Characterisation, Measurement & Analysis
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Thin Film Thickness and Refractive Index

Thin Film Thickness and Refractive Index

We provide a range of measurement systems including a Prism Coupler for measuring Thin Film Thickness and Refractive Index and a Spectroscopic technique for single and multilayer translucent film stacks. We can also provide refractive index measurement services over a wide range of ...
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  1. Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

    Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

    The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:

    • Refractive index and birefringence of bulk materials
    • Refractive index and thickness of thin films
    • Optical waveguide loss
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  2. Optical Measurement Services - Refractive Index, Dispersion and dN/dT

    Optical Measurement Services - Refractive Index, Dispersion and dN/dT

    Optical Measurement Services - Refractive Index, Dispersion and dN/dT Learn More

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  3. MProbe 20 Series

    MProbe 20 Series: Thin Film Thickness Measurement

    The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affordable system.

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  4. MProbe 40 thin film measurement system

    MProbe 40 Series: MSP

    The MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select.

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  5. Plasma Monitor: Real-time Broadband Fibre Optics System

    Plasma Monitor: Real-time Broadband Fibre Optics System

    The Plasma Monitor is a real-time broadband multichannel measurement system that allows to monitor plasma emission simultaneously in 200-1000nm wavelength range.

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