IWATSU Electric Co Ltd, founded in 1938 in Tokyo, offers a wide range of curve tracers and parametric testers for the semiconductor industry. Their advanced equipment features a Source Measure Unit (SMU) capable of delivering up to 5 kV and 2 kA, with support for pulse output, gate pattern control, and microcurrent measurement. These capabilities make IWATSU's solutions especially well-suited for design evaluation of wide-bandgap semiconductors such as SiC (Silicon Carbide) and GaN (Gallium Nitride).
The IWATSU CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
Up to 5kV, 2000A High-Power Test
Accurate very small current Measurement (resolution 250fA）
Large 12.1-inch Touch Screen
Variety of GATE Signal Output
Enhanced Temperature Characteristic Measurement Option
Automate measurement and improve efficiency. In the past, many items had to be set manually, meaning that measurements took a long time, but by adopting the , it is possible to easily automate measurements, and furthermore, the measurement details can be saved as evidence. In addition, automatic judgment is also possible by setting the threshold value in advance.
Advantages of adoption:
Make accurate and reliable measurements according to the measurement procedure
Measurement content is also saved as evidence
Auto-judgment is also possible
Control of optional products can also be automated (e.g. temperature control of hot plate)
