Characterisation, Measurement & Analysis
+44(0)1582 764334


  • Electronic Design Show 2017


    Electronic Design Show 2017.

    Wednesday 18th - Thursday 19th October 2017.

    Ricoh Arena, Coventry.

    Click here for more exhibition information.

  • UKIVA Machine Vision Conference & Exhibition (MVC)

    ukiva-mvc17-200x400_logoUKIVA Machine Vision Conference & Exhibition (MVC).

    Thursday 27 April 2017.

    Arena MK Stadium Way, Milton Keynes MK1 1ST.

    Click here for more exhibition information.

    Learn about the latest technology and applications within the Machine Vision industry, through informative presentations on new and emerging Machine Vision technologies given by industry leading manufacturers and UK distributors.

    See live demonstrations of the latest technologies within the Machine Vision industry, via the exhibition, where Machine Vision component manufacturers, system manufacturers and local distributors will be present.

    Meet industry experts from Machine Vision component and system manufacturers, along with local distributors.


  • New partnership with Xiton Photonics GmbH

    Datenblatt-Impress224.cdrLambda Photometrics are delighted to announce an exciting new partnership to promote Xiton Photonics GmbH products in the UK & Ireland. For more than 10 years Xiton Photonics GmbH has been producing high-quality, DPSS lasers with a core expertise in nonlinear optical conversion that has enabled Xiton to develop lasers with deep ultraviolet (UV) wavelengths of 224, 213 & 193nm with ultra-low maintenance costs. In addition, Xiton also offer nanosecond & picoseond pulsewidth lasers with unique wavelengths of 1342, 671 & 447nm for applications such as flat panel display repair and thin film patterning. Xiton also manufacture the SLM series, which are single longitudinal mode, solid state lasers with the deep UV wavelength and long coherence length ideally suited to fibre Bragg grating (FBG) fabrication.

    xiton_uv_slm Xiton Photonics Laser Systems. Tailored to satisfy your needs.

    The considerable knowledge at Xiton in laser manufacture and non-linear harmonic conversion is well-aligned with Lambda’s expertise in UV technologies with products including the Xenon Corp pulsed light sources, LASOS CW UV lasers, Opotek tunable wavelength OPO’s, B&W Tek xenon light sources and SRS nitrogen lasers. This appointment maintains Lambda Photometrics’ position as the leading supplier of deep UV lasers and light sources in the UK & Ireland.

    Click here for more information or to speak with a Sales & Applications Engineer please call 01582 764334 or click here to email.

    This appointment consolidates Lambda Photometrics Ltd. position as the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Pulsed Xenon Light Systems.

    Lambda Photometrics – the deep UV specialists.

  • Reducing Photobleaching Effect in STED Microscopy with Subnanosecond Laser

    The Molecular Microscopy and Spectroscopy group together with the Nanoscopy group at the Istituto Italiano di Tecnologia (IIT), Genova, Italy, have significantly reduced the photobleaching effect in STED (STimulated Emission Depletion) microscopy without the reduction of the spatial resolution by combining the time-gated detection technique with the use of the sub-nanosecond fibre laser Katana HP as STED laser beam [Fig. 1]. This result brings the development of commercially available, super-resolution microscopes one step further.

    Figure 2 STED microscopy images using Onefive Katana HP as deletion laser source. Figure 1 STED microscopy images using Onefive Katana HP as deletion laser source.
    Figure 1 Onefive Katana HP laser. Figure 2 Onefive Katana HP laser.

    The Katana HP laser by Onefive offers the capability to be externally triggered. This capability allows to synchronize and temporally align the STED pulses to the excitation pulses with the simple use of an electronic picosecond delayer. For these reasons, the use of the Katana HP laser as STED laser significantly reduces costs and complexity of a STED microscope with respect to the use of stretched pulses from a mode-locked femtosecond laser.

    The STED super-resolution microscopy technique, which was awarded the Nobel Prize in Chemistry in 2014 (Prof S W Hell), makes use of the photophysical properties of fluorescent probes to achieve nanometer-scale spatial resolution, well below the limit imposed by the diffraction of the light. It can thus reveal details that have not been visible before. In particular, STED microscopy is based on the ability to control the fluorescence emission of the probes in time and space by the superposition of a red-shifted STED laser beam to the excitation beam of a conventional microscope.

    The picosecond Katana HP platform offers several wavelengths, which cover most commonly used fluorophores. In particular it is available at high-power and sub-nanosecond pulse duration in green, yellow, orange, red and infrared. Therefore it can be efficiently used to deplete fluorophores excited in the violet, blue, green and orange. OEM modules are available at 532nm, 577nm, 592nm, 620nm and 775nm. Katana HP can be externally synchronised, while also offering the versatility of continuously tuning the pulse repetition rate, from pulse on demand up to 120MHz. The Kapatan HP comes with a very small foot-print package with industrial robustness and reliability.

  • Position Monitoring for Efficient Processing

    Saving time and costs with an integrated PSD
    by Dr. Susanne Dröscher

    laser-beam-position-monitoring-for-efficient-processing-2Appreciating beam alignment
    Let’s assume you have an alarm at home like the one displayed above. In order to silence it, you have to hit the bull’s eye with the beam of a laser pointer. While this is an easy task with a red laser, it would be much more challenging with an invisible infrared laser. If the beam diameter and the target are shrunk to a few micrometers, your morning would definitely be ruined.

    Maintenance of laser systems
    Laser engineers face a comparable situation during the maintenance of a laser system: a beam needs to follow a specified beam path with μm-precision. Misalignment of mirrors or other optical components causes the beam to be deflected. Besides thermal drift of the system, the slight displacement of optics over time leads to this misalignment. During a typical maintenance, all mirrors and optics are readjusted. In order to determine the beam position at a specific location in the beam path, oftentimes the laser system needs to be opened to access the desired location. This is a tedious and time consuming process. Furthermore, it constitutes a safety issue for medium to high power laser systems which sometimes require the surrounding production environment to be shut down.

    Measuring beam position & power
    An integrated position detector allows you to measure beam position as well as average laser power. Without opening the laser system, the user can easily obtain the information necessary to control beam position. Such a detector can be placed at one or more positions in the beam path to provide feed-back on the current beam alignment. In the following paragraphs, we present the results of characterisation measurements for our thermopile position sensitive device (PSD), the gRAY C50-PC.

    fig1aFigure 1: gRAY position detector C50-PC. Based on a thermopile sensor, it is sensitive from UV to IR. The compact detector is mounted onto an aluminum plate for thermal management and easy fixation

    Functionality and read-out
    The PSD is based on a thermopile detector. For a standard power sensor, all thermocouples in the module would be connected in series for the signal read-out. To form the PSD, only the thermocouples in each quadrant are electrically connected to divide the total area into four electrically separated regions. Due to the common mechanical integration, a thermal coupling is still provided between all segments.
    When illuminating one of the sections with a laser spot, the output signal of this segment increases, whereas the other segments will show a low signal output. If the beam is moved towards the centre, the signal of this section starts to decrease. The other three signals increase on the other hand, since the power detected in those sections is higher when the beam is closer to the centre of the PSD.
    The x and y-position of the incident laser beam can be determined by relating the recorded signal for all four segments. Hence, a direct read-out of the laser beam position is possible.

    Scanning across the sensor
    The normalised sensor output for the y-position is shown in Fig. 2. The laser spot of a 1 W, CW, 1064 nm laser was scanned across the surface with a step size of 100 μm. A monotonous increase of the signal is observed when scanning in the y-direction. Around the sensor centre, the signal increases quasi linearly. Towards the edges of the detector a saturation of the signal is observed. This non-linearity is expected for any PSD due to the Gaussian shape of the laser beam and the induced temperature profile. This effect can be compensated for during signal post-processing if requested.

    fig2Figure 2: y-position of the sensor signal when scanning across the sensor. A steep linear dependence is observed around the centre of the sensor.

    Beam position with μm accuracy
    In order to determine the position accuracy, the beam was placed at different positions on the detector. For each position, the standard deviation of the signal was converted into a FWHM of the lateral resolution. Two exemplary data sets are:

    x = y = 0:
    FWHM in x = 3.9 μm
    FWHM in y = 4.3 μm
    x = y = 0.4 mm:
    FWHM in x = 4.7 μm
    FWHM in y = 4.9 μm

    At these two locations, the lateral position on the detector can thus be determined with an accuracy of better than 5 μm. The histogram in Fig. 3 visualises this effect even more clearly.

    fig3Figure 3: Lateral resolution of the beam position measured around the center of the detector. The FWHM of the histo-gram shown here is <5 μm.

    The gRAY – C50-PC has been characterised as a position sensitive device for laser beams. The results presented here suggest that the lateral resolution is as low as 5 μm at 1 W. Further, the short rise time of only 250 ms (common for all C-type gRAY detectors) ensures fast feedback. Because of its compactness, the detector is ideal for OEM applications.
    Integrating a PSD into a laser system allows for an improved knowledge of the laser parameters power and position. This information translates directly to a higher process efficiency and quality.

    Finding an even better solution
    As an SME with an excellent R&D and production team, greenTEG can react to the customisation demands of customers immediately. We regularly develop customised solutions for OEM customers to meet their specific requirements. The constant exchange with customers helps us to understand their challenges. We provide suggestions for new and innovative detector units and plan developments in close collaboration with the customer.
    Contact us with your application requirements and ideas!

  • New EX series – Baumer quality at low prices

    The new industrial cameras of the Baumer EX series focus on essential standard-compliant basic functions and therefore are ideal for varied typical machine vision applications. Integrating the latest generation of CMOS sensors in their robust metal housing, they provide long-term stability in application designs. With resolutions from VGA up to 2 megapixel and up to 217 frames per second, the cameras are available with both Gigabit Ethernet and USB 3.0 interface to meet many resolution and bandwidth requirements in the same form factor.


    A size of 29 x 29 mm with M3 mounts at each side allows for easy and cost-efficient installation with maximum flexibility even in cramped space. Thanks to efficient thermal design, the camera endures a wide housing temperature range up to 65°C to match ever higher temperature requirements. Cost-efficient CS mount lenses will cut down on system cost.  C-mount compatibility is provided via an optional adapter.

    Camera models featuring USB 3.0 interface allow for single-cable solutions and easy integration by plug & play. GigE Vision and USB3 Vision standard compatibility ensures maximum flexibility when implemented in existing installations.

    Contact Clive Phillips on 01582 764334 for further details.

  • Why desktop SEM saves lab operators a lot of time

    Is it true that as a lab operator, you work under constant time pressure? Do you find it challenging to deliver output quickly? Does it take hard work to maintain your high standard of quality?


    These challenges might be the result of the technology you use. Chances are that you work with an optical microscope, or better yet — with an SEM. That makes sense: because of its electron imaging, SEM produces a higher image resolution and magnification, greater image depth, and a visualisation of the three-dimensional external shape of an object.

    But a traditional SEM is also expensive, takes up a lot of space, and requires intensive training to master. That is where a desktop SEM comes in (to replace the traditional floor model SEM).

    Are you familiar with a desktop SEM? Do you know what separates a desktop SEM from a traditional floor model SEM? In this article, we will explain the differences to you.

    Desktop SEM vs. traditional floor model SEM

    A desktop SEM — also referred to as a personal or benchtop SEM — is a smaller, more handy version of the traditional floor model SEM. Because of its simplified user interface, a desktop SEM is easier to use than a floor model SEM — and that is why it will benefit you greatly.

    In fact, a desktop SEM is so manageable that even researchers with none or very basic lab skills can operate it. Which means they can now process their samples themselves. Simply said, a desktop SEM helps you delegate your work to researchers. The result: instead of focusing on all the SEM output you are supposed to deliver, you now have more time for your other lab responsibilities. Which means less pressure — and that is a big benefit.

    Now that we have addressed the greatest benefit for you, let's take look at the other advantages of a desktop SEM:

    • A desktop SEM is significantly more affordable than a traditional floor model SEM.
    • Because of it's smaller size, a desktop SEM is portable and can be placed on your workstation.
    • A desktop SEM requires less setup time and maintenance than a traditional floor model SEM.
    • A desktop SEM is much faster; it reduces loading times to as much as 80%, compared to a traditional floor model SEM. It does so by using an innovative loading technology that combines a sliding plate lock and a small evacuated volume.

    So, a desktop SEM is a more affordable, smaller, handier SEM that provides a push-of-a-button experience — and quick and qualitative results. And since it is so manageable that researchers themselves can operate it, it is a major time-saver for you.

    Learn how Graphite and Carbon manufacturer GMSI gained significant flexibility by working with a desktop SEM. Click here to download the case study of a manufacturer that started going from outsourcing to insourcing.


    Article by Karl Kersten - Application Manager at Phenom-World, the world’s leading supplier of desktop scanning electron microscopes. He is passionate about converting customer requirements into product or feature specifications so customers can achieve their goals.

  • Customer Testimonial: Desktop SEM imaging in the development of a radioablation device

    World health has never been as advanced as it is now. Identifying and control of diseases is advancing at an exponential rate. However it’s the Big C that remains as a dark cloud over the landscape. With population longetivity increasing its inevitable that focus has become concentrated on cures for cancer.

    Research into radiation therapy utilise the Phenom ProX with Particle Metric post image analysis software the imaging and analytics of determining the quality of microspheres. The UMCU in the Netherlands hopes that conducting these clinical studies will lead to positive movement for patients with unremovable liver malignancies.



    Click here to download the full article

  • Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles

    As textiles have moved from woven to non woven fabrics the physical dimensions of the fibres have drastically reduced. Understanding the complexity of  fibre interaction in these matrices can be a drawn out and difficult  process as the technologies for these analytical studies have yet to catch up.

    The introduction of Fibre Metric Analysis from Phenom World within ProSuite allows hundreds of fibres to be measured and characterised within seconds. Here, Jitka Färberovä of Liberec outlines the use of Phenom’s new software innovation and how applications of noninterwoven fabrics are moving forward at a quicker pace because of it.




    Click here to download the full article

  • 10th Int Conference on Additive Manufacturing & 3D Printing


    10th Int Conference on Additive Manufacturing & 3D Printing,

    A perfect mixture of presentations and networking. A broad scope of presentations allowing less specialist participants but with enough depth to draw out the real issues, challenges and opportunities in additive manufacturing,

    Tuesday 12th - Thursday 14th July 2016.

    The Belfrey Hotel, Nottingham.

    Register for this event HERE

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