Characterisation, Measurement & Analysis
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Everbeing EB-6 - Analytical Probe Station

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Product Code: EB-6
Manufacturer: EverBeing
Analytical Probe Station with Vacuum Chuck for 4", 6", 8", 12" Wafer diameter
Stainless Steel or Gold Plated Vacuum Chuck

The EB series of probe staions from EverBeing offer high quality, precision probing solution for devices and full wafers. Available with 4, 6, 8 & 12 inch chucks, they can be used for many different applications, including Device Characterization, Failure AnalysisDesign Validation and Wafer Level Reliability. 

Features
Coaxial-Driven Chuck Stage
RF Probing Field Upgradable
20X~4000X Magnification
Backlash-Free Movement
Choice Of Microscope (Tilt) Up/Down
For E-Z Revolving Objevtives
 
 
Optional Accessories
RF Probe / Cables
Active Probes
Low Current / Capacitance Probes
High Voltage Probes
Laser Cutter
Ultrasonic Cutter
CCTV
Photomicrographics
Probe Card holder
Packaged Device Holder
PCB Holder
Thermal Chuck
Liquid Crystal Kit
Vibration Free Table
Shielding Box
Test Bench
Instrument Case With Caster
Microscope Quick Lift
Dark Field / Normarski Inspection
Chuck Vacuum Pattern
Gold Plated Chuck

Additional Information

  Specifications
  Vacuum Chuck 6" Stainless Steel
  Chuck Stage 6" x 6" Travel
  Chuck Theta 0~30 degree
  Chuck Up/Down 4mm Adjustable
  Platen 12 Micropositioner
  Microscope Stage 1" x 1" Travel
   
  Requirements
  Electrical 110 VAC, 60Hz
220 VAC, 60Hz
 
  Vacuum -250 mmHg, 7 liter/min
   
  Dimensions
  920mmW x 660mmD x 700mmH With Microscope
  Weight 180 Kg  With Microscope

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