IWATSU Electric Co Ltd, founded in 1938 in Tokyo, offers a wide range of curve tracers and parametric testers for the semiconductor industry. Their advanced equipment features a Source Measure Unit (SMU) capable of delivering up to 5 kV and 2 kA, with support for pulse output, gate pattern control, and microcurrent measurement. These capabilities make IWATSU's solutions especially well-suited for design evaluation of wide-bandgap semiconductors such as SiC (Silicon Carbide) and GaN (Gallium Nitride).
The IWATSU CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
Up to 5kV, 2000A High-Power Test
Accurate very small current Measurement (resolution 250fA）
Large 12.1-inch Touch Screen
Variety of GATE Signal Output
Enhanced Temperature Characteristic Measurement Option
