Knowledge Base
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Sample Preparation and Electron Microscopy
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Imaging – Micro to Macro
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Metrology - Optics and Optical
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Photonics, Fibre Optics and Lasers
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Test and Measurement
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Service and Services
Imaging – Micro to Macro
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- Packaging and Process Troubleshooting
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- NEW NorPix announces the launch of StreamTouch
- Customer Testimonial: Closely monitored
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Compliant list for Baumer industrial cameras - USB 3.0
Metrology - Optics and Optical
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- Understanding Surface Texture Parameters
- SMARTTECH3D Metrology - 3D Scanners
- A History of ZYGO Optical Profilers
- New MICRON3D green stereo industrial scanner
- Optical Reflectometers – How Do They Compare?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- Scratches and Digs – measure on curves and large areas now!
- https://www.lambdaphoto.co.uk/news/2017/05/17/new-design-for-interference-microscopy-lenses-wins-rudolf-kingslake-medal/
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Metrology Applications 1
- Metrology Applications 2
- Metrology Applications 3
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
Sample Preparation and Electron Microscopy
- New motorized tilt & rotation sample holder for Phenom desktop SEM
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Particle analysis with the Phenom ParticleX AM Desktop SEM
- Large Area Ion Milling with the Fischione M1062 TrionMill
- Bringing advanced automation to the forefront in the NEW Phenom XL G2 Desktop SEM
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- FEG vs. Tungsten source in a scanning electron microscope (SEM): what’s the difference?
- SEM: types of electrons, their detection and the information they provide
- SEM automation – the future of scanning electron microscopy
- Phenom Pharos Wins Analytical Scientist Innovation Award!
- SEM trends: what is next? Automated scanning electron microscopy
- Everything is nano these days
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Buying a scanning electron microscope: how to select the right SEM
- What is SEM? Scanning electron microscope technology explained
- An introduction to Electron Microscopy
- How a desktop SEM saves lab operators a lot of time
- How SEM helps research polymers characteristics, properties and uses
- SEM and TEM: what's the difference?
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- New developments in spark production of nanoparticles
- Particle Analysis with the Phenom ParticleX AM Desktop SEM
- Microscopy Application 3
- Microscopy Application 2
- Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- Transmission Electron Microscopy (TEM) Sample preparation
- What is additive manufacturing technology? How does the process work?
- How a microfabrication researcher uses SEM as a technique to verify nanoscale structures
- How next-generation composite materials are manufactured and analysed
- How to spot astigmatism in Scanning Electron Microscopy (SEM) images
- Why SEM is a valuable technique for nanoparticle characterisation
- SEM automation guidelines for small script development: simulation and reporting
- Nano Mechanical Imaging
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- The Phenom Process Automation: mixing backscattered and secondary electron images using a Python script
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- Preparation and property assessment of neat lignocellulose nanofibrils (LCNF) and their composite films
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Customer Testimonial: Researching the chemical nature of production faults
- Automating a Laser Induced Damage Threshold test (LIDT)
- Enhancing SERS through nanostructured materials
- Generating and depositing nanoparticles with a push of a button
- VSP P1 Nanostructured Material Printer – the ultimate tool for material development
- A paradigm shift in electrocatalyst synthesis
- Accelerating material discovery through rapid material prototyping
- Scalable high-throughput electrocatalyst screening webinar
Service and Services
Test and Measurement
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- Rigol’s New Real-time Spectrum Analyser
- Advanced Microwave Topics for Quantum Physicists - Tabor Webinar
- Pico Technology receives a Queen’s Award for Enterprise!
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- What is an FFT Spectrum Analyser?
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- Why buying Stanford Research Systems from Lambda makes sense
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
Photonics, Fibre Optics and Lasers
- Solid state lasers to cover the visible spectrum
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- CI Systems Newsletter November 2020
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- https://www.lambdaphoto.co.uk/news/2018/01/23/ultra-high-resolution-osa-a-perfect-tool-for-optical-orthogonal-frequency-division-multiplexing-ofdm-measurement-and-adjustment-2/
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Photonics Applications 1
- Photonics Applications 2
- Photonics Applications 3
- Testing MTP®/MPO Fibre Assemblies: Setups, Troubleshooting & What to Expect
- How Can You Accurately Test Performance of Hybrid Cables?
- Measure Latency in Optical Networks with Picosecond Accuracy
- What is the Value of Shortwave Infrared?