Semiconductor Curve Tracer Parametric Tester
Semiconductor Curve Tracer Parametric Tester
A wide range of curve tracers and parametric testers for the semiconductor industry. Advanced equipment features an SMU up to 10kV and 2 kA, with support for pulse output, gate pattern control and fA measurement. Ideal for wide-bandgap devices such as SiC and GaN.
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IWATSU Semiconductor Curve Tracer CS-8000 Series
The IWATSU CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
- Up to 5kV, 2000A High-Power Test
- Accurate very small current Measurement (resolution 250fA）
- Large 12.1-inch Touch Screen
- Variety of GATE Signal Output
- Enhanced Temperature Characteristic Measurement Option
- On-Wafer High-Power Testing with Wafer-Prober
