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Thin Film Thickness and Refractive Index
We provide a range of measurement systems including a Prism Coupler for measuring Thin Film Thickness and Refractive Index and a Spectroscopic technique for single and multilayer translucent film stacks. We can also provide refractive index measurement services over a wide range of ...
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Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M
The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:
- Refractive index and birefringence of bulk materials
- Refractive index and thickness of thin films
- Optical waveguide loss
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Optical Measurement Services - Refractive Index, Dispersion and dN/dT
Optical Measurement Services - Refractive Index, Dispersion and dN/dT Learn More -
MProbe Thin Film Measurement System
The MProbe system is a complete solution for measuring the thickness of single and multilayer translucent film stacks.
- Non-contact measurement
- Spectroscopic technique
- Multilayer film stacks
- 1nm to 1mm layer thickness (system dependent)
- Measure thickness, refractive index, surface roughness
- Cost effective solution
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