port solution engineered for environments... -
Precision at altitude - how Zygo-Navitar powers aerospace innovation
The aerospace industry operates at the outer limits of engineering possibility. Every component (whether a turbine blade, flight control sensor, or optical window) must deliver flawless performance in extreme conditions of heat, stress, and vibration. In such an environment, even the smallest deviation can result in inefficiency, downtime, or catastrophic failure.For more than 50 years, Zygo-Navitar has supported aerospace manufacturers... -
New Product Introduction: Rigol MHO900 Series Mixed Signal Oscilloscopes
Lambda Photometrics is pleased to announce the arrival of the Rigol MHO900 Series Mixed Signal Oscilloscopes – a new generation of high-performance instruments designed to deliver exceptional signal fidelity, advanced analysis capability, and modern connectivity in a compact and portable form factor. The MHO900 series combines 12-bit vertical resolution, up to 4 GSa/s sampling rate, and bandwidths up to 800... -
Visit Lambda at EDS on Stand L2
Lambda Photometrics are delighted to announce that we will be exhibiting at the Electronic Design Show 2025 (EDS). We will be showcasing a carefully selected range of our latest test and measurement instruments and EMC pre-compliance solutions, with hands-on demonstrations and expert advice available throughout the event. Visitors to our stand can look forward to exclusive EDS-only offers, exciting giveaways... -
About coating thickness and visual appearance
Thin coatings consisting of materials such as gold or platinum that were applied via sputter coating do not always have the “metallic appearance” we are familiar with in everyday life. Gold or platinum coatings with layer thicknesses below 15 to 20 nm do not have the “gold appearance” or “platinum appearance” that one would expect. This is often interpreted by... -
WEBINAR: Large-area SEM sample preparation for industrial applications
Tuesday, July 15, 18.00 BST Backscatter electron image (top) of a 7 mm Ti-6Al-4V cross-section sample; electron backscatter diffraction (EBSD) map (bottom) collected over the same surface showing full-area crystallographic orientation inverse pole figure map. Modern materials analysis demands sample preparation tools that can keep up with the size, complexity, and sensitivity of engineering materials used in aerospace, semiconductors, and lithium-ion... -
WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
Join us for a webinar where we introduce an advanced Ar ion milling technique designed to make your work easier, faster, and more accurate. Click here to view a recording of the event. Traditional Ga focused ion beam (FIB) and Xe plasma FIB milling often cause amorphization and leave ion-implanted layers on TEM specimens. Fischione Instruments’ NanoMill® TEM specimen preparation system has... -
Optical Profilers in an Argon Chamber Environment
Did you know that you can now use Zygo Optical Profilers within argon chambers? This groundbreaking capability allows for precise metrology in controlled argon environments, commonly referred to as Argon Gloveboxes. This unique and thoroughly tested feature enables optical profiling under argon conditions, opening new possibilities for research and manufacturing applications. Argon chambers are indispensable tools in various research and...



