The EssentOptics IRIS Broadband Optical Monitoring Systems (BOM) represent the most advanced solution for monitoring of vacuum deposition processes. IRIS systems are designed to control transmission or reflection spectra and allow for layer-by-layer correction of the thin film coatings. The system is based on EOS low noise and precision spectrometers designed by EssentOptics. The system comes with a robust software package for measuring optical performance and visualization of measurement process on the system’s display.

The EssentOptics AKRA Monochromatic Optical Monitoring Systems are designed to measure transmission and/or reflection of optical coatings during the vacuum deposition process in the record-wide wavelength range from 190 nm in UV up to 5000 nm in IR. The system is based on EssentOptics original design of monochromator and control software for visualization of the measurement process on the system’s control display.

The EssentOptics MultiSpectrum software is designed for calculation of the final coatings and intermediate layers of the thin film stack. The calculation results are used for reliable mapping of the deposition process and helping make informed decisions on process interruption or making corrections during the coating run.