The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affordable system.

The MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select.

Bench-Top, High-Speed, High-Accuracy, Non-Contact 4D Surface & Thick-Film Profiler

The Plasma Monitor is a real-time broadband multichannel measurement system that allows to monitor plasma emission simultaneously in 200-1000nm wavelength range.

The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:

• Refractive index and birefringence of bulk materials
• Refractive index and thickness of thin films
• Optical waveguide loss