Thin Film Thickness & Refractive Index
We provide a range of measurement systems including a Prism Coupler for measuring Thin Film Thickness and Refractive Index and a Spectroscopic technique for single and multilayer translucent film stacks. We can also provide refractive index measurement services over a wide range of ...
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Thin Film Thickness & Refractive Index
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Plasma Monitor: Real-time Broadband Fibre Optics System
The Plasma Monitor is a real-time broadband multichannel measurement system that allows to monitor plasma emission simultaneously in 200-1000nm wavelength range.
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MProbe 40 Series: MSP
The MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select.
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MProbe 20 Series: Thin Film Thickness Measurement
The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affordable system.
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Optical Measurement Services - Refractive Index, Dispersion and dN/dT
Optical Measurement Services - Refractive Index, Dispersion and dN/dT -
Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M
The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:
- Refractive index and birefringence of bulk materials
- Refractive index and thickness of thin films
- Optical waveguide loss