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Knowledge Base
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- LAS™ Lens Alignment Technology - The Basics
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Optical Profilers in an Argon Chamber Environment
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The Turbulent History of Interferometric Methods of Precision Positioning
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Transmission Kikuchi Diffraction Analyses
- Roughness Measurements — Let’s Take a Closer Look
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Vibration Control Solutions for Microscopy
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Preparing APT Specimens in a Controlled Air Free Environment
- Technical capabilities required to ensure successful vacuum window fabrication
- Ex situ lift-out specimen thinning
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Designing the Electron Microscope of the Future
- Quantum Computers: The Importance of Vibration Isolation
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Gimbal Piston Isolator Performance
- Direct CPA-Free Pulse Amplification
- Optical Assemblies
- Straight Edges
- Custom Beamsplitters
- Optical Mirrors
- Machined Structures
- Spherical Elements
- Light-Weighted Optics
- Aspheres & Freeforms
- Optical Windows
- Optical Coatings
- Unlocking the Secrets of Cancer Cells
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- EMC…What is it?
- Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- WEBINAR: The origins of structure-insensitivity in heterogeneous catalysis
- UV to MWIR Optical Coating Broadband Measurement
- Computer Generated Hologram (CGH)
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- Navitar Solutions for NIR and SWIR Imaging Applications
- How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Advanced Microwave Topics for Quantum Physicists
- A New Paradigm for the Classical to Quantum Computing Interface
- Enhancing SERS Through Nanostructured Materials
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- A History of ZYGO Optical Profilers
- Energy Storage Application Note – Water Splitting
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- EMC Pre-Compliance Testing
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Why buying Stanford Research Systems from Lambda makes sense
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- How to use GPIO cameras with a PLC
- What is USB 3.1?
- Customer Testimonial: Researching the chemical nature of production faults
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Compliant list for Baumer industrial cameras - USB 3.0
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Chromatic dispersion measurement with Optical Complex Spectrum Analyser
- Differential Quadrature Phase Shift Keying (DQPSK) modulation characteristics using Optical Complex Spectrum Analyser
- Effects of chirp induction mechanism on spectral broadening in LiNbO3 modulators using Optical Complex Spectrum Analyser
- Optical intensity and chirp measurement of a Mach-Zehnder Electro-optic travelling wave modulators with Optical Complex Spectrum Analyser
- Optical Complex Spectrum Analyser AP2441B/AP2443B : High efficient tool for any kind of usual modulation format measurements
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- 80Gb/s Multi-Level BPSK experiment with an InPMonolithic Source Based on Prefixed Optical Phase Switching
- Optical Complex Spectrum Analyser principle
- Ultra High Resolution Optical Spectrum Analyser used for the generation of coherent Dual-Polarisation Multi-Band OFDM signals
- 64-QAM-encoded Optical OFDM signal spectrum measurement using High Resolution Optical Spectrum Analysers
- Ultra High Resolution Optical Spectrum Analyser used for Generation of Coherent Multi-Carrier Signals by Gain Switching of Discrete Mode Lasers
- Gain Measurements of Fabry-Pérot InP/InGaAsP Lasers using an Ultra High Resolution Optical Spectrum Analyser
- High Resolution Optical Spectrum Analyser used for Experimental demonstration of 23.6-Gb/s OFDM with a colourless transmitter
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Frequency Response Analysis Tool using a PicoScope USB Oscilloscope
- Metricon Model 2010/M Prism Coupler References
- Metricon Prism Coupler – A Comparison to Ellipsometry
- The Metricon Prism Coupler - An Applications Overview
- Dual Film Measurements with the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Optical Waveguide Characterization with the Metricon Prism Coupler
- High resolution imaging using LASOS LDM-XT laser diode modules
- Bench test solutions for education teaching labs
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Machine Vision Components & System Integration
- European Master Distributor for Spectrum Illumination
- About Lock-in Amplifiers
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- LASOS dedicated to HeNe Laser production for the modern age
- New possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer
- Optical Profiler Basics and some history
- Verifire™ Series Interferometer Systems
- Colour capabilities of the Zygo Nexview for corrosion investigation
- About Lock-In Amplifiers
- Application Note for LN Modulators
- High Speed Imaging – All in one solution! (Part 1)
- New Firmware for Baumer MXG and VisiLine® Cameras
- IP Rated Equipment: Codes & Clarification
- GigE Camera Trouble Shooting Guide
- SRS Tech Note: SG384 RF Signal Generator
- SRS Tech Note: RF Signal Generators
- LATAB Strobe Controllers Q&A
- LATAB Continuous Mode Controllers Q&A
- Baumer TXD Series Q&A
- Warranty
- Service
- General Support
News
- WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
- Optical Profilers in an Argon Chamber Environment
- WEBINAR: Preparing APT specimens in a controlled environment
- EMC and Compliance International
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Time to upgrade your laboratory equipment?
- Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Semplor - the new name for SEM's
- TMC CleanTop® Advantages
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- WEBINAR: Why circuit decoupling is essential for achieving success in EMI/EMC
- Building on success… Zygo’s new Qualifire™ laser interferometer
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- Rigol: Swept-Tuned Spectrum Analyser or Real Time Spectrum Analyser
- Look no further than the Pico-Technology AS108...
- Simulate, Stimulate and Test
- For all your RF Signal Generator needs….
- The best just got better with STACIS 4
- Sources of Vibration
- CHEMUK 2024
- LUXOR Au - Gold Sputter Coater for SEM Sample Preparation
- The NEW LSX-Series of Signal Generators from Tabor Electronics
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Society of Electron Microscope Technology
- Sputter Coater Summer Deal from Lambda Photometrics
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- The Fischione 1070 Plasma Cleaner is the must have tool for all serious TEM/SEM Labs
- South-West Electron Microscopy
- Q. When is a tabletop SEM not just a tabletop SEM
- EMAG2022
- The Forge: Particle Characterization in Formulation
- Engineering Design Show Reconnect
- UK Semiconductors Conference
- European Microwave Week 2021
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- PHOTON2022
- Extraordinary Low Voltage (500 volts) Performance
- WEBINAR: Characterising, Troubleshooting & Mitigating Wireless and IoT Self-Generated EMI
- RMS 2022 Digital Calendar Available to Download
- EMC & Compliance International
- ARMMS RF and Microwave Society Conference
- Virtual EM-UK 2022
- WEBINAR: International Optics Surface Standards with Dave Aikens
- Luxor Sputter Coater FREE trial in your lab - try before you buy!
- UV to MWIR Optical Coating Broadband Measurement
- WEBINAR: 2nd Online Material Pioneers Summit
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- WEBINAR: Precision Fizeau Interferometers vs. Challenging Environments. See Who Wins...
- Computer Generated Hologram (CGH)
- Lambda Photometrics & LUXOR-Tech – Delivering Innovation, Quality, Performance & Economy
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- WEBINAR: Producing high-step coverage interconnects using printed nanoparticles
- New Longer-Range OBR for Data Centres
- Case Study: Electric Vehicle Manufacturing and Precision Metrology
- Navitar Solutions for NIR and SWIR Imaging Applications
- WEBINAR: Plasma cleaning - A critical step in SEM and TEM sample preparation
- Optics Metrology Update August 2021
- WEBINAR: Secrets of Near and Far Field Scanning
- Unlocking structure and chemistry at the atomic level
- PAY LESS 4 MORE - 4 reason’s to buy the EmCrafts System from Lambda
- Vibration Isolation for Cell Culture Incubators
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- WEBINAR: Polarisation Extinction Ratio Measurement in Highly Birefringent Materials: Challenges and Solutions
- Re-defining Analog Signal Generation
- WEBINAR: Precise final thinning of FIB-prepared specimens
- Microscience Microscopy Congress 2021
- WEBINAR: Vibration Control for Semiconductor Facilities and Equipment
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- WEBINAR: The VSP-P1 Nanostructured Material Printer – the ultimate tool for material development – product demo webinar
- WEBINAR: Everything EMC
- WEBINAR: Key Attributes of Modern Fibre Optic Cleaning and Inspection Solutions
- WEBINAR: P67.00001 : Experiment design considerations for real-time, closed-loop pulse streaming
- WEBINAR: Ion milling semiconductor solder bumps for SEM analyses
- NANOPARTICLE WEBINAR: Learn with VSParticle
- SEMINAR: 2020 Christmas Lecture for the Midlands Centre for Data-Driven Metrology
- WEBINAR: Learn with VSParticle
- WEBINAR: Learn with LUNA
- Large Area Ion Milling with the Fischione M1062 TrionMill
- CI Systems Newsletter November 2020
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- LAMBDA AWARDED ISO 9001:2015
- SMARTTECH3D Metrology - 3D Scanners
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- UK Semiconductors Conference 2021
- Energy Storage Application Note – Water Splitting
- Engineering Design Show 2021
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- New MICRON3D green stereo industrial scanner
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Full area topography and thickness of sub-micron films
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- New Baumer LX Cameras now with integrated JPEG compression
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Laptop and portable based high speed capture DVR from Norpix
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Why buying Stanford Research Systems from Lambda makes sense
- Scratches and Digs – ISO (Edge Chips and Coating Defects too)
- NUWPEC Approved Framework Supplier
- Scratches and Digs – measure on curves and large areas now!
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Understanding Surface Texture Parameters
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Current Vacancies
- New partnership with Xiton Photonics GmbH
- New EX series – Baumer quality at low prices
- The Metricon Prism Coupler - An Applications Overview
- GLDM-520 OEM Green Laser Diode Modules
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer
- LASOS dedicated to HeNe Laser production for the modern age
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- High Speed Imaging – All in one solution! (Part 1)
- As of December 1st 2014 Zygo will no longer offer PC upgrades for older products with obsolete electronics
- New LX camera series with 8/12/20 megapixel and dual GigE
- MX Board Level Cameras with even more flexibility
- Spectrophotometer designed specifically to measure optical coatings with a range of 190-4900 nm.
- Baumer GAPI v2.3 is available now
- NEW in Microscopy - KL 1500 HAL Light Source
- New Low-cost Fusion Splicer from Lambda Photometrics
- Pico Technology receives a Queen’s Award for Enterprise!
- StreamPix 6 now supports new Ladybug 5 3D spherical camera
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Baumer MX camera release
- StreamPix 6 released!
- Baumer MX S-Mount Kits
- The smallest 1.3-megapixel USB3 Camera with NIR from XIMEA
- AirMicro – iPad/iPhone/iPod touch microscope system
- TroublePix
- AirMicro for iPhone & iPad
- New Baumer MX S-Mount Kits
- Lambda awarded ISO 9001:2000
Press Releases
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- New MICRON3D green stereo industrial scanner
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- New Baumer LX Cameras now with integrated JPEG compression
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- PicoScope 5000D Series: “The complete all-rounder”
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- New partnership with Xiton Photonics GmbH
- GLDM-520 OEM Green Laser Diode Modules
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Baumer MX camera release
- StreamPix 6 released!
- New Revision for StreamPix, TroublePix and HERMES software from Norpix
- Optimelt Automated Melting Point Apparatus
- Large-scale coaxial LED illumination with small installation dimensions
- AirMicro for iPhone & iPad
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- MPA100 OptiMelt Melting Point Apparatus
- Print Copper on Polymers and Paper with the Sinteron 2010
- Real-time, H.264 HD Video Acquisition & Streaming - 1080p, 1080i, 720p & more!
- ExpressCard/34 HD-SDI Laptop Grabber - NOW HAS AUDIO!
- Striking a new path with cost-effective vision solutions using PoE
- StreamPix 5 Offers All-In One Particle Image Velocimetry Functionality
- Overcoming limits – world's fastest standard VGA sensor meets the latest board level camera design
- Highest performance for superior demand: LED Light Source
- Laptop Solution: TroublePix/StreamPix 750
- Introducing Lambda Photometrics as the new Imperx Distributor for Camera Sales in UK & Ireland
- New 2/3" Megapixel lenses especially designed for 10MP sensors
- Dual GigE Technology Doubles Standard GigE Bandwidth to 240 MB/s
- StreamPix 5/TroublePix High Speed Laptop Solution
- A new affordable Rubidium Audio Master Clock, the Perfection-10
- Greenlee XL fiberTOOLS
- Scratch/Dig measurement system from Savvy Optics
- VeriSens – a new generation of intuitive configuration
- dynaFiZ Dynamic Metrology With Confidence
- The new PHOENIX1400 Benchtop Tunable laser from LUNA Technologies
- GC780/GC780C New Low Cost Gigabit Ethernet Camera 64 fps from Prosilica
- Scorpion Vision Software Seminar and Workshop
- New DG645 8 channel digital delay/pulse generator
- PRS10 Rubidium frequency standard OEM Module
- Stanford Research Launch New Range of Products
- Stanford Research launch the SR1 Audio Analyser
- Low Cost Fibre Cable Test Instrumentation
- Smart Fibre Optic Cable Test Sets
- StreamPix Digital Video Recording Software
- Introducing VisiLine® and VisiLine® IP Kits
- Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor
- New Infrared material measurement service from Lambda Photometrics
- A new compact high resolution Raman spectrometer – the Glacier T
- The QUEST mini spectrometer just got better
- IMPERX 29MP Camera Shipping NOW
- New Test and Laboratory Controller for LED Lighting
- Non-contact multilayer film thickness measurement made easy
- New liquid cell option for refractive index measuring prism coupler
- “Cool” - The New Glacier™ X Miniature TE Cooled Spectrometer
- A new 4GHz RF Signal Generator, the SG384
- From lab to recording studio – a cost effective Rubidium master clock
- B&W Tek compact spectrometers receive a makeover
- New Machine Vision Range from Tattile
- New from SCHOTT - KL 200 LED and EasyLED Ringlight Plus
- New FS730 & FS735 Distribution Amplifiers from SRS
- New Zygo Transmission Spheres
- Quantel launch Pizzicato picosecond Nd:YAG laser
- Opolette HR and HE Optical Parametric Oscillators
- Lambda Photometrics builds on 30 years success
- The PR 4400 Precision Reflectometer from Luna Technologies
- Replacement lasers for Durst Lambda digital photographic printer
- Prostream Digital Video Recording Software for Multiple Networked Cameras
- ZYGO Introduces Next Generation 3D Optical Profiler
- New IR OPO’s for MALDI-TOF applications
- Lasos Fibre Coupling Capabilities & 50mW Yellow DPSS Laser
- Stanford Research QMS Series Atmospheric Sampling Systems
- SRS Nitrogen Lasers available with fast delivery
- Large Aperture Beam Expanders
- New Stage Metrology Products from Zygo Corporation
- New Pro Ultra LED Controller from Schott
- DC-350 MHz 4 CHANNEL PREAMPLIFIERS
- Two Widely Separate Applications Of High Speed 3D Machine Vision In The Automotive Industry
- Sophisticated iQLED Controllers From Schott
- Fast Firewire Machine Vision Cameras From Prosilica
- High Speed 3D - the fastest 3D measurement available!
- Miniature, Economical Firewire Machine Vision Cameras from Prosilica
- Simultaneous 3D and grey scale profiles at high speed
- SCHOTT Reveals the New DCR III Plus Light Source With Built-in RS232 Interface
- New Injection-Seeded Quantel Brilliant B SLM Nd:YAG Laser
- Prosilica Ships Gigabit Ethernet Cameras
- A New Catalogue of Fibre Optic Components & Instrumentation
- IMPERX In-Camera Image Processing
- Carl Zeiss – Exciting New Otus Lens
- Baumer MX S-Mount Kits
- APEX Technologies enters new distributor agreement with Lambda Photometrics
- Latest Image Processing Technology Shows Dramatic Improvement For Melting Point Determination
- SCHOTT Releases the New DCR IV With integrated equalizer
- Solid state lasers to cover the visible spectrum
- New Portable Digital Microscope
- New "Flashport" unit for cold light sources from Schott
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- SCHOTT Presents The Universal Light Source
- Laser Pulse Picker Systems from Conoptics
Uncategorized
- Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
- Make your January Golden with brand a new Luxor Gold Coater & get the best performance from your SEM
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- An introduction to Electron Microscopy
- How SEM helps research polymers characteristics, properties and uses
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and TEM: what's the difference?
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Desktop SEM imaging in the development of a radioablation device
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Customer Testimonial: Material Research at DSM
- Customer Testimonial: Aiming at Phenomenal Cleanliness
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Synapse BV
- Correlative Light and Electron Microscopy
- Phenom-World announces the Phenom XL, world’s fastest desktop SEM to handle large samples
- Phenom ProX - the perfect all-in-one desktop SEM
- Particlemetric Software for the Phenom Desk Top SEM
- Second User Phenom G1 Desktop SEM
- 404 Not Found
- Elemental Mapping for the Phenom™ proX SEM
- Phenom Desktop Scanning Electron Microscope
- Fibermetric System automated measurement system for nano and micro fibers.
- Meet The Team
- Phenom proX Desktop Scanning Electron Microscope
- Introducing the Phenom proX all-in-one imaging and analysis system
- New Motorized Tilt & Rotation Sample Holder for Phenom Desktop SEM
- Phenom desktop SEM now available from Lambda Photometrics Ltd
- Fibermetric System automated measurement system for nano and micro fibers
- Paper Manufacturing R&D/QA App Note
- Field Sales/Application Engineer - Spectroscopy Job Vacancy
- Field Service Engineer Job Vacancy
- Introducing Phenom Pro Suite Applications
- Enhanced performance for the Phenom desktop SEM
- Phenom desktop SEM now available with Remote Assistant
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- The fastest Point and Shoot Desktop Scanning Electron Microscope (SEM) for Forensic applications
- Integrated Elemental Mapping & Line Scan
- Measuring skin surface
- Phenom-World Unveils The Third Generation Phenom Desktop SEM
- Second User Phenom G1 Desktop SEM
Knowledge Base
Events
Knowledge Base
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- LAS™ Lens Alignment Technology - The Basics
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Optical Profilers in an Argon Chamber Environment
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The Turbulent History of Interferometric Methods of Precision Positioning
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Transmission Kikuchi Diffraction Analyses
- Roughness Measurements — Let’s Take a Closer Look
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Vibration Control Solutions for Microscopy
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Preparing APT Specimens in a Controlled Air Free Environment
- Technical capabilities required to ensure successful vacuum window fabrication
- Ex situ lift-out specimen thinning
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Designing the Electron Microscope of the Future
- Quantum Computers: The Importance of Vibration Isolation
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Gimbal Piston Isolator Performance
- Direct CPA-Free Pulse Amplification
- Optical Assemblies
- Straight Edges
- Custom Beamsplitters
- Optical Mirrors
- Machined Structures
- Spherical Elements
- Light-Weighted Optics
- Aspheres & Freeforms
- Optical Windows
- Optical Coatings
- Unlocking the Secrets of Cancer Cells
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- EMC…What is it?
- Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- WEBINAR: The origins of structure-insensitivity in heterogeneous catalysis
- UV to MWIR Optical Coating Broadband Measurement
- Computer Generated Hologram (CGH)
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- Navitar Solutions for NIR and SWIR Imaging Applications
- How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Advanced Microwave Topics for Quantum Physicists
- A New Paradigm for the Classical to Quantum Computing Interface
- Enhancing SERS Through Nanostructured Materials
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- A History of ZYGO Optical Profilers
- Energy Storage Application Note – Water Splitting
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- EMC Pre-Compliance Testing
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Why buying Stanford Research Systems from Lambda makes sense
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- How to use GPIO cameras with a PLC
- What is USB 3.1?
- Customer Testimonial: Researching the chemical nature of production faults
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Compliant list for Baumer industrial cameras - USB 3.0
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Chromatic dispersion measurement with Optical Complex Spectrum Analyser
- Differential Quadrature Phase Shift Keying (DQPSK) modulation characteristics using Optical Complex Spectrum Analyser
- Effects of chirp induction mechanism on spectral broadening in LiNbO3 modulators using Optical Complex Spectrum Analyser
- Optical intensity and chirp measurement of a Mach-Zehnder Electro-optic travelling wave modulators with Optical Complex Spectrum Analyser
- Optical Complex Spectrum Analyser AP2441B/AP2443B : High efficient tool for any kind of usual modulation format measurements
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- 80Gb/s Multi-Level BPSK experiment with an InPMonolithic Source Based on Prefixed Optical Phase Switching
- Optical Complex Spectrum Analyser principle
- Ultra High Resolution Optical Spectrum Analyser used for the generation of coherent Dual-Polarisation Multi-Band OFDM signals
- 64-QAM-encoded Optical OFDM signal spectrum measurement using High Resolution Optical Spectrum Analysers
- Ultra High Resolution Optical Spectrum Analyser used for Generation of Coherent Multi-Carrier Signals by Gain Switching of Discrete Mode Lasers
- Gain Measurements of Fabry-Pérot InP/InGaAsP Lasers using an Ultra High Resolution Optical Spectrum Analyser
- High Resolution Optical Spectrum Analyser used for Experimental demonstration of 23.6-Gb/s OFDM with a colourless transmitter
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Frequency Response Analysis Tool using a PicoScope USB Oscilloscope
- Metricon Model 2010/M Prism Coupler References
- Metricon Prism Coupler – A Comparison to Ellipsometry
- The Metricon Prism Coupler - An Applications Overview
- Dual Film Measurements with the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Optical Waveguide Characterization with the Metricon Prism Coupler
- High resolution imaging using LASOS LDM-XT laser diode modules
- Bench test solutions for education teaching labs
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Machine Vision Components & System Integration
- European Master Distributor for Spectrum Illumination
- About Lock-in Amplifiers
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- LASOS dedicated to HeNe Laser production for the modern age
- New possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer
- Optical Profiler Basics and some history
- Verifire™ Series Interferometer Systems
- Colour capabilities of the Zygo Nexview for corrosion investigation
- About Lock-In Amplifiers
- Application Note for LN Modulators
- High Speed Imaging – All in one solution! (Part 1)
- New Firmware for Baumer MXG and VisiLine® Cameras
- IP Rated Equipment: Codes & Clarification
- GigE Camera Trouble Shooting Guide
- SRS Tech Note: SG384 RF Signal Generator
- SRS Tech Note: RF Signal Generators
- LATAB Strobe Controllers Q&A
- LATAB Continuous Mode Controllers Q&A
- Baumer TXD Series Q&A
- Warranty
- Service
- General Support
News
- WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
- Optical Profilers in an Argon Chamber Environment
- WEBINAR: Preparing APT specimens in a controlled environment
- EMC and Compliance International
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Time to upgrade your laboratory equipment?
- Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Semplor - the new name for SEM's
- TMC CleanTop® Advantages
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- WEBINAR: Why circuit decoupling is essential for achieving success in EMI/EMC
- Building on success… Zygo’s new Qualifire™ laser interferometer
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- Rigol: Swept-Tuned Spectrum Analyser or Real Time Spectrum Analyser
- Look no further than the Pico-Technology AS108...
- Simulate, Stimulate and Test
- For all your RF Signal Generator needs….
- The best just got better with STACIS 4
- Sources of Vibration
- CHEMUK 2024
- LUXOR Au - Gold Sputter Coater for SEM Sample Preparation
- The NEW LSX-Series of Signal Generators from Tabor Electronics
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Society of Electron Microscope Technology
- Sputter Coater Summer Deal from Lambda Photometrics
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- The Fischione 1070 Plasma Cleaner is the must have tool for all serious TEM/SEM Labs
- South-West Electron Microscopy
- Q. When is a tabletop SEM not just a tabletop SEM
- EMAG2022
- The Forge: Particle Characterization in Formulation
- Engineering Design Show Reconnect
- UK Semiconductors Conference
- European Microwave Week 2021
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- PHOTON2022
- Extraordinary Low Voltage (500 volts) Performance
- WEBINAR: Characterising, Troubleshooting & Mitigating Wireless and IoT Self-Generated EMI
- RMS 2022 Digital Calendar Available to Download
- EMC & Compliance International
- ARMMS RF and Microwave Society Conference
- Virtual EM-UK 2022
- WEBINAR: International Optics Surface Standards with Dave Aikens
- Luxor Sputter Coater FREE trial in your lab - try before you buy!
- UV to MWIR Optical Coating Broadband Measurement
- WEBINAR: 2nd Online Material Pioneers Summit
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- WEBINAR: Precision Fizeau Interferometers vs. Challenging Environments. See Who Wins...
- Computer Generated Hologram (CGH)
- Lambda Photometrics & LUXOR-Tech – Delivering Innovation, Quality, Performance & Economy
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- WEBINAR: Producing high-step coverage interconnects using printed nanoparticles
- New Longer-Range OBR for Data Centres
- Case Study: Electric Vehicle Manufacturing and Precision Metrology
- Navitar Solutions for NIR and SWIR Imaging Applications
- WEBINAR: Plasma cleaning - A critical step in SEM and TEM sample preparation
- Optics Metrology Update August 2021
- WEBINAR: Secrets of Near and Far Field Scanning
- Unlocking structure and chemistry at the atomic level
- PAY LESS 4 MORE - 4 reason’s to buy the EmCrafts System from Lambda
- Vibration Isolation for Cell Culture Incubators
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- WEBINAR: Polarisation Extinction Ratio Measurement in Highly Birefringent Materials: Challenges and Solutions
- Re-defining Analog Signal Generation
- WEBINAR: Precise final thinning of FIB-prepared specimens
- Microscience Microscopy Congress 2021
- WEBINAR: Vibration Control for Semiconductor Facilities and Equipment
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- WEBINAR: The VSP-P1 Nanostructured Material Printer – the ultimate tool for material development – product demo webinar
- WEBINAR: Everything EMC
- WEBINAR: Key Attributes of Modern Fibre Optic Cleaning and Inspection Solutions
- WEBINAR: P67.00001 : Experiment design considerations for real-time, closed-loop pulse streaming
- WEBINAR: Ion milling semiconductor solder bumps for SEM analyses
- NANOPARTICLE WEBINAR: Learn with VSParticle
- SEMINAR: 2020 Christmas Lecture for the Midlands Centre for Data-Driven Metrology
- WEBINAR: Learn with VSParticle
- WEBINAR: Learn with LUNA
- Large Area Ion Milling with the Fischione M1062 TrionMill
- CI Systems Newsletter November 2020
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- LAMBDA AWARDED ISO 9001:2015
- SMARTTECH3D Metrology - 3D Scanners
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- UK Semiconductors Conference 2021
- Energy Storage Application Note – Water Splitting
- Engineering Design Show 2021
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- New MICRON3D green stereo industrial scanner
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Full area topography and thickness of sub-micron films
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- New Baumer LX Cameras now with integrated JPEG compression
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Laptop and portable based high speed capture DVR from Norpix
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Why buying Stanford Research Systems from Lambda makes sense
- Scratches and Digs – ISO (Edge Chips and Coating Defects too)
- NUWPEC Approved Framework Supplier
- Scratches and Digs – measure on curves and large areas now!
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Understanding Surface Texture Parameters
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Current Vacancies
- New partnership with Xiton Photonics GmbH
- New EX series – Baumer quality at low prices
- The Metricon Prism Coupler - An Applications Overview
- GLDM-520 OEM Green Laser Diode Modules
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer
- LASOS dedicated to HeNe Laser production for the modern age
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- High Speed Imaging – All in one solution! (Part 1)
- As of December 1st 2014 Zygo will no longer offer PC upgrades for older products with obsolete electronics
- New LX camera series with 8/12/20 megapixel and dual GigE
- MX Board Level Cameras with even more flexibility
- Spectrophotometer designed specifically to measure optical coatings with a range of 190-4900 nm.
- Baumer GAPI v2.3 is available now
- NEW in Microscopy - KL 1500 HAL Light Source
- New Low-cost Fusion Splicer from Lambda Photometrics
- Pico Technology receives a Queen’s Award for Enterprise!
- StreamPix 6 now supports new Ladybug 5 3D spherical camera
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Baumer MX camera release
- StreamPix 6 released!
- Baumer MX S-Mount Kits
- The smallest 1.3-megapixel USB3 Camera with NIR from XIMEA
- AirMicro – iPad/iPhone/iPod touch microscope system
- TroublePix
- AirMicro for iPhone & iPad
- New Baumer MX S-Mount Kits
- Lambda awarded ISO 9001:2000
Press Releases
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- New MICRON3D green stereo industrial scanner
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- New Baumer LX Cameras now with integrated JPEG compression
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- PicoScope 5000D Series: “The complete all-rounder”
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- New partnership with Xiton Photonics GmbH
- GLDM-520 OEM Green Laser Diode Modules
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Baumer MX camera release
- StreamPix 6 released!
- New Revision for StreamPix, TroublePix and HERMES software from Norpix
- Optimelt Automated Melting Point Apparatus
- Large-scale coaxial LED illumination with small installation dimensions
- AirMicro for iPhone & iPad
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- MPA100 OptiMelt Melting Point Apparatus
- Print Copper on Polymers and Paper with the Sinteron 2010
- Real-time, H.264 HD Video Acquisition & Streaming - 1080p, 1080i, 720p & more!
- ExpressCard/34 HD-SDI Laptop Grabber - NOW HAS AUDIO!
- Striking a new path with cost-effective vision solutions using PoE
- StreamPix 5 Offers All-In One Particle Image Velocimetry Functionality
- Overcoming limits – world's fastest standard VGA sensor meets the latest board level camera design
- Highest performance for superior demand: LED Light Source
- Laptop Solution: TroublePix/StreamPix 750
- Introducing Lambda Photometrics as the new Imperx Distributor for Camera Sales in UK & Ireland
- New 2/3" Megapixel lenses especially designed for 10MP sensors
- Dual GigE Technology Doubles Standard GigE Bandwidth to 240 MB/s
- StreamPix 5/TroublePix High Speed Laptop Solution
- A new affordable Rubidium Audio Master Clock, the Perfection-10
- Greenlee XL fiberTOOLS
- Scratch/Dig measurement system from Savvy Optics
- VeriSens – a new generation of intuitive configuration
- dynaFiZ Dynamic Metrology With Confidence
- The new PHOENIX1400 Benchtop Tunable laser from LUNA Technologies
- GC780/GC780C New Low Cost Gigabit Ethernet Camera 64 fps from Prosilica
- Scorpion Vision Software Seminar and Workshop
- New DG645 8 channel digital delay/pulse generator
- PRS10 Rubidium frequency standard OEM Module
- Stanford Research Launch New Range of Products
- Stanford Research launch the SR1 Audio Analyser
- Low Cost Fibre Cable Test Instrumentation
- Smart Fibre Optic Cable Test Sets
- StreamPix Digital Video Recording Software
- Introducing VisiLine® and VisiLine® IP Kits
- Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor
- New Infrared material measurement service from Lambda Photometrics
- A new compact high resolution Raman spectrometer – the Glacier T
- The QUEST mini spectrometer just got better
- IMPERX 29MP Camera Shipping NOW
- New Test and Laboratory Controller for LED Lighting
- Non-contact multilayer film thickness measurement made easy
- New liquid cell option for refractive index measuring prism coupler
- “Cool” - The New Glacier™ X Miniature TE Cooled Spectrometer
- A new 4GHz RF Signal Generator, the SG384
- From lab to recording studio – a cost effective Rubidium master clock
- B&W Tek compact spectrometers receive a makeover
- New Machine Vision Range from Tattile
- New from SCHOTT - KL 200 LED and EasyLED Ringlight Plus
- New FS730 & FS735 Distribution Amplifiers from SRS
- New Zygo Transmission Spheres
- Quantel launch Pizzicato picosecond Nd:YAG laser
- Opolette HR and HE Optical Parametric Oscillators
- Lambda Photometrics builds on 30 years success
- The PR 4400 Precision Reflectometer from Luna Technologies
- Replacement lasers for Durst Lambda digital photographic printer
- Prostream Digital Video Recording Software for Multiple Networked Cameras
- ZYGO Introduces Next Generation 3D Optical Profiler
- New IR OPO’s for MALDI-TOF applications
- Lasos Fibre Coupling Capabilities & 50mW Yellow DPSS Laser
- Stanford Research QMS Series Atmospheric Sampling Systems
- SRS Nitrogen Lasers available with fast delivery
- Large Aperture Beam Expanders
- New Stage Metrology Products from Zygo Corporation
- New Pro Ultra LED Controller from Schott
- DC-350 MHz 4 CHANNEL PREAMPLIFIERS
- Two Widely Separate Applications Of High Speed 3D Machine Vision In The Automotive Industry
- Sophisticated iQLED Controllers From Schott
- Fast Firewire Machine Vision Cameras From Prosilica
- High Speed 3D - the fastest 3D measurement available!
- Miniature, Economical Firewire Machine Vision Cameras from Prosilica
- Simultaneous 3D and grey scale profiles at high speed
- SCHOTT Reveals the New DCR III Plus Light Source With Built-in RS232 Interface
- New Injection-Seeded Quantel Brilliant B SLM Nd:YAG Laser
- Prosilica Ships Gigabit Ethernet Cameras
- A New Catalogue of Fibre Optic Components & Instrumentation
- IMPERX In-Camera Image Processing
- Carl Zeiss – Exciting New Otus Lens
- Baumer MX S-Mount Kits
- APEX Technologies enters new distributor agreement with Lambda Photometrics
- Latest Image Processing Technology Shows Dramatic Improvement For Melting Point Determination
- SCHOTT Releases the New DCR IV With integrated equalizer
- Solid state lasers to cover the visible spectrum
- New Portable Digital Microscope
- New "Flashport" unit for cold light sources from Schott
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- SCHOTT Presents The Universal Light Source
- Laser Pulse Picker Systems from Conoptics
Uncategorized
- Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
- Make your January Golden with brand a new Luxor Gold Coater & get the best performance from your SEM
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- An introduction to Electron Microscopy
- How SEM helps research polymers characteristics, properties and uses
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and TEM: what's the difference?
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Desktop SEM imaging in the development of a radioablation device
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Customer Testimonial: Material Research at DSM
- Customer Testimonial: Aiming at Phenomenal Cleanliness
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Synapse BV
- Correlative Light and Electron Microscopy
- Phenom-World announces the Phenom XL, world’s fastest desktop SEM to handle large samples
- Phenom ProX - the perfect all-in-one desktop SEM
- Particlemetric Software for the Phenom Desk Top SEM
- Second User Phenom G1 Desktop SEM
- 404 Not Found
- Elemental Mapping for the Phenom™ proX SEM
- Phenom Desktop Scanning Electron Microscope
- Fibermetric System automated measurement system for nano and micro fibers.
- Meet The Team
- Phenom proX Desktop Scanning Electron Microscope
- Introducing the Phenom proX all-in-one imaging and analysis system
- New Motorized Tilt & Rotation Sample Holder for Phenom Desktop SEM
- Phenom desktop SEM now available from Lambda Photometrics Ltd
- Fibermetric System automated measurement system for nano and micro fibers
- Paper Manufacturing R&D/QA App Note
- Field Sales/Application Engineer - Spectroscopy Job Vacancy
- Field Service Engineer Job Vacancy
- Introducing Phenom Pro Suite Applications
- Enhanced performance for the Phenom desktop SEM
- Phenom desktop SEM now available with Remote Assistant
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- The fastest Point and Shoot Desktop Scanning Electron Microscope (SEM) for Forensic applications
- Integrated Elemental Mapping & Line Scan
- Measuring skin surface
- Phenom-World Unveils The Third Generation Phenom Desktop SEM
- Second User Phenom G1 Desktop SEM
News
Events
Knowledge Base
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- LAS™ Lens Alignment Technology - The Basics
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Optical Profilers in an Argon Chamber Environment
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The Turbulent History of Interferometric Methods of Precision Positioning
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Transmission Kikuchi Diffraction Analyses
- Roughness Measurements — Let’s Take a Closer Look
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Vibration Control Solutions for Microscopy
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Preparing APT Specimens in a Controlled Air Free Environment
- Technical capabilities required to ensure successful vacuum window fabrication
- Ex situ lift-out specimen thinning
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Designing the Electron Microscope of the Future
- Quantum Computers: The Importance of Vibration Isolation
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Gimbal Piston Isolator Performance
- Direct CPA-Free Pulse Amplification
- Optical Assemblies
- Straight Edges
- Custom Beamsplitters
- Optical Mirrors
- Machined Structures
- Spherical Elements
- Light-Weighted Optics
- Aspheres & Freeforms
- Optical Windows
- Optical Coatings
- Unlocking the Secrets of Cancer Cells
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- EMC…What is it?
- Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- WEBINAR: The origins of structure-insensitivity in heterogeneous catalysis
- UV to MWIR Optical Coating Broadband Measurement
- Computer Generated Hologram (CGH)
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- Navitar Solutions for NIR and SWIR Imaging Applications
- How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Advanced Microwave Topics for Quantum Physicists
- A New Paradigm for the Classical to Quantum Computing Interface
- Enhancing SERS Through Nanostructured Materials
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- A History of ZYGO Optical Profilers
- Energy Storage Application Note – Water Splitting
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- EMC Pre-Compliance Testing
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Why buying Stanford Research Systems from Lambda makes sense
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- How to use GPIO cameras with a PLC
- What is USB 3.1?
- Customer Testimonial: Researching the chemical nature of production faults
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Compliant list for Baumer industrial cameras - USB 3.0
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Chromatic dispersion measurement with Optical Complex Spectrum Analyser
- Differential Quadrature Phase Shift Keying (DQPSK) modulation characteristics using Optical Complex Spectrum Analyser
- Effects of chirp induction mechanism on spectral broadening in LiNbO3 modulators using Optical Complex Spectrum Analyser
- Optical intensity and chirp measurement of a Mach-Zehnder Electro-optic travelling wave modulators with Optical Complex Spectrum Analyser
- Optical Complex Spectrum Analyser AP2441B/AP2443B : High efficient tool for any kind of usual modulation format measurements
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- 80Gb/s Multi-Level BPSK experiment with an InPMonolithic Source Based on Prefixed Optical Phase Switching
- Optical Complex Spectrum Analyser principle
- Ultra High Resolution Optical Spectrum Analyser used for the generation of coherent Dual-Polarisation Multi-Band OFDM signals
- 64-QAM-encoded Optical OFDM signal spectrum measurement using High Resolution Optical Spectrum Analysers
- Ultra High Resolution Optical Spectrum Analyser used for Generation of Coherent Multi-Carrier Signals by Gain Switching of Discrete Mode Lasers
- Gain Measurements of Fabry-Pérot InP/InGaAsP Lasers using an Ultra High Resolution Optical Spectrum Analyser
- High Resolution Optical Spectrum Analyser used for Experimental demonstration of 23.6-Gb/s OFDM with a colourless transmitter
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Frequency Response Analysis Tool using a PicoScope USB Oscilloscope
- Metricon Model 2010/M Prism Coupler References
- Metricon Prism Coupler – A Comparison to Ellipsometry
- The Metricon Prism Coupler - An Applications Overview
- Dual Film Measurements with the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Optical Waveguide Characterization with the Metricon Prism Coupler
- High resolution imaging using LASOS LDM-XT laser diode modules
- Bench test solutions for education teaching labs
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Machine Vision Components & System Integration
- European Master Distributor for Spectrum Illumination
- About Lock-in Amplifiers
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- LASOS dedicated to HeNe Laser production for the modern age
- New possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer
- Optical Profiler Basics and some history
- Verifire™ Series Interferometer Systems
- Colour capabilities of the Zygo Nexview for corrosion investigation
- About Lock-In Amplifiers
- Application Note for LN Modulators
- High Speed Imaging – All in one solution! (Part 1)
- New Firmware for Baumer MXG and VisiLine® Cameras
- IP Rated Equipment: Codes & Clarification
- GigE Camera Trouble Shooting Guide
- SRS Tech Note: SG384 RF Signal Generator
- SRS Tech Note: RF Signal Generators
- LATAB Strobe Controllers Q&A
- LATAB Continuous Mode Controllers Q&A
- Baumer TXD Series Q&A
- Warranty
- Service
- General Support
News
- WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
- Optical Profilers in an Argon Chamber Environment
- WEBINAR: Preparing APT specimens in a controlled environment
- EMC and Compliance International
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Time to upgrade your laboratory equipment?
- Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Semplor - the new name for SEM's
- TMC CleanTop® Advantages
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- WEBINAR: Why circuit decoupling is essential for achieving success in EMI/EMC
- Building on success… Zygo’s new Qualifire™ laser interferometer
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- Rigol: Swept-Tuned Spectrum Analyser or Real Time Spectrum Analyser
- Look no further than the Pico-Technology AS108...
- Simulate, Stimulate and Test
- For all your RF Signal Generator needs….
- The best just got better with STACIS 4
- Sources of Vibration
- CHEMUK 2024
- LUXOR Au - Gold Sputter Coater for SEM Sample Preparation
- The NEW LSX-Series of Signal Generators from Tabor Electronics
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Society of Electron Microscope Technology
- Sputter Coater Summer Deal from Lambda Photometrics
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- The Fischione 1070 Plasma Cleaner is the must have tool for all serious TEM/SEM Labs
- South-West Electron Microscopy
- Q. When is a tabletop SEM not just a tabletop SEM
- EMAG2022
- The Forge: Particle Characterization in Formulation
- Engineering Design Show Reconnect
- UK Semiconductors Conference
- European Microwave Week 2021
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- PHOTON2022
- Extraordinary Low Voltage (500 volts) Performance
- WEBINAR: Characterising, Troubleshooting & Mitigating Wireless and IoT Self-Generated EMI
- RMS 2022 Digital Calendar Available to Download
- EMC & Compliance International
- ARMMS RF and Microwave Society Conference
- Virtual EM-UK 2022
- WEBINAR: International Optics Surface Standards with Dave Aikens
- Luxor Sputter Coater FREE trial in your lab - try before you buy!
- UV to MWIR Optical Coating Broadband Measurement
- WEBINAR: 2nd Online Material Pioneers Summit
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- WEBINAR: Precision Fizeau Interferometers vs. Challenging Environments. See Who Wins...
- Computer Generated Hologram (CGH)
- Lambda Photometrics & LUXOR-Tech – Delivering Innovation, Quality, Performance & Economy
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- WEBINAR: Producing high-step coverage interconnects using printed nanoparticles
- New Longer-Range OBR for Data Centres
- Case Study: Electric Vehicle Manufacturing and Precision Metrology
- Navitar Solutions for NIR and SWIR Imaging Applications
- WEBINAR: Plasma cleaning - A critical step in SEM and TEM sample preparation
- Optics Metrology Update August 2021
- WEBINAR: Secrets of Near and Far Field Scanning
- Unlocking structure and chemistry at the atomic level
- PAY LESS 4 MORE - 4 reason’s to buy the EmCrafts System from Lambda
- Vibration Isolation for Cell Culture Incubators
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- WEBINAR: Polarisation Extinction Ratio Measurement in Highly Birefringent Materials: Challenges and Solutions
- Re-defining Analog Signal Generation
- WEBINAR: Precise final thinning of FIB-prepared specimens
- Microscience Microscopy Congress 2021
- WEBINAR: Vibration Control for Semiconductor Facilities and Equipment
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- WEBINAR: The VSP-P1 Nanostructured Material Printer – the ultimate tool for material development – product demo webinar
- WEBINAR: Everything EMC
- WEBINAR: Key Attributes of Modern Fibre Optic Cleaning and Inspection Solutions
- WEBINAR: P67.00001 : Experiment design considerations for real-time, closed-loop pulse streaming
- WEBINAR: Ion milling semiconductor solder bumps for SEM analyses
- NANOPARTICLE WEBINAR: Learn with VSParticle
- SEMINAR: 2020 Christmas Lecture for the Midlands Centre for Data-Driven Metrology
- WEBINAR: Learn with VSParticle
- WEBINAR: Learn with LUNA
- Large Area Ion Milling with the Fischione M1062 TrionMill
- CI Systems Newsletter November 2020
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- LAMBDA AWARDED ISO 9001:2015
- SMARTTECH3D Metrology - 3D Scanners
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- UK Semiconductors Conference 2021
- Energy Storage Application Note – Water Splitting
- Engineering Design Show 2021
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- New MICRON3D green stereo industrial scanner
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Full area topography and thickness of sub-micron films
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- New Baumer LX Cameras now with integrated JPEG compression
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Laptop and portable based high speed capture DVR from Norpix
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Why buying Stanford Research Systems from Lambda makes sense
- Scratches and Digs – ISO (Edge Chips and Coating Defects too)
- NUWPEC Approved Framework Supplier
- Scratches and Digs – measure on curves and large areas now!
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Understanding Surface Texture Parameters
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Current Vacancies
- New partnership with Xiton Photonics GmbH
- New EX series – Baumer quality at low prices
- The Metricon Prism Coupler - An Applications Overview
- GLDM-520 OEM Green Laser Diode Modules
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer
- LASOS dedicated to HeNe Laser production for the modern age
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- High Speed Imaging – All in one solution! (Part 1)
- As of December 1st 2014 Zygo will no longer offer PC upgrades for older products with obsolete electronics
- New LX camera series with 8/12/20 megapixel and dual GigE
- MX Board Level Cameras with even more flexibility
- Spectrophotometer designed specifically to measure optical coatings with a range of 190-4900 nm.
- Baumer GAPI v2.3 is available now
- NEW in Microscopy - KL 1500 HAL Light Source
- New Low-cost Fusion Splicer from Lambda Photometrics
- Pico Technology receives a Queen’s Award for Enterprise!
- StreamPix 6 now supports new Ladybug 5 3D spherical camera
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Baumer MX camera release
- StreamPix 6 released!
- Baumer MX S-Mount Kits
- The smallest 1.3-megapixel USB3 Camera with NIR from XIMEA
- AirMicro – iPad/iPhone/iPod touch microscope system
- TroublePix
- AirMicro for iPhone & iPad
- New Baumer MX S-Mount Kits
- Lambda awarded ISO 9001:2000
Press Releases
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- New MICRON3D green stereo industrial scanner
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- New Baumer LX Cameras now with integrated JPEG compression
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- PicoScope 5000D Series: “The complete all-rounder”
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- New partnership with Xiton Photonics GmbH
- GLDM-520 OEM Green Laser Diode Modules
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Baumer MX camera release
- StreamPix 6 released!
- New Revision for StreamPix, TroublePix and HERMES software from Norpix
- Optimelt Automated Melting Point Apparatus
- Large-scale coaxial LED illumination with small installation dimensions
- AirMicro for iPhone & iPad
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- MPA100 OptiMelt Melting Point Apparatus
- Print Copper on Polymers and Paper with the Sinteron 2010
- Real-time, H.264 HD Video Acquisition & Streaming - 1080p, 1080i, 720p & more!
- ExpressCard/34 HD-SDI Laptop Grabber - NOW HAS AUDIO!
- Striking a new path with cost-effective vision solutions using PoE
- StreamPix 5 Offers All-In One Particle Image Velocimetry Functionality
- Overcoming limits – world's fastest standard VGA sensor meets the latest board level camera design
- Highest performance for superior demand: LED Light Source
- Laptop Solution: TroublePix/StreamPix 750
- Introducing Lambda Photometrics as the new Imperx Distributor for Camera Sales in UK & Ireland
- New 2/3" Megapixel lenses especially designed for 10MP sensors
- Dual GigE Technology Doubles Standard GigE Bandwidth to 240 MB/s
- StreamPix 5/TroublePix High Speed Laptop Solution
- A new affordable Rubidium Audio Master Clock, the Perfection-10
- Greenlee XL fiberTOOLS
- Scratch/Dig measurement system from Savvy Optics
- VeriSens – a new generation of intuitive configuration
- dynaFiZ Dynamic Metrology With Confidence
- The new PHOENIX1400 Benchtop Tunable laser from LUNA Technologies
- GC780/GC780C New Low Cost Gigabit Ethernet Camera 64 fps from Prosilica
- Scorpion Vision Software Seminar and Workshop
- New DG645 8 channel digital delay/pulse generator
- PRS10 Rubidium frequency standard OEM Module
- Stanford Research Launch New Range of Products
- Stanford Research launch the SR1 Audio Analyser
- Low Cost Fibre Cable Test Instrumentation
- Smart Fibre Optic Cable Test Sets
- StreamPix Digital Video Recording Software
- Introducing VisiLine® and VisiLine® IP Kits
- Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor
- New Infrared material measurement service from Lambda Photometrics
- A new compact high resolution Raman spectrometer – the Glacier T
- The QUEST mini spectrometer just got better
- IMPERX 29MP Camera Shipping NOW
- New Test and Laboratory Controller for LED Lighting
- Non-contact multilayer film thickness measurement made easy
- New liquid cell option for refractive index measuring prism coupler
- “Cool” - The New Glacier™ X Miniature TE Cooled Spectrometer
- A new 4GHz RF Signal Generator, the SG384
- From lab to recording studio – a cost effective Rubidium master clock
- B&W Tek compact spectrometers receive a makeover
- New Machine Vision Range from Tattile
- New from SCHOTT - KL 200 LED and EasyLED Ringlight Plus
- New FS730 & FS735 Distribution Amplifiers from SRS
- New Zygo Transmission Spheres
- Quantel launch Pizzicato picosecond Nd:YAG laser
- Opolette HR and HE Optical Parametric Oscillators
- Lambda Photometrics builds on 30 years success
- The PR 4400 Precision Reflectometer from Luna Technologies
- Replacement lasers for Durst Lambda digital photographic printer
- Prostream Digital Video Recording Software for Multiple Networked Cameras
- ZYGO Introduces Next Generation 3D Optical Profiler
- New IR OPO’s for MALDI-TOF applications
- Lasos Fibre Coupling Capabilities & 50mW Yellow DPSS Laser
- Stanford Research QMS Series Atmospheric Sampling Systems
- SRS Nitrogen Lasers available with fast delivery
- Large Aperture Beam Expanders
- New Stage Metrology Products from Zygo Corporation
- New Pro Ultra LED Controller from Schott
- DC-350 MHz 4 CHANNEL PREAMPLIFIERS
- Two Widely Separate Applications Of High Speed 3D Machine Vision In The Automotive Industry
- Sophisticated iQLED Controllers From Schott
- Fast Firewire Machine Vision Cameras From Prosilica
- High Speed 3D - the fastest 3D measurement available!
- Miniature, Economical Firewire Machine Vision Cameras from Prosilica
- Simultaneous 3D and grey scale profiles at high speed
- SCHOTT Reveals the New DCR III Plus Light Source With Built-in RS232 Interface
- New Injection-Seeded Quantel Brilliant B SLM Nd:YAG Laser
- Prosilica Ships Gigabit Ethernet Cameras
- A New Catalogue of Fibre Optic Components & Instrumentation
- IMPERX In-Camera Image Processing
- Carl Zeiss – Exciting New Otus Lens
- Baumer MX S-Mount Kits
- APEX Technologies enters new distributor agreement with Lambda Photometrics
- Latest Image Processing Technology Shows Dramatic Improvement For Melting Point Determination
- SCHOTT Releases the New DCR IV With integrated equalizer
- Solid state lasers to cover the visible spectrum
- New Portable Digital Microscope
- New "Flashport" unit for cold light sources from Schott
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- SCHOTT Presents The Universal Light Source
- Laser Pulse Picker Systems from Conoptics
Uncategorized
- Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
- Make your January Golden with brand a new Luxor Gold Coater & get the best performance from your SEM
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- An introduction to Electron Microscopy
- How SEM helps research polymers characteristics, properties and uses
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and TEM: what's the difference?
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Desktop SEM imaging in the development of a radioablation device
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Customer Testimonial: Material Research at DSM
- Customer Testimonial: Aiming at Phenomenal Cleanliness
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Synapse BV
- Correlative Light and Electron Microscopy
- Phenom-World announces the Phenom XL, world’s fastest desktop SEM to handle large samples
- Phenom ProX - the perfect all-in-one desktop SEM
- Particlemetric Software for the Phenom Desk Top SEM
- Second User Phenom G1 Desktop SEM
- 404 Not Found
- Elemental Mapping for the Phenom™ proX SEM
- Phenom Desktop Scanning Electron Microscope
- Fibermetric System automated measurement system for nano and micro fibers.
- Meet The Team
- Phenom proX Desktop Scanning Electron Microscope
- Introducing the Phenom proX all-in-one imaging and analysis system
- New Motorized Tilt & Rotation Sample Holder for Phenom Desktop SEM
- Phenom desktop SEM now available from Lambda Photometrics Ltd
- Fibermetric System automated measurement system for nano and micro fibers
- Paper Manufacturing R&D/QA App Note
- Field Sales/Application Engineer - Spectroscopy Job Vacancy
- Field Service Engineer Job Vacancy
- Introducing Phenom Pro Suite Applications
- Enhanced performance for the Phenom desktop SEM
- Phenom desktop SEM now available with Remote Assistant
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- The fastest Point and Shoot Desktop Scanning Electron Microscope (SEM) for Forensic applications
- Integrated Elemental Mapping & Line Scan
- Measuring skin surface
- Phenom-World Unveils The Third Generation Phenom Desktop SEM
- Second User Phenom G1 Desktop SEM
Press Releases
Events
Knowledge Base
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- LAS™ Lens Alignment Technology - The Basics
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Optical Profilers in an Argon Chamber Environment
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The Turbulent History of Interferometric Methods of Precision Positioning
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Transmission Kikuchi Diffraction Analyses
- Roughness Measurements — Let’s Take a Closer Look
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Vibration Control Solutions for Microscopy
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Preparing APT Specimens in a Controlled Air Free Environment
- Technical capabilities required to ensure successful vacuum window fabrication
- Ex situ lift-out specimen thinning
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Designing the Electron Microscope of the Future
- Quantum Computers: The Importance of Vibration Isolation
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Gimbal Piston Isolator Performance
- Direct CPA-Free Pulse Amplification
- Optical Assemblies
- Straight Edges
- Custom Beamsplitters
- Optical Mirrors
- Machined Structures
- Spherical Elements
- Light-Weighted Optics
- Aspheres & Freeforms
- Optical Windows
- Optical Coatings
- Unlocking the Secrets of Cancer Cells
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- EMC…What is it?
- Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- WEBINAR: The origins of structure-insensitivity in heterogeneous catalysis
- UV to MWIR Optical Coating Broadband Measurement
- Computer Generated Hologram (CGH)
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- Navitar Solutions for NIR and SWIR Imaging Applications
- How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Advanced Microwave Topics for Quantum Physicists
- A New Paradigm for the Classical to Quantum Computing Interface
- Enhancing SERS Through Nanostructured Materials
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- A History of ZYGO Optical Profilers
- Energy Storage Application Note – Water Splitting
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- EMC Pre-Compliance Testing
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Why buying Stanford Research Systems from Lambda makes sense
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- How to use GPIO cameras with a PLC
- What is USB 3.1?
- Customer Testimonial: Researching the chemical nature of production faults
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Compliant list for Baumer industrial cameras - USB 3.0
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Chromatic dispersion measurement with Optical Complex Spectrum Analyser
- Differential Quadrature Phase Shift Keying (DQPSK) modulation characteristics using Optical Complex Spectrum Analyser
- Effects of chirp induction mechanism on spectral broadening in LiNbO3 modulators using Optical Complex Spectrum Analyser
- Optical intensity and chirp measurement of a Mach-Zehnder Electro-optic travelling wave modulators with Optical Complex Spectrum Analyser
- Optical Complex Spectrum Analyser AP2441B/AP2443B : High efficient tool for any kind of usual modulation format measurements
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- 80Gb/s Multi-Level BPSK experiment with an InPMonolithic Source Based on Prefixed Optical Phase Switching
- Optical Complex Spectrum Analyser principle
- Ultra High Resolution Optical Spectrum Analyser used for the generation of coherent Dual-Polarisation Multi-Band OFDM signals
- 64-QAM-encoded Optical OFDM signal spectrum measurement using High Resolution Optical Spectrum Analysers
- Ultra High Resolution Optical Spectrum Analyser used for Generation of Coherent Multi-Carrier Signals by Gain Switching of Discrete Mode Lasers
- Gain Measurements of Fabry-Pérot InP/InGaAsP Lasers using an Ultra High Resolution Optical Spectrum Analyser
- High Resolution Optical Spectrum Analyser used for Experimental demonstration of 23.6-Gb/s OFDM with a colourless transmitter
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Frequency Response Analysis Tool using a PicoScope USB Oscilloscope
- Metricon Model 2010/M Prism Coupler References
- Metricon Prism Coupler – A Comparison to Ellipsometry
- The Metricon Prism Coupler - An Applications Overview
- Dual Film Measurements with the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Optical Waveguide Characterization with the Metricon Prism Coupler
- High resolution imaging using LASOS LDM-XT laser diode modules
- Bench test solutions for education teaching labs
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Machine Vision Components & System Integration
- European Master Distributor for Spectrum Illumination
- About Lock-in Amplifiers
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- LASOS dedicated to HeNe Laser production for the modern age
- New possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer
- Optical Profiler Basics and some history
- Verifire™ Series Interferometer Systems
- Colour capabilities of the Zygo Nexview for corrosion investigation
- About Lock-In Amplifiers
- Application Note for LN Modulators
- High Speed Imaging – All in one solution! (Part 1)
- New Firmware for Baumer MXG and VisiLine® Cameras
- IP Rated Equipment: Codes & Clarification
- GigE Camera Trouble Shooting Guide
- SRS Tech Note: SG384 RF Signal Generator
- SRS Tech Note: RF Signal Generators
- LATAB Strobe Controllers Q&A
- LATAB Continuous Mode Controllers Q&A
- Baumer TXD Series Q&A
- Warranty
- Service
- General Support
News
- WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
- Optical Profilers in an Argon Chamber Environment
- WEBINAR: Preparing APT specimens in a controlled environment
- EMC and Compliance International
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Time to upgrade your laboratory equipment?
- Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Semplor - the new name for SEM's
- TMC CleanTop® Advantages
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- WEBINAR: Why circuit decoupling is essential for achieving success in EMI/EMC
- Building on success… Zygo’s new Qualifire™ laser interferometer
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- Rigol: Swept-Tuned Spectrum Analyser or Real Time Spectrum Analyser
- Look no further than the Pico-Technology AS108...
- Simulate, Stimulate and Test
- For all your RF Signal Generator needs….
- The best just got better with STACIS 4
- Sources of Vibration
- CHEMUK 2024
- LUXOR Au - Gold Sputter Coater for SEM Sample Preparation
- The NEW LSX-Series of Signal Generators from Tabor Electronics
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Society of Electron Microscope Technology
- Sputter Coater Summer Deal from Lambda Photometrics
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- The Fischione 1070 Plasma Cleaner is the must have tool for all serious TEM/SEM Labs
- South-West Electron Microscopy
- Q. When is a tabletop SEM not just a tabletop SEM
- EMAG2022
- The Forge: Particle Characterization in Formulation
- Engineering Design Show Reconnect
- UK Semiconductors Conference
- European Microwave Week 2021
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- PHOTON2022
- Extraordinary Low Voltage (500 volts) Performance
- WEBINAR: Characterising, Troubleshooting & Mitigating Wireless and IoT Self-Generated EMI
- RMS 2022 Digital Calendar Available to Download
- EMC & Compliance International
- ARMMS RF and Microwave Society Conference
- Virtual EM-UK 2022
- WEBINAR: International Optics Surface Standards with Dave Aikens
- Luxor Sputter Coater FREE trial in your lab - try before you buy!
- UV to MWIR Optical Coating Broadband Measurement
- WEBINAR: 2nd Online Material Pioneers Summit
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- WEBINAR: Precision Fizeau Interferometers vs. Challenging Environments. See Who Wins...
- Computer Generated Hologram (CGH)
- Lambda Photometrics & LUXOR-Tech – Delivering Innovation, Quality, Performance & Economy
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- WEBINAR: Producing high-step coverage interconnects using printed nanoparticles
- New Longer-Range OBR for Data Centres
- Case Study: Electric Vehicle Manufacturing and Precision Metrology
- Navitar Solutions for NIR and SWIR Imaging Applications
- WEBINAR: Plasma cleaning - A critical step in SEM and TEM sample preparation
- Optics Metrology Update August 2021
- WEBINAR: Secrets of Near and Far Field Scanning
- Unlocking structure and chemistry at the atomic level
- PAY LESS 4 MORE - 4 reason’s to buy the EmCrafts System from Lambda
- Vibration Isolation for Cell Culture Incubators
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- WEBINAR: Polarisation Extinction Ratio Measurement in Highly Birefringent Materials: Challenges and Solutions
- Re-defining Analog Signal Generation
- WEBINAR: Precise final thinning of FIB-prepared specimens
- Microscience Microscopy Congress 2021
- WEBINAR: Vibration Control for Semiconductor Facilities and Equipment
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- WEBINAR: The VSP-P1 Nanostructured Material Printer – the ultimate tool for material development – product demo webinar
- WEBINAR: Everything EMC
- WEBINAR: Key Attributes of Modern Fibre Optic Cleaning and Inspection Solutions
- WEBINAR: P67.00001 : Experiment design considerations for real-time, closed-loop pulse streaming
- WEBINAR: Ion milling semiconductor solder bumps for SEM analyses
- NANOPARTICLE WEBINAR: Learn with VSParticle
- SEMINAR: 2020 Christmas Lecture for the Midlands Centre for Data-Driven Metrology
- WEBINAR: Learn with VSParticle
- WEBINAR: Learn with LUNA
- Large Area Ion Milling with the Fischione M1062 TrionMill
- CI Systems Newsletter November 2020
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- LAMBDA AWARDED ISO 9001:2015
- SMARTTECH3D Metrology - 3D Scanners
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- UK Semiconductors Conference 2021
- Energy Storage Application Note – Water Splitting
- Engineering Design Show 2021
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- New MICRON3D green stereo industrial scanner
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Full area topography and thickness of sub-micron films
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- New Baumer LX Cameras now with integrated JPEG compression
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Laptop and portable based high speed capture DVR from Norpix
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Why buying Stanford Research Systems from Lambda makes sense
- Scratches and Digs – ISO (Edge Chips and Coating Defects too)
- NUWPEC Approved Framework Supplier
- Scratches and Digs – measure on curves and large areas now!
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Understanding Surface Texture Parameters
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Current Vacancies
- New partnership with Xiton Photonics GmbH
- New EX series – Baumer quality at low prices
- The Metricon Prism Coupler - An Applications Overview
- GLDM-520 OEM Green Laser Diode Modules
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer
- LASOS dedicated to HeNe Laser production for the modern age
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- High Speed Imaging – All in one solution! (Part 1)
- As of December 1st 2014 Zygo will no longer offer PC upgrades for older products with obsolete electronics
- New LX camera series with 8/12/20 megapixel and dual GigE
- MX Board Level Cameras with even more flexibility
- Spectrophotometer designed specifically to measure optical coatings with a range of 190-4900 nm.
- Baumer GAPI v2.3 is available now
- NEW in Microscopy - KL 1500 HAL Light Source
- New Low-cost Fusion Splicer from Lambda Photometrics
- Pico Technology receives a Queen’s Award for Enterprise!
- StreamPix 6 now supports new Ladybug 5 3D spherical camera
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Baumer MX camera release
- StreamPix 6 released!
- Baumer MX S-Mount Kits
- The smallest 1.3-megapixel USB3 Camera with NIR from XIMEA
- AirMicro – iPad/iPhone/iPod touch microscope system
- TroublePix
- AirMicro for iPhone & iPad
- New Baumer MX S-Mount Kits
- Lambda awarded ISO 9001:2000
Press Releases
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- New MICRON3D green stereo industrial scanner
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- New Baumer LX Cameras now with integrated JPEG compression
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- PicoScope 5000D Series: “The complete all-rounder”
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- New partnership with Xiton Photonics GmbH
- GLDM-520 OEM Green Laser Diode Modules
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Baumer MX camera release
- StreamPix 6 released!
- New Revision for StreamPix, TroublePix and HERMES software from Norpix
- Optimelt Automated Melting Point Apparatus
- Large-scale coaxial LED illumination with small installation dimensions
- AirMicro for iPhone & iPad
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- MPA100 OptiMelt Melting Point Apparatus
- Print Copper on Polymers and Paper with the Sinteron 2010
- Real-time, H.264 HD Video Acquisition & Streaming - 1080p, 1080i, 720p & more!
- ExpressCard/34 HD-SDI Laptop Grabber - NOW HAS AUDIO!
- Striking a new path with cost-effective vision solutions using PoE
- StreamPix 5 Offers All-In One Particle Image Velocimetry Functionality
- Overcoming limits – world's fastest standard VGA sensor meets the latest board level camera design
- Highest performance for superior demand: LED Light Source
- Laptop Solution: TroublePix/StreamPix 750
- Introducing Lambda Photometrics as the new Imperx Distributor for Camera Sales in UK & Ireland
- New 2/3" Megapixel lenses especially designed for 10MP sensors
- Dual GigE Technology Doubles Standard GigE Bandwidth to 240 MB/s
- StreamPix 5/TroublePix High Speed Laptop Solution
- A new affordable Rubidium Audio Master Clock, the Perfection-10
- Greenlee XL fiberTOOLS
- Scratch/Dig measurement system from Savvy Optics
- VeriSens – a new generation of intuitive configuration
- dynaFiZ Dynamic Metrology With Confidence
- The new PHOENIX1400 Benchtop Tunable laser from LUNA Technologies
- GC780/GC780C New Low Cost Gigabit Ethernet Camera 64 fps from Prosilica
- Scorpion Vision Software Seminar and Workshop
- New DG645 8 channel digital delay/pulse generator
- PRS10 Rubidium frequency standard OEM Module
- Stanford Research Launch New Range of Products
- Stanford Research launch the SR1 Audio Analyser
- Low Cost Fibre Cable Test Instrumentation
- Smart Fibre Optic Cable Test Sets
- StreamPix Digital Video Recording Software
- Introducing VisiLine® and VisiLine® IP Kits
- Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor
- New Infrared material measurement service from Lambda Photometrics
- A new compact high resolution Raman spectrometer – the Glacier T
- The QUEST mini spectrometer just got better
- IMPERX 29MP Camera Shipping NOW
- New Test and Laboratory Controller for LED Lighting
- Non-contact multilayer film thickness measurement made easy
- New liquid cell option for refractive index measuring prism coupler
- “Cool” - The New Glacier™ X Miniature TE Cooled Spectrometer
- A new 4GHz RF Signal Generator, the SG384
- From lab to recording studio – a cost effective Rubidium master clock
- B&W Tek compact spectrometers receive a makeover
- New Machine Vision Range from Tattile
- New from SCHOTT - KL 200 LED and EasyLED Ringlight Plus
- New FS730 & FS735 Distribution Amplifiers from SRS
- New Zygo Transmission Spheres
- Quantel launch Pizzicato picosecond Nd:YAG laser
- Opolette HR and HE Optical Parametric Oscillators
- Lambda Photometrics builds on 30 years success
- The PR 4400 Precision Reflectometer from Luna Technologies
- Replacement lasers for Durst Lambda digital photographic printer
- Prostream Digital Video Recording Software for Multiple Networked Cameras
- ZYGO Introduces Next Generation 3D Optical Profiler
- New IR OPO’s for MALDI-TOF applications
- Lasos Fibre Coupling Capabilities & 50mW Yellow DPSS Laser
- Stanford Research QMS Series Atmospheric Sampling Systems
- SRS Nitrogen Lasers available with fast delivery
- Large Aperture Beam Expanders
- New Stage Metrology Products from Zygo Corporation
- New Pro Ultra LED Controller from Schott
- DC-350 MHz 4 CHANNEL PREAMPLIFIERS
- Two Widely Separate Applications Of High Speed 3D Machine Vision In The Automotive Industry
- Sophisticated iQLED Controllers From Schott
- Fast Firewire Machine Vision Cameras From Prosilica
- High Speed 3D - the fastest 3D measurement available!
- Miniature, Economical Firewire Machine Vision Cameras from Prosilica
- Simultaneous 3D and grey scale profiles at high speed
- SCHOTT Reveals the New DCR III Plus Light Source With Built-in RS232 Interface
- New Injection-Seeded Quantel Brilliant B SLM Nd:YAG Laser
- Prosilica Ships Gigabit Ethernet Cameras
- A New Catalogue of Fibre Optic Components & Instrumentation
- IMPERX In-Camera Image Processing
- Carl Zeiss – Exciting New Otus Lens
- Baumer MX S-Mount Kits
- APEX Technologies enters new distributor agreement with Lambda Photometrics
- Latest Image Processing Technology Shows Dramatic Improvement For Melting Point Determination
- SCHOTT Releases the New DCR IV With integrated equalizer
- Solid state lasers to cover the visible spectrum
- New Portable Digital Microscope
- New "Flashport" unit for cold light sources from Schott
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- SCHOTT Presents The Universal Light Source
- Laser Pulse Picker Systems from Conoptics
Uncategorized
- Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
- Make your January Golden with brand a new Luxor Gold Coater & get the best performance from your SEM
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- An introduction to Electron Microscopy
- How SEM helps research polymers characteristics, properties and uses
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and TEM: what's the difference?
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Desktop SEM imaging in the development of a radioablation device
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Customer Testimonial: Material Research at DSM
- Customer Testimonial: Aiming at Phenomenal Cleanliness
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Synapse BV
- Correlative Light and Electron Microscopy
- Phenom-World announces the Phenom XL, world’s fastest desktop SEM to handle large samples
- Phenom ProX - the perfect all-in-one desktop SEM
- Particlemetric Software for the Phenom Desk Top SEM
- Second User Phenom G1 Desktop SEM
- 404 Not Found
- Elemental Mapping for the Phenom™ proX SEM
- Phenom Desktop Scanning Electron Microscope
- Fibermetric System automated measurement system for nano and micro fibers.
- Meet The Team
- Phenom proX Desktop Scanning Electron Microscope
- Introducing the Phenom proX all-in-one imaging and analysis system
- New Motorized Tilt & Rotation Sample Holder for Phenom Desktop SEM
- Phenom desktop SEM now available from Lambda Photometrics Ltd
- Fibermetric System automated measurement system for nano and micro fibers
- Paper Manufacturing R&D/QA App Note
- Field Sales/Application Engineer - Spectroscopy Job Vacancy
- Field Service Engineer Job Vacancy
- Introducing Phenom Pro Suite Applications
- Enhanced performance for the Phenom desktop SEM
- Phenom desktop SEM now available with Remote Assistant
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- The fastest Point and Shoot Desktop Scanning Electron Microscope (SEM) for Forensic applications
- Integrated Elemental Mapping & Line Scan
- Measuring skin surface
- Phenom-World Unveils The Third Generation Phenom Desktop SEM
- Second User Phenom G1 Desktop SEM
Uncategorized
Events
Knowledge Base
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- LAS™ Lens Alignment Technology - The Basics
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Optical Profilers in an Argon Chamber Environment
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The Turbulent History of Interferometric Methods of Precision Positioning
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Transmission Kikuchi Diffraction Analyses
- Roughness Measurements — Let’s Take a Closer Look
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Vibration Control Solutions for Microscopy
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Preparing APT Specimens in a Controlled Air Free Environment
- Technical capabilities required to ensure successful vacuum window fabrication
- Ex situ lift-out specimen thinning
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Designing the Electron Microscope of the Future
- Quantum Computers: The Importance of Vibration Isolation
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Gimbal Piston Isolator Performance
- Direct CPA-Free Pulse Amplification
- Optical Assemblies
- Straight Edges
- Custom Beamsplitters
- Optical Mirrors
- Machined Structures
- Spherical Elements
- Light-Weighted Optics
- Aspheres & Freeforms
- Optical Windows
- Optical Coatings
- Unlocking the Secrets of Cancer Cells
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- EMC…What is it?
- Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- WEBINAR: The origins of structure-insensitivity in heterogeneous catalysis
- UV to MWIR Optical Coating Broadband Measurement
- Computer Generated Hologram (CGH)
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- Navitar Solutions for NIR and SWIR Imaging Applications
- How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Advanced Microwave Topics for Quantum Physicists
- A New Paradigm for the Classical to Quantum Computing Interface
- Enhancing SERS Through Nanostructured Materials
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- Measuring Index and Thickness of Silicon Thin Films
- Measuring Refractive Index of Liquids Inside Sealed Containers
- A History of ZYGO Optical Profilers
- Energy Storage Application Note – Water Splitting
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- The 3D scanner in a unique design for creating an anatomical baby bottle
- Full area topography and thickness of sub-micron films
- SMARTTECH 3D scanners in industry - "LUBIANA" porcelain factory
- Transmission Electron Microscopy (TEM) Sample preparation
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- What is the Value of Shortwave Infrared?
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- EMC Pre-Compliance Testing
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM) measurement and adjustment
- Ultra High Resolution OSA for Characterising and interrogating Fibre Bragg Grating Sensors
- Why buying Stanford Research Systems from Lambda makes sense
- Absolute Position Measurement: Multiwavelength-interferometry-based sensor redefines precision position metrology
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- How to use GPIO cameras with a PLC
- What is USB 3.1?
- Customer Testimonial: Researching the chemical nature of production faults
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Compliant list for Baumer industrial cameras - USB 3.0
- Compliant list for Baumer industrial cameras - Gigabit Ethernet (GigE)
- Chromatic dispersion measurement with Optical Complex Spectrum Analyser
- Differential Quadrature Phase Shift Keying (DQPSK) modulation characteristics using Optical Complex Spectrum Analyser
- Effects of chirp induction mechanism on spectral broadening in LiNbO3 modulators using Optical Complex Spectrum Analyser
- Optical intensity and chirp measurement of a Mach-Zehnder Electro-optic travelling wave modulators with Optical Complex Spectrum Analyser
- Optical Complex Spectrum Analyser AP2441B/AP2443B : High efficient tool for any kind of usual modulation format measurements
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- 80Gb/s Multi-Level BPSK experiment with an InPMonolithic Source Based on Prefixed Optical Phase Switching
- Optical Complex Spectrum Analyser principle
- Ultra High Resolution Optical Spectrum Analyser used for the generation of coherent Dual-Polarisation Multi-Band OFDM signals
- 64-QAM-encoded Optical OFDM signal spectrum measurement using High Resolution Optical Spectrum Analysers
- Ultra High Resolution Optical Spectrum Analyser used for Generation of Coherent Multi-Carrier Signals by Gain Switching of Discrete Mode Lasers
- Gain Measurements of Fabry-Pérot InP/InGaAsP Lasers using an Ultra High Resolution Optical Spectrum Analyser
- High Resolution Optical Spectrum Analyser used for Experimental demonstration of 23.6-Gb/s OFDM with a colourless transmitter
- Ultra High Resolution Optical Spectrum Analyser/Optical Complex Spectrum Analyser for Characterising and Evaluating Optical Frequency Comb Sources
- White Paper: The Importance of Verifying a Reference Reflection for Accurate RL Measurements
- Frequency Response Analysis Tool using a PicoScope USB Oscilloscope
- Metricon Model 2010/M Prism Coupler References
- Metricon Prism Coupler – A Comparison to Ellipsometry
- The Metricon Prism Coupler - An Applications Overview
- Dual Film Measurements with the Metricon Prism Coupler
- Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide with the Mertricon Prism Coupler
- Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid using the Metricon Prism Coupler
- Index Vs Temperature Option (dn/dT) for the Metricon Prism Coupler
- Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films using the Metricon Prism Coupler
- High Accuracy Measurement Of Resist, Polyimide and Polymer Thin Films using the Metricon Prism Coupler
- Spectroscopic Measurements of Index Vs Wavelength (Dispersion) using the Metricon Prism Coupler
- Characterization of SPR and Waveguide Structures for Sensor Applications using the Metricon Prism Coupler
- Bulk Material or Thick Film Index/Birefringence Measurement using the Metricon Prism Coupler
- Waveguide Loss Measurement with the Metricon Prism Coupler
- Optical Waveguide Characterization with the Metricon Prism Coupler
- High resolution imaging using LASOS LDM-XT laser diode modules
- Bench test solutions for education teaching labs
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- Using the Optical Vector Analyser (OVA) for Component Evaluation in a Production Environment
- Time Domain Phase Derivative and Time Domain Wavelength Calculations
- Phase Ripple Measurements with the Optical Vector Analyser (OVA)
- Calculating chromatic dispersion (CD) for fibre measurements using the LUNA OVA
- Calculating Group Delay and Chromatic Dispersion from Optical Phase on the LUNA OVA
- Optical Backscatter Reflectometer (OBR) Skew and Strain Measurements
- Test Summary: Spool Skew and Strain Measurements with the OBR
- Chirped Fibre Bragg Grating Measurements with the Optical Backscatter Reflectometer (OBR
- Choosing a Mode Conditioner for Use with the Optical Backscatter Reflectometer (OBR) in Diagnosing Multi-Mode Fibre
- Using a Circulator to Make Insertion Loss Measurements in Transmission with the Optical Backscatter Reflectometer (OBR)
- Using the Optical Backscatter Reflectometer (OBR) with Multi-Mode Fibre
- Computing Insertion Loss when Transitioning Through Dissimilar Fibre with the Optical Backscatter Reflectometer (OBR)
- Characterising the Optical Properties of Planar Waveguides, Optical Chips and Planar Light Circuits
- Machine Vision Components & System Integration
- European Master Distributor for Spectrum Illumination
- About Lock-in Amplifiers
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- LASOS dedicated to HeNe Laser production for the modern age
- New possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer
- Optical Profiler Basics and some history
- Verifire™ Series Interferometer Systems
- Colour capabilities of the Zygo Nexview for corrosion investigation
- About Lock-In Amplifiers
- Application Note for LN Modulators
- High Speed Imaging – All in one solution! (Part 1)
- New Firmware for Baumer MXG and VisiLine® Cameras
- IP Rated Equipment: Codes & Clarification
- GigE Camera Trouble Shooting Guide
- SRS Tech Note: SG384 RF Signal Generator
- SRS Tech Note: RF Signal Generators
- LATAB Strobe Controllers Q&A
- LATAB Continuous Mode Controllers Q&A
- Baumer TXD Series Q&A
- Warranty
- Service
- General Support
News
- WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
- Optical Profilers in an Argon Chamber Environment
- WEBINAR: Preparing APT specimens in a controlled environment
- EMC and Compliance International
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Time to upgrade your laboratory equipment?
- Solve advanced signal generation scenarios easily with an RF/uW Arbitrary Waveform Generator (AWG)
- Elastic strain measurements
- HAROGIC Technologies introduces the SAE-200
- Semplor - the new name for SEM's
- TMC CleanTop® Advantages
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- WEBINAR: Why circuit decoupling is essential for achieving success in EMI/EMC
- Building on success… Zygo’s new Qualifire™ laser interferometer
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- Rigol: Swept-Tuned Spectrum Analyser or Real Time Spectrum Analyser
- Look no further than the Pico-Technology AS108...
- Simulate, Stimulate and Test
- For all your RF Signal Generator needs….
- The best just got better with STACIS 4
- Sources of Vibration
- CHEMUK 2024
- LUXOR Au - Gold Sputter Coater for SEM Sample Preparation
- The NEW LSX-Series of Signal Generators from Tabor Electronics
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Society of Electron Microscope Technology
- Sputter Coater Summer Deal from Lambda Photometrics
- Laser Testing & Adaptive Options Solutions
- Laser Testing & Adaptive Optics Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- The Fischione 1070 Plasma Cleaner is the must have tool for all serious TEM/SEM Labs
- South-West Electron Microscopy
- Q. When is a tabletop SEM not just a tabletop SEM
- EMAG2022
- The Forge: Particle Characterization in Formulation
- Engineering Design Show Reconnect
- UK Semiconductors Conference
- European Microwave Week 2021
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- PHOTON2022
- Extraordinary Low Voltage (500 volts) Performance
- WEBINAR: Characterising, Troubleshooting & Mitigating Wireless and IoT Self-Generated EMI
- RMS 2022 Digital Calendar Available to Download
- EMC & Compliance International
- ARMMS RF and Microwave Society Conference
- Virtual EM-UK 2022
- WEBINAR: International Optics Surface Standards with Dave Aikens
- Luxor Sputter Coater FREE trial in your lab - try before you buy!
- UV to MWIR Optical Coating Broadband Measurement
- WEBINAR: 2nd Online Material Pioneers Summit
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- WEBINAR: Precision Fizeau Interferometers vs. Challenging Environments. See Who Wins...
- Computer Generated Hologram (CGH)
- Lambda Photometrics & LUXOR-Tech – Delivering Innovation, Quality, Performance & Economy
- Teflon Coated With 2nm Platinum Using Luxor Pt Sputter Coater Delivers Stunning Imaging Quality
- How Smooth is Smooth?
- WEBINAR: Producing high-step coverage interconnects using printed nanoparticles
- New Longer-Range OBR for Data Centres
- Case Study: Electric Vehicle Manufacturing and Precision Metrology
- Navitar Solutions for NIR and SWIR Imaging Applications
- WEBINAR: Plasma cleaning - A critical step in SEM and TEM sample preparation
- Optics Metrology Update August 2021
- WEBINAR: Secrets of Near and Far Field Scanning
- Unlocking structure and chemistry at the atomic level
- PAY LESS 4 MORE - 4 reason’s to buy the EmCrafts System from Lambda
- Vibration Isolation for Cell Culture Incubators
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- WEBINAR: Polarisation Extinction Ratio Measurement in Highly Birefringent Materials: Challenges and Solutions
- Re-defining Analog Signal Generation
- WEBINAR: Precise final thinning of FIB-prepared specimens
- Microscience Microscopy Congress 2021
- WEBINAR: Vibration Control for Semiconductor Facilities and Equipment
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- Tabor Electronics’ 4-Channel RF Signal Generator Reviewed by The Signal Path
- WEBINAR: The VSP-P1 Nanostructured Material Printer – the ultimate tool for material development – product demo webinar
- WEBINAR: Everything EMC
- WEBINAR: Key Attributes of Modern Fibre Optic Cleaning and Inspection Solutions
- WEBINAR: P67.00001 : Experiment design considerations for real-time, closed-loop pulse streaming
- WEBINAR: Ion milling semiconductor solder bumps for SEM analyses
- NANOPARTICLE WEBINAR: Learn with VSParticle
- SEMINAR: 2020 Christmas Lecture for the Midlands Centre for Data-Driven Metrology
- WEBINAR: Learn with VSParticle
- WEBINAR: Learn with LUNA
- Large Area Ion Milling with the Fischione M1062 TrionMill
- CI Systems Newsletter November 2020
- Laser Interferometry – An Enabling Technology For Optimized Automated Manufacturing
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- SAVE 15% on all High Performance Reference Cables from OptoTest
- LAMBDA AWARDED ISO 9001:2015
- SMARTTECH3D Metrology - 3D Scanners
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- UK Semiconductors Conference 2021
- Energy Storage Application Note – Water Splitting
- Engineering Design Show 2021
- Catalysis Application Note – CO₂ Hydrogenation
- Catalysis Application Note - Fuel Cells Research
- New MICRON3D green stereo industrial scanner
- Catalysis Application Note - CO2 Electroreduction
- AN-117 Measuring Insertion Loss and Return Loss of Hybrid Cables in OPL-MAX
- How Can You Accurately Test Performance of Hybrid Cables?
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Full area topography and thickness of sub-micron films
- OptoTest equipment provides the most accurate Return Loss measurements in the industry.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- How to Save Time When Testing Multiple Cable Types
- Measure Latency in Optical Networks with Picosecond Accuracy
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- NEW NorPix announces the launch of StreamTouch
- Optical Reflectometers – How Do They Compare?
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Vibration-Tolerant Interferometry
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- What is an FFT Spectrum Analyser?
- Nano Mechanical Imaging
- New Baumer LX Cameras now with integrated JPEG compression
- LED Lighting Techniques
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- Customer Testimonial: Closely monitored
- Using the SMARTTECH 3D scanner for production of additional parts and accessories
- Scanning electron microscope (SEM) technology explained
- Laptop and portable based high speed capture DVR from Norpix
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 Binary Gas Analyser
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- Basics of Acousto-Optic Devices
- Rigol’s New Real-time Spectrum Analyser
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Why buying Stanford Research Systems from Lambda makes sense
- Scratches and Digs – ISO (Edge Chips and Coating Defects too)
- NUWPEC Approved Framework Supplier
- Scratches and Digs – measure on curves and large areas now!
- Technical and Application Notes for the SRS BGA244 Binary Gas Analyser
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- What is USB 3.1?
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- Understanding Surface Texture Parameters
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Current Vacancies
- New partnership with Xiton Photonics GmbH
- New EX series – Baumer quality at low prices
- The Metricon Prism Coupler - An Applications Overview
- GLDM-520 OEM Green Laser Diode Modules
- Download the latest 2016 Test & Measurement Catalogue from Rigol
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Baumer attracts a kaleidoscope of attention with the colour VeriSens
- Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer
- LASOS dedicated to HeNe Laser production for the modern age
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Up to 10% Discount on Flexible Resolution Oscilloscopes!
- XIMEA unveils Thunderbolt and cameras with IMX174 and CMV20000
- High Speed Imaging – All in one solution! (Part 1)
- As of December 1st 2014 Zygo will no longer offer PC upgrades for older products with obsolete electronics
- New LX camera series with 8/12/20 megapixel and dual GigE
- MX Board Level Cameras with even more flexibility
- Spectrophotometer designed specifically to measure optical coatings with a range of 190-4900 nm.
- Baumer GAPI v2.3 is available now
- NEW in Microscopy - KL 1500 HAL Light Source
- New Low-cost Fusion Splicer from Lambda Photometrics
- Pico Technology receives a Queen’s Award for Enterprise!
- StreamPix 6 now supports new Ladybug 5 3D spherical camera
- The Zygo Nexview™: An Optical Profiler for all Surfaces?
- Baumer MX camera release
- StreamPix 6 released!
- Baumer MX S-Mount Kits
- The smallest 1.3-megapixel USB3 Camera with NIR from XIMEA
- AirMicro – iPad/iPhone/iPod touch microscope system
- TroublePix
- AirMicro for iPhone & iPad
- New Baumer MX S-Mount Kits
- Lambda awarded ISO 9001:2000
Press Releases
- Lambda Photometrics is Proud to Present OptoTest’s NEW Line of Handheld Fibre Optic Test Equipment
- NEW Scanning Electron Microscopes - Table Top & Floor Mounted
- OptoTest Releases Continuous Wave Return Loss & Insertion Loss Meter
- OptoTest Releases a Compact Insertion Loss & Return Loss Test System
- Bringing advanced automation to the forefront using desktop SEM
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- New MICRON3D green stereo industrial scanner
- OptoTest Releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR Integrating Sphere
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- The 3D scanner in a unique design for creating an anatomical baby bottle
- SXRTO Oscilloscopes Explained
- New Rigol MSO8000 Series Oscilloscope Offers 2GHz Analogue Bandwidth and 7 Instruments in 1.
- Nikon Metrology NV and Pixelink Announce New Strategic Partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- Sofradir Electrophysics7215 “Electroviewer” Handheld IR Viewer to be Discontinued
- Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers
- New Baumer LX Cameras now with integrated JPEG compression
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions
- PicoScope 5000D Series: “The complete all-rounder”
- NEW FS740 GPS Time and Frequency System
- New 48 MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Available now: The first Sony Pregius CMOS cameras with 1 micron exposure time
- The BGA244 - a new 0.1% accuracy Gas Analyser for single and binary gas mixtures
- Sensors Unlimited Launches New, Low Cost 320CSX Micro SWIR Camera
- Sensors Unlimited Introduces Fastest SWIR 2048-Pixel Line Scan Camera to Support Medical Diagnosis
- New Non ITAR Micro-SWIR 640CSX Camera
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- XIMEA releases new camera models with Sony CMOS sensors and USB3
- Zygo Trade-ins & Upgrades Special Offer for used Metrology Systems
- New partnership with Xiton Photonics GmbH
- GLDM-520 OEM Green Laser Diode Modules
- New world-record wavelength range configurations for Photon RT
- Download the NEW brochures for Schott Microscopy Lighting
- European Master Distributor for Spectrum Illumination
- Baumer Introduces VisualApplets
- Optics Metrology demonstration equipment at Lambda
- Zygo Releases the ZeGage™ Plus Optical Profiler, Adding More Speed and Precision to Zegage Product Line
- New features and capabilities to the PHOTON RT spectrophotometer
- EssentOptics is proud to announce successful completion of two important projects
- EssentOptics present Photon RT spectrophotometer with new measurement features
- Announcing the NewView 8000 Series
- Biomechanics high speed motion video capture in uncompressed format
- Optics Metrology News Issue 1
- The Baumer LX series – new high-resolution CMOS cameras with up to 20 megapixel and Dual GigE
- Yet More Flexibility with Baumer VisiLine!
- Enhanced Starter Kit Delivery Scope
- Baumer MX camera release
- StreamPix 6 released!
- New Revision for StreamPix, TroublePix and HERMES software from Norpix
- Optimelt Automated Melting Point Apparatus
- Large-scale coaxial LED illumination with small installation dimensions
- AirMicro for iPhone & iPad
- NEW board from Foresight Imaging provides high quality, real-time H.264 compression at up to 1080p 60Hz
- MPA100 OptiMelt Melting Point Apparatus
- Print Copper on Polymers and Paper with the Sinteron 2010
- Real-time, H.264 HD Video Acquisition & Streaming - 1080p, 1080i, 720p & more!
- ExpressCard/34 HD-SDI Laptop Grabber - NOW HAS AUDIO!
- Striking a new path with cost-effective vision solutions using PoE
- StreamPix 5 Offers All-In One Particle Image Velocimetry Functionality
- Overcoming limits – world's fastest standard VGA sensor meets the latest board level camera design
- Highest performance for superior demand: LED Light Source
- Laptop Solution: TroublePix/StreamPix 750
- Introducing Lambda Photometrics as the new Imperx Distributor for Camera Sales in UK & Ireland
- New 2/3" Megapixel lenses especially designed for 10MP sensors
- Dual GigE Technology Doubles Standard GigE Bandwidth to 240 MB/s
- StreamPix 5/TroublePix High Speed Laptop Solution
- A new affordable Rubidium Audio Master Clock, the Perfection-10
- Greenlee XL fiberTOOLS
- Scratch/Dig measurement system from Savvy Optics
- VeriSens – a new generation of intuitive configuration
- dynaFiZ Dynamic Metrology With Confidence
- The new PHOENIX1400 Benchtop Tunable laser from LUNA Technologies
- GC780/GC780C New Low Cost Gigabit Ethernet Camera 64 fps from Prosilica
- Scorpion Vision Software Seminar and Workshop
- New DG645 8 channel digital delay/pulse generator
- PRS10 Rubidium frequency standard OEM Module
- Stanford Research Launch New Range of Products
- Stanford Research launch the SR1 Audio Analyser
- Low Cost Fibre Cable Test Instrumentation
- Smart Fibre Optic Cable Test Sets
- StreamPix Digital Video Recording Software
- Introducing VisiLine® and VisiLine® IP Kits
- Thin Film Thickness and Refractive Index Measurement Solutions from Lambda Photometrics
- Lambda appointed by CI Systems: For all your Electro-Optic Testing Needs
- Breakthrough 3D Optical Profiler for Accurate Surface Metrology on the Production Floor
- New Infrared material measurement service from Lambda Photometrics
- A new compact high resolution Raman spectrometer – the Glacier T
- The QUEST mini spectrometer just got better
- IMPERX 29MP Camera Shipping NOW
- New Test and Laboratory Controller for LED Lighting
- Non-contact multilayer film thickness measurement made easy
- New liquid cell option for refractive index measuring prism coupler
- “Cool” - The New Glacier™ X Miniature TE Cooled Spectrometer
- A new 4GHz RF Signal Generator, the SG384
- From lab to recording studio – a cost effective Rubidium master clock
- B&W Tek compact spectrometers receive a makeover
- New Machine Vision Range from Tattile
- New from SCHOTT - KL 200 LED and EasyLED Ringlight Plus
- New FS730 & FS735 Distribution Amplifiers from SRS
- New Zygo Transmission Spheres
- Quantel launch Pizzicato picosecond Nd:YAG laser
- Opolette HR and HE Optical Parametric Oscillators
- Lambda Photometrics builds on 30 years success
- The PR 4400 Precision Reflectometer from Luna Technologies
- Replacement lasers for Durst Lambda digital photographic printer
- Prostream Digital Video Recording Software for Multiple Networked Cameras
- ZYGO Introduces Next Generation 3D Optical Profiler
- New IR OPO’s for MALDI-TOF applications
- Lasos Fibre Coupling Capabilities & 50mW Yellow DPSS Laser
- Stanford Research QMS Series Atmospheric Sampling Systems
- SRS Nitrogen Lasers available with fast delivery
- Large Aperture Beam Expanders
- New Stage Metrology Products from Zygo Corporation
- New Pro Ultra LED Controller from Schott
- DC-350 MHz 4 CHANNEL PREAMPLIFIERS
- Two Widely Separate Applications Of High Speed 3D Machine Vision In The Automotive Industry
- Sophisticated iQLED Controllers From Schott
- Fast Firewire Machine Vision Cameras From Prosilica
- High Speed 3D - the fastest 3D measurement available!
- Miniature, Economical Firewire Machine Vision Cameras from Prosilica
- Simultaneous 3D and grey scale profiles at high speed
- SCHOTT Reveals the New DCR III Plus Light Source With Built-in RS232 Interface
- New Injection-Seeded Quantel Brilliant B SLM Nd:YAG Laser
- Prosilica Ships Gigabit Ethernet Cameras
- A New Catalogue of Fibre Optic Components & Instrumentation
- IMPERX In-Camera Image Processing
- Carl Zeiss – Exciting New Otus Lens
- Baumer MX S-Mount Kits
- APEX Technologies enters new distributor agreement with Lambda Photometrics
- Latest Image Processing Technology Shows Dramatic Improvement For Melting Point Determination
- SCHOTT Releases the New DCR IV With integrated equalizer
- Solid state lasers to cover the visible spectrum
- New Portable Digital Microscope
- New "Flashport" unit for cold light sources from Schott
- New from SCHOTT the MHR®-50 A Compact, Metal Halide Light Source
- SCHOTT Presents The Universal Light Source
- Laser Pulse Picker Systems from Conoptics
Uncategorized
- Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
- Make your January Golden with brand a new Luxor Gold Coater & get the best performance from your SEM
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM technology: the role of the electron beam voltage in electron microscopy analysis
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- An introduction to Electron Microscopy
- How SEM helps research polymers characteristics, properties and uses
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and TEM: what's the difference?
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in Pharmaceutical Research Field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- Benchtop SEM with Integrated EDS Revolutionizing the World of Structural Analysis
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Desktop SEM imaging in the development of a radioablation device
- Customer Testimonial: Polymeric Nanofibers, Nanofibrous Layers, Nanofiber Yarns and Nanoparticles
- Customer Testimonial: Material Research at DSM
- Customer Testimonial: Aiming at Phenomenal Cleanliness
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- Customer Testimonial: Synapse BV
- Correlative Light and Electron Microscopy
- Phenom-World announces the Phenom XL, world’s fastest desktop SEM to handle large samples
- Phenom ProX - the perfect all-in-one desktop SEM
- Particlemetric Software for the Phenom Desk Top SEM
- Second User Phenom G1 Desktop SEM
- 404 Not Found
- Elemental Mapping for the Phenom™ proX SEM
- Phenom Desktop Scanning Electron Microscope
- Fibermetric System automated measurement system for nano and micro fibers.
- Meet The Team
- Phenom proX Desktop Scanning Electron Microscope
- Introducing the Phenom proX all-in-one imaging and analysis system
- New Motorized Tilt & Rotation Sample Holder for Phenom Desktop SEM
- Phenom desktop SEM now available from Lambda Photometrics Ltd
- Fibermetric System automated measurement system for nano and micro fibers
- Paper Manufacturing R&D/QA App Note
- Field Sales/Application Engineer - Spectroscopy Job Vacancy
- Field Service Engineer Job Vacancy
- Introducing Phenom Pro Suite Applications
- Enhanced performance for the Phenom desktop SEM
- Phenom desktop SEM now available with Remote Assistant
- Microscopic investigation of a metallurgical mount
- Fibre classification with the Phenom
- Diatoms tell the truth about our environment
- The fastest Point and Shoot Desktop Scanning Electron Microscope (SEM) for Forensic applications
- Integrated Elemental Mapping & Line Scan
- Measuring skin surface
- Phenom-World Unveils The Third Generation Phenom Desktop SEM
- Second User Phenom G1 Desktop SEM
-
Sample Preparation and Electron Microscopy
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Imaging – Micro to Macro
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Metrology - Optics and Optical
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Photonics, Fibre Optics and Lasers
-
Test and Measurement
-
Service and Services
Imaging – Micro to Macro
- Nikon metrology NV and Pixelink announce new strategic partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- NorPix announces the launch of StreamTouch
- Customer Testimonial: Closely monitored
- 48MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Sony Pregius CMOS cameras with 1 micron exposure time
- Sensors Unlimited launches low cost 320CSX Micro SWIR camera
- Sensors Unlimited Introduces fastest SWIR 2048-Pixel linescan camera to support medical diagnosis
- Non ITAR Micro-SWIR 640CSX camera
- What is USB 3.1?
- XIMEA releases camera models with Sony CMOS sensors and USB3
- Compliant list for Baumer industrial cameras - USB 3.0
- Foresight Imaging board provides high quality, real-time H.264 compression at up to 1080p 60Hz
- SCHOTT MHR®-50 a compact, metal halide light source
- Packaging and process troubleshooting
Metrology - Optics and Optical
- Optical Profilers in an Argon Chamber Environment
- Suppressing Back Surface Interference Fringes Using First Contact™ Black Polymer
- Technical capabilities required to ensure successful vacuum window fabrication
- Optical Coatings
- Optical Windows
- Aspheres & Freeforms
- Light-Weighted Optics
- Spherical Elements
- Machine Structures
- Optical Mirrors
- Optical Assemblies
- Custom Beamsplitters
- The importance of vibration control in the machining and metrology of advanced aspheric optics
- Computer Generated Hologram (CGH)
- Straight Edges
- How smooth is smooth?
- Zygo SmartSetup™
- Laser Interferometry – an enabling technology for optimised automated manufacturing
- A history of ZYGO optical profilers
- Optical Reflectometers – how do they compare?
- Vibration-tolerant interferometry
- Dynamic capability comes to (nearly) all new Zygo Verifire interferometers
- Scratches and digs – measure on curves and large areas now!
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- Zygo trade-ins & upgrades special offer for used metrology systems
- The Zygo Nexview™ - an optical profiler for all surfaces?
- Lambda appointed by CI Systems: for all your electro-optic testing needs
- LAS™ Lens Alignment Technology
- Case Study: Biofilms
- White Paper: Zoom System for Coherent Imaging with No Moving Lens Groups
- White Paper: The turbulent history of interferometric methods of precision positioning
- Roughness Measurements — Let’s Take a Closer Look
- White Paper: Fast shaping control of x ray beams using a closed-loop adaptive bimorph deformable mirror
- White Paper: Tabor Proteus based EPR/NMR Upgrades
- Application Note: Raised Floor Installation of a CleanTop Joined Optical Table at Chemnitz University of Technology
- Application Note: Optical Spectroscopy at Worcester Polytechnic Institute
- UV to MWIR optical coating broadband measurement
- Case Study: Electric vehicle manufacturing and precision metrology
- Understanding surface texture parameters
- Measuring index and thickness of silicon thin films
- Measuring refractive index of liquids inside sealed containers
- Full area topography and thickness of sub-micron films
- Absolute Position Measurement: multiwavelength interferometry based sensor redefines precision position metrology
Sample Preparation and Electron Microscopy
- Enhancing Mineral and Fossil Analysis Using the Semplor NANOS Tabletop SEM TOPOGRAPHY mode & 3D Reconstruction
- Designing the Electron Microscope of the Future
- Teflon coated with 2nm Platinum using Luxor Pt Sputter Coater delivers stunning imaging quality
- Large area ion milling with the Fischione M1062 TrionMill
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Buying a Scanning Electron Microscope: Navigating the Desktop vs. Floor Model Dilemma
- Scanning electron microscope technology explained
- Unleash Your Lab's Productivity with Tabletop SEM Technology
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- STT-MRAM device - Preparing specimens for imaging and analysis
- Shock Deformation Studies
- Preparing thin films on silicon nitride-type TEM grids for atomic resolution imaging
- Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
- Transmission Kikuchi Diffraction Analyses
- Vibration Solutions for Microscopy
- Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
- Preparing APT Specimens in a Controlled Air Free Environment
- Ex situ lift-out specimen thinning
- Elastic strain measurements
- White Paper: Controlled specimen thinning - Ar ion beam milling of a specimen prepared by Xe plasma FIB
- Unlocking the Secrets of Cancer Cells
- Sources of Vibration
- White Paper: Preparation of Ag nanoparticles by spark ablation in gas as catalysts for electrocatalytic hydrogen production
- White Paper: Aerosol based fabrication of Thiol-capped gold nanoparticles and their application for gene transfection
- White Paper: Mass and density determination of porous nanoparticle films using a quartz crystal microbalance
- White Paper: Enhancement of room temperature Ethanol sensing by optimizing the density of vertically aligned carbon nanofibers decorated with gold nanoparticles
- White Paper: Dynamic restructuring of supported metal nanoparticles and its implications for structure insensitive catalysis
- White Paper: Boosting the thermoelectric properties of PEDOT:PSS via low-impact deposition of tin oxide nanoparticles
- White Paper: High step coverage interconnects by printed nanoparticles
- White Paper: Tunable photoluminescence and SERS behaviour of additively manufactured Au nanoparticle patterns
- White Paper: Dual-gate Fet-based charge sensor enhanced by in-situ electrode decoration in a MEMS organs-on-chip platform
- Metal Coating of Glass Fibres for Enhanced SEM Imaging
- Metal Coating of Styrofoam (XPS) and Polystyrene Foam (EPS) Samples for Enhanced SEM Imaging
- Metal Coating of Nanofibres for Enhanced SEM Imaging
- Metal Coating of a Face Mask for Enhanced SEM Imaging
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Collagen Membranes
- Metal Coating of Biological Samples for Enhanced SEM Imaging: Diatoms
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- New developments in spark production of nanoparticles
- Webinar: Scalable high-throughput electrocatalyst screening
- VSP P1 Nanostructured Material Printer – the ultimate tool for material development
- Accelerating material discovery through rapid material prototyping
- A paradigm shift in electrocatalyst synthesis
- Generating and depositing nanoparticles with a push of a button
- Enhancing SERS through nanostructured materials
- Catalysis Application Note: CO₂ hydrogenation
- Catalysis Application Note: Fuel cells research
- Catalysis Application Note: CO2 electroreduction
- Transmission Electron Microscopy (TEM) sample preparation
- Nano mechanical imaging
- Preparation and property assessment of neat lignocellulose nanofibrils (LCNF) and their composite films
- Customer Testimonial: Researching the chemical nature of production faults
Service and Services
Test and Measurement
- Oscilloscope Technical FAQ: Oscilloscopes Key Features
- Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
- HAROGIC Technologies SAE-200 20 GHz Compact Real-Time Spectrum Analyser/Receiver
- 5GHz Wireless LAN Beacon Generation, using the Proteus AWG
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Tabor Electronics’ 4-channel RF signal generator reviewed by The Signal Path
- Webinar: Advanced microwave topics for Quantum Physicists
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- SXRTO oscilloscopes explained
- Rigol MSO8000 series oscilloscope offers 2GHz analogue bandwidth and 7 Instruments in 1
- What is an FFT spectrum analyser?
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 binary gas analyser
- FS740 GPS time and frequency system
- Basics of acousto-optic devices
- Rigol’s new real-time spectrum analyser
- Why buying Stanford Research Systems from Lambda makes sense
- Technical and application notes for the SRS BGA244 binary gas analyser
- The BGA244 - 0.1% accuracy gas analyser for single and binary gas mixtures
- Pico Technology receives a Queen’s Award for Enterprise.
- White Paper: Floquet prethermalization with lifetime exceeding 90s in a bulk hyperpolarized solid
- Application Note: Stumbling across a good reason why you need a Check Standard
- Application Note: Pico VNA Calibration Introduction
- Application Note: Generating and Measuring Communications Signals with the Proteus AWT
- Application Note: Radar – Solution Note
- Application Note: The Proteus AWT, Radar Primer
- Application Note: Benchmarking electronic calibration of USB-enabled Network Analysers
- Application Note: Proteus Radar Target Simulator
- Technical Note: EMC Pre Compliance
- White Paper: Spark Ablation for the Fabrication of PEM Water Electrolysis Catalyst-Coated Membranes
- Technical Note: How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Technical Note: With Near Field Scanners you will discover a new and powerful way to “see” EMI!
- Technical Note: Advanced Microwave Topics for Quantum Physicists
- White Paper: A New Paradigm for the Classical to Quantum Computing Interface
Photonics, Fibre Optics and Lasers
- Quantum Computers: The Importance of Vibration Isolation
- Modular, mode-hop free solutions using external cavity Littman configurations
- Gimbal Piston Isolator Performance
- Laser Testing & Adaptive Options Solutions
- High Resolution Beam Characterisation - ISO Compliant M² in One Shot
- OptoTest releases continuous wave return loss & insertion loss meter
- OptoTest releases a aompact insertion loss & return loss test system
- AN-117 measuring insertion loss and return loss of hybrid cables in OPL-MAX
- OptoTest releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR integrating sphere
- OptoTest equipment provides the most accurate return loss measurements in the industry
- Introducing the latest innovation in fibre-optic MPO/MTP polarity testing solutions
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM)
- Ultra high resolution OSA for characterising and interrogating Fibre Bragg grating sensors
- Solid state lasers to cover the visible spectrum
- Time oomain phase derivative and time domain wavelength calculations
- CI Systems Newsletter November 2020
- Optical backscatter reflectometer (OBR) skew and strain measurements
- Attosecond Timing Distribution
- Photonic Analog to Digital Conversion
- Testing MTP®/MPO fibre assemblies: setups, troubleshooting & what to expect
- Direct CPA-Free Pulse Amplification
- How can you accurately test performance of hybrid cables?
- Measure latency in optical networks with Picosecond accuracy
- What is the value of shortwave infrared?