› EUR (Europe) - Home
- Knowledge Base
Knowledge Base
Search the Lambda Knowledge Base
Sorry, no results found in our knowledge base.
We have found 0 knowledge base item(s) that match your query.
Search Results
Knowledge Base
This is the knowledge base
Applications
Fibre Optics
- Distributed fibre-optic temperature and strain measurement with extremely high spatial resolution
- Picosecond Pulses for Test & Measurement
- Testing with 40 GHz Laser Sources
- Testing with Femtosecond Pulses
- Designing for Femtosecond Pulses
- The CARMEL Fibre Laser and its Applications
- The CAZADERO Chirped Pulse Amplifier Laser Explained
- Micromachining with the CAZADERO CPA Fibre Laser
- Application Note for LN Modulators
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- How to make the Big Sky Ultra more flexible?
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Measure Latency in Optical Networks with Picosecond Accuracy
- How to Save Time When Testing Multiple Cable Types
Machine Vision
- StreamPix
- Overcoming limits – World's fastest standard VGA sensor meets the latest board level camera design
- TroublePix Video
- High Speed Imaging for Sports Analysis
- Lighting for Microscopy
- GigE Camera Trouble Shooting Guide
- MU9 USB Transfer Technical Note
- Sensor Signals Timing
- IP Rated Equipment: Codes & Clarification
- New Firmware for Baumer MXG and VisiLine® Cameras
- High Speed Imaging – All in one solution! (Part 1)
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- Enhanced Starter Kit Delivery Scope
- Biomechanics high speed motion video capture in uncompressed format
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- European Master Distributor for Spectrum Illumination
- Machine Vision Components & System Integration
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Compliant list for Baumer industrial cameras - USB 3.0
- What is USB 3.1?
- How to use GPIO cameras with a PLC
- New 48 Megapixel xiB cameras from Ximea
- The fastest streaming cameras are now shipping
- LED Lighting Techniques
Optical Test & Contact Lens
- Ultra-flat Precision Optics Characterisation
- Ophthalmic Metrology
- Vibration-Tolerant Interferometry
- Precision Alignment of IR Lenses using visible and IR laser sources within a Laser Alignment and Assembly Station™
- Verifire™ Series Interferometer Systems
- Optical Profiler Basics and some history
- EssentOptics present Photon RT spectrophotometer with new measurement features
- EssentOptics is proud to announce successful completion of two important projects
- New features and capabilities to the PHOTON RT spectrophotometer
- New world-record wavelength range configurations for Photon RT
- Optical Waveguide Characterization with the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Dual Film Measurements with the Metricon Prism Coupler
Semiconductor & Electronics
- Capacitive MEMs Switch Characterisation App Note
- MEMS Application Note
- Measuring Dynamic MEMS Devices
- 3D information or surface topography
- Semiconductor wafer surface measurement
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- About Lock-In Amplifiers
- EMC Pre-Compliance Testing
- What is an FFT Spectrum Analyser?
- SXRTO Oscilloscopes Explained
General
General information about Lambda
Technical Notes
- Pulsed UV Light decontaminates Shell Eggs of Salmonella
- Paper Manufacturing R&D/QA App Note
- MEMs Biosensor Characterisation App Note
- Micromirror Array Characterisation App Note
- What is GigE Vision
- Packaging and Process Troubleshooting
- Ultrasound Generation
- Trace Analysis by Jet-REMPI
- Pulsed Laser Deposition
- Particle Image Velocimetry
- MALDI: Matrix Assisted Laser Desorption Ionisation
- LIDAR: Light Detection and Ranging
- Laser Induced Incandescence
- LIF: Laser Induced Fluorescence
- LIBS: Laser Induced Breakdown Spectroscopy
- Laser Flash Photolysis
- Coherent Antistoke Raman Scattering
- Cavity Ring Down Spectroscopy
- Alignment
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- Flourescence Microscopy
- Hyperspectral Imaging using a Tunable OPO Laser Source
- Thomson Scattering
- Dynamic MEMS Workshop Results
- Zip Scan and Zip Stitch
- Automation Meets Interferometry
- MetroPro PSD Analysis
- Identifying and Controlling Vibration
- Understanding Surface Texture Parameters
- How do Interferometers work?
- Peak to Valley (PV)
- SRS Tech Note: RF Signal Generators
- SRS Tech Note: SG384 RF Signal Generator
- Sensor Shutter Modes
- Basics of Raman Spectroscopy
- Customer Testimonial: Synapse BV
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Thermal Management for Thermopile Laser Power Sensors
- Reducing Photobleaching Effect in STED Microscopy with Subnanosecond Laser
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Magnification: is it the key to analyse your samples?
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- How engineers and researchers can boost polymers properties with SEM
- How SEM helps discover suitable corrosion inhibitors
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Basics of Acousto-Optic Devices
- How scanning electron microscopy is used for cosmetics research and development
- Preparation and property assessment of neat lignocellulose nanofibrils (LCNF) and their composite films
- An introduction to Electron Microscopy
- SEM working principle: the detection of backscattered electrons
- What is SEM? Scanning electron microscope technology explained
- Battery research with a SEM: inspecting one layer at a time
- Guidelines for small script development: image acquisition
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- SEM automation guidelines for small script development: image analysis
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- The Phenom Process Automation: mixing backscattered and secondary electron images using a Python script
- Automated scanning electron microscopy (SEM) imaging: how it's used
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Buying a scanning electron microscope: how to select the right SEM
- SEM automation guidelines for small script development: evaluation
- What is an FFT Spectrum Analyser?
- SEM automation guidelines for small script development: simulation and reporting
- Everything is nano these days:
- Measure Latency in Optical Networks with Picosecond Accuracy
- How to spot astigmatism in Scanning Electron Microscopy (SEM) images
- How next-generation composite materials are manufactured and analysed
- SEM: types of electrons, their detection and the information they provide
- View All
- SXRTO Oscilloscopes Explained
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- What is additive manufacturing technology? How does the process work?
- How to Save Time When Testing Multiple Cable Types
- How a microfabrication researcher uses SEM as a technique to verify nanoscale structures
- FEG vs. Tungsten source in a scanning electron microscope (SEM): what’s the difference?
- SEM: types of electrons, their detection and the information they provide
- How next-generation composite materials are manufactured and analysed
- How to spot astigmatism in Scanning Electron Microscopy (SEM) images
- Measure Latency in Optical Networks with Picosecond Accuracy
- SEM automation – the future of scanning electron microscopy
- Everything is nano these days:
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- SEM automation guidelines for small script development: simulation and reporting
- What is an FFT Spectrum Analyser?
- Company History
- Sensor Signals Timing
- General Support
- Peak to Valley (PV)
- Sensor Shutter Modes
- IP Rated Equipment: Codes & Clarification
- Semiconductor wafer surface measurement
- MU9 USB Transfer Technical Note
- GigE Camera Trouble Shooting Guide
- Testing with 40 GHz Laser Sources
- Designing for Femtosecond Pulses
- The CARMEL Fibre Laser and its Applications
- SRS Tech Note: SG384 RF Signal Generator
- The CAZADERO Chirped Pulse Amplifier Laser Explained
- Testing with Femtosecond Pulses
- Picosecond Pulses for Test & Measurement
- Micromachining with the CAZADERO CPA Fibre Laser
- Fast Kinetic Measurements in Optogenetic Research
- SEM and TEM: what's the difference?
- Optical Profiler Basics and some history
