MProbe 20 Series: Thin Film Thickness Measurement
The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affordable system.
The system is user friendly and easy to setup – you will be ready to start measurements right away. Everything is included for samples measurement: spectrometer/ light source (main unit), fibre optics probe, sample stage, software, calibration/reference sample.
Our extensive materials library has 500+ materials. New materials can be easily imported or created/added to the library. Support for a wide range of parameterised materials (from Cauchy to Tauc-Lorentz, etc.) is included.
One-click measurement combines data acquisition and data analysis.
For advanced users, we have all the sophisticated tools including sensitivity analysis, error-estimator, simulation, filmstack switching, global optimisation, layers and materials linking, etc. that can be used for advanced applications development.
Reflectance and transmittance spectral data can also be used as a raw measurement (for example, as in spectrophotometer) or for a wide range of other applications e.g. chemical concentration (we have a range of flow cells), filters and coating testing, etc.
Why use MProbe
Flexible: select the best hardware configuration for your application
Affordable: up to 50% savings as compared to other commercial instruments
Precision: unmatched precision <0.01nm or 0.01%
Materials database: extended database (500+ materials) is included
Software: flexible, user friendly and powerful software; integrated control/data acquisition and data analysis; any filmstack: no limits on number of layers, support inhomogeneous and thick incoherent layers, surface roughness, multi-sample analysis, etc.
Integration: several integration options are available: Modbus TCP, OPC (DA 2.0/3.0), custom options
Technical support: application and technical support
What’s in the box?
- Main unit (includes spectrometer(s), light source, electronics)
- Reflectance probe
- Sample table with reflectance probe holder
- TFCompanion -R software Advanced version (USB dongle (license key), Software, user guide and other materials on USB memory stick )
- Calibration set: reference wafer (Si or Al depending on the model, or/and Quartz plate (optional)) and black absorber/pad
- Test sample- 200nm oxide wafer
- USB cable (connecting main unit to computer)
- Universal power adapter (110V/220V)
In addition, MProbe includes the following Semiconsoft advantages:
- Library with over 500 materials and support for parameterised materials
- 12 months of free software updates and application support
- Hardware upgrade program
System model can be selected based on the required thickness and/or wavelength range. Custom configurations that combine features of different models are available on request. Please let us know your application and we will offer a solution
Basic Specification
Precision |
Accuracy |
Stability |
Spot Size |
Sample Size |
0.1Å or 0.01% (greater of) |
0.2% or 10A (greater of) |
stability 0.2A or 0.02% (greater of) |
2mm standard (optional to 20µm) |
from 4mm |
s.d. of 100 thickness reading of 100nm SiO2/Si calibration sample |
filmstack dependent |
2 sigma over 20 days (100 measurements daily) on 100nm/Si calibration sample |
System Configurations
Model |
Wavelength range(nm) |
Spectrometer/Detector |
Lightsource |
Thickness |
Vis |
400-1100 |
Spectrometer F4/Si CCD 3600 pixels/ ADC- 16 bit |
Tungsten-Halogen |
15nm- 75µm |
UVVisSR |
200-1100 |
Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit |
Deuterium/Tungsten-Halogen |
1nm-75µm |
HRVis |
700-1000 |
Spectrometer F4/Si CCD 2048 pixels/ ADC- 16 bit /resolution |
Tungsten-Halogen |
1µm-400µm |
UVVis-RT |
200-1000 |
F4/Si CCD 2048 pixels/ ADC 16 bit/Optical Switch(Reflectance & Transmittance) |
Tungsten-Halogen |
1nm-75µm |
NIR |
900-1700 |
F2 Spectrometer InGaAs CCD 512 pixels: ADC- 16 bit |
Tungsten-Halogen |
50nm- 85µm |
VisNIR |
400-1700 |
Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and F2 InGaAs 512 pixels PDA) /ADC- 16 bit |
Tungsten-Halogen |
10nm- 85µm |
UVVis-NIR |
200-1700 |
Two spectrometer channels/ detectors (F4 Si 3600 pixels CCD and InGaAs 512)/ ADC – 16 bit |
Deuterium/Tungsten-Halogen |
1nm-85µm |
VisXT |
800-870 |
F4 spectrometer/Si 2048 pixels CCD |
Tungsten-Halogen |
10µm-1400 µm |
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