Knowledge Base
-
Sample Preparation and Electron Microscopy
-
Imaging – Micro to Macro
-
Metrology - Optics and Optical
-
Photonics, Fibre Optics and Lasers
-
Test and Measurement
-
Service and Services
Imaging – Micro to Macro
- Nikon metrology NV and Pixelink announce new strategic partnership
- Baumer wins the inspect award 2019 with its CX.I cameras
- NorPix announces the launch of StreamTouch
- Customer Testimonial: Closely monitored
- 48MP LX Cameras based on ams (CMOSIS) CMV50000
- Baumer expands the successful CX and EX camera series with ten new models
- The fastest streaming cameras are now shipping
- New 48 Megapixel xiB cameras from Ximea
- Sony Pregius CMOS cameras with 1 micron exposure time
- Sensors Unlimited launches low cost 320CSX Micro SWIR camera
- Sensors Unlimited Introduces fastest SWIR 2048-Pixel linescan camera to support medical diagnosis
- Non ITAR Micro-SWIR 640CSX camera
- What is USB 3.1?
- XIMEA releases camera models with Sony CMOS sensors and USB3
- Compliant list for Baumer industrial cameras - USB 3.0
- Foresight Imaging board provides high quality, real-time H.264 compression at up to 1080p 60Hz
- SCHOTT MHR®-50 a compact, metal halide light source
- Packaging and process troubleshooting
Metrology - Optics and Optical
- Zygo SmartSetup™
- Laser Interferometry – an enabling technology for optimised automated manufacturing
- A history of ZYGO optical profilers
- Optical Reflectometers – how do they compare?
- Vibration-tolerant interferometry
- Dynamic capability comes to (nearly) all new Zygo Verifire interferometers
- Scratches and digs – measure on curves and large areas now!
- New design for interference microscopy lenses wins Rudolf Kingslake Medal
- Zygo trade-ins & upgrades special offer for used metrology systems
- The Zygo Nexview™ - an optical profiler for all surfaces?
- Lambda appointed by CI Systems: for all your electro-optic testing needs
- CASE STUDY: Electric Vehicle Manufacturing and Precision Metrology
- Understanding surface texture parameters
- Measuring index and thickness of silicon thin films
- Measuring refractive index of liquids inside sealed containers
- Full area topography and thickness of sub-micron films
- Absolute Position Measurement: multiwavelength interferometry based sensor redefines precision position metrology
Sample Preparation and Electron Microscopy
- Large area ion milling with the Fischione M1062 TrionMill
- Lambda Photometrics Ltd partners with VSPARTICLE BV
- Bringing advanced automation to the forefront using tabletop SEM
- FEG vs. Tungsten source in a scanning electron microscope (SEM): what’s the difference?
- SEM: types of electrons, their detection and the information they provide
- SEM automation – the future of scanning electron microscopy
- SEM trends: what is next? Automated scanning electron microscopy
- Everything is nano these days
- Lambda Photometrics are now the sole distributor for E.A. Fischione, Inc., for the UK and Ireland.
- Buying a scanning electron microscope: how to select the right tabletop SEM
- Scanning electron microscope technology explained
- An introduction to electron microscopy
- How a desktop SEM saves lab operators a lot of time
- How SEM helps research polymers characteristics, properties and uses
- SEM and TEM: what's the difference?
- Benchtop SEM with integrated EDS revolutionising the world of structural analysis
- Functional conductive nanomaterials via polymerisation in nano-channels: PEDOT in a MOF
- Customer Testimonial: Monitoring pharmaceutical products with desktop SEM
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Merlin Palmar
- A firsthand experience with the VSP-P1 Nanostructured Material Printer - Joost van Ginkel
- New developments in spark production of nanoparticles
- Webinar: Scalable high-throughput electrocatalyst screening
- VSP P1 Nanostructured Material Printer – the ultimate tool for material development
- Accelerating material discovery through rapid material prototyping
- A paradigm shift in electrocatalyst synthesis
- Generating and depositing nanoparticles with a push of a button
- Enhancing SERS through nanostructured materials
- Particle analysis with the Phenom ParticleX AM Desktop SEM
- Catalysis Application Note: CO₂ hydrogenation
- Catalysis Application Note: Fuel cells research
- Catalysis Application Note: CO2 electroreduction
- Transmission Electron Microscopy (TEM) sample preparation
- What is additive manufacturing technology? How does the process work?
- How a microfabrication researcher uses SEM as a technique to verify nanoscale structures
- How next-generation composite materials are manufactured and analysed
- How to spot astigmatism in Scanning Electron Microscopy (SEM) images
- Why SEM is a valuable technique for nanoparticle characterisation
- SEM automation guidelines for small script development: simulation and reporting
- Nano mechanical imaging
- SEM automation guidelines for small script development: evaluation
- Sputter coating for SEM: how this sample preparation technique assists your imaging
- Automated scanning electron microscopy (SEM) imaging: how it's used
- SEM automation guidelines for small script development: image analysis
- Sample degradation during SEM analysis: what causes it and how to slow down the process
- Guidelines for small script development: image acquisition
- Battery research with a SEM: inspecting one layer at a time
- SEM working principle: the detection of backscattered electrons
- Preparation and property assessment of neat lignocellulose nanofibrils (LCNF) and their composite films
- How scanning electron microscopy is used for cosmetics research and development
- Scanning electron microscopy and pharmaceutical research topics
- SEM analysis of PVDF-HFP nanofibres for the fabrication of energy harvesters
- How SEM helps perform automated quality control on phosphate coatings
- How scanning electron microscopy fuels biomedical research
- Food science research: how scanning electron microscopy is used
- Emission stability in SEM thermionic electron sources: CeB6, LaB6 and W filaments
- SEM and fibre analysis for filtration systems quality control
- Imaging fibres with a SEM: how to obtain a flawless quality analysis
- Applications of Scanning Electron Microscope in pharmaceutical research field
- How SEM helps discover suitable corrosion inhibitors
- How engineers and researchers can boost polymers properties with SEM
- How SEM helps analyse morphologies for nanofibres efficiently
- Your sample has a secret — reveal it with a new point of view!
- Why the analysis of nanofibres requires a modern microscopy technique
- Magnification: is it the key to analyse your samples?
- Extract: Randomised clinical trial to evaluate changes in dentine tubule occlusion following 4 weeks use of an occluding toothpaste
- Customer Testimonial: Researching the chemical nature of production faults
- Automating a Laser Induced Damage Threshold test (LIDT)
- Customer Testimonial: Polymeric nanofibres, nanofibrous Layers, nanofibre yarns and nanoparticles
Service and Services
Test and Measurement
- Vibration Isolation for Cell Culture Incubators
- Re-defining Analog Signal Generation
- Tabor Electronics’ 4-channel RF signal generator reviewed by The Signal Path
- Webinar: Advanced microwave topics for Quantum Physicists
- Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
- SXRTO oscilloscopes explained
- Rigol MSO8000 series oscilloscope offers 2GHz analogue bandwidth and 7 Instruments in 1
- What is an FFT spectrum analyser?
- PicoScope 5000D Series: “The complete all-rounder”
- R&D 100 Award Winner: The SRS BGA244 binary gas analyser
- FS740 GPS time and frequency system
- Basics of acousto-optic devices
- Rigol’s new real-time spectrum analyser
- Why buying Stanford Research Systems from Lambda makes sense
- Technical and application notes for the SRS BGA244 binary gas analyser
- The BGA244 - 0.1% accuracy gas analyser for single and binary gas mixtures
- Pico Technology receives a Queen’s Award for Enterprise.
- Technical Note: How to Diagnose Board-Level Design Issues Using Very-Near-Field Measurements
- Technical Note: With Near Field Scanners you will discover a new and powerful way to “see” EMI!
- Technical Note: Advanced Microwave Topics for Quantum Physicists
- White Paper: A New Paradigm for the Classical to Quantum Computing Interface
Photonics, Fibre Optics and Lasers
- CI Systems Newsletter November 2020
- OptoTest releases continuous wave return loss & insertion loss meter
- OptoTest releases a aompact insertion loss & return loss test system
- AN-117 measuring insertion loss and return loss of hybrid cables in OPL-MAX
- OptoTest releases 16f MTP, Duplex LC, and CS Adapters for the OP-SPHR integrating sphere
- OptoTest equipment provides the most accurate return loss measurements in the industry
- Introducing the latest innovation in fibre-optic MPO/MTP polarity testing solutions
- Ultra High Resolution OSA: a perfect tool for optical Orthogonal Frequency Division Multiplexing (OFDM)
- Ultra high resolution OSA for characterising and interrogating Fibre Bragg grating sensors
- Solid state lasers to cover the visible spectrum
- Time oomain phase derivative and time domain wavelength calculations
- Optical backscatter reflectometer (OBR) skew and strain measurements