PHOTON RT UV-VIS-NIR Spectrophotometer

The configuration of the PHOTON RT spectrophotometer in many respects changes the approach to the simplicity, versatility and speed of measurements. Unlike other instruments on the market, measurement of absolute reflection and transmission at variable 0-75 degree angles and S/P polarisation is carried out unattended and without any additional fixtures or assemblies.

Using an original optical design with the reference channel provides for a vast range of possibilities including measurements at different angles of incidence and calculation of the optical density in the range 0-4 (D). The minimum size of parts is 12x10mm, while the maximum can be up to 120mm in diameter.

Extensive QA/QC analysis, research and development of advanced thin film materials is supported with the built-in determination of refractive index dispersion, absorption index and layer thickness (n.k.d. parameters) in the UV-Vis-NIR range with spectrophotometric reverse engineering. The PHOTON RT spectrophotometer ensures accurate measurements with a spectral resolution up to 1.2 nm and photometric accuracy up to 0.0002 in transmission mode meeting the modern requirements for demanding R&D applications and routine control tests.

The powerful configuration of the instrument fits into a compact housing and is very convenient both for routine and sophisticated QA/QC procedures. The instrument’s housing has a large lid providing easy access to the measuring compartment, allowing the optical part to be easily placed on the sample table.

APPLICATIONS:

• Polarising and beamsplitters cubes, X-cubes
• Broadband antireflective coatings
• Laser mirrors and standard flat mirrors
• Interference filters:

- Long pass

- Shortpass

- Dichroic

- Multi-band coatings

• Prisms and wedges

FEATURES AND CAPABILITIES (no external assemblies are required):

• Unique wavelength range configuration up to 190-5200 nm
• Build-in broadband high-contrast polarisers covering 220-5200 nm wavelength range
• Unique polariser configuration: S, P, S+P+(S+P)/2, Random and user-defined S:P ratio for incident beam
• Absolute specular reflectance measurement (R, Rs, Rp) for 8-75 deg AOI
• Transmittance measurement (T, Ts, Tp) for 0-75 deg AOI
• Unattended measurement and calculation of random polarisation T(s+p)/2 and R(s+p)/2
• Absorptance measurement of bare substrates
• Built-in beam displacement compensation for angular transmittance measurement of thick samples at high angles
• Unattended batch measurements of single and multiple samples
• Determination of complex refractive index and layer thickness (n.k.d. parameters) for single-layer homogeneous coatings
• Average R and T values for user-selected wavelength range
• Integral R and T values adjusted for Type A illumination source and spectral sensitivity of human eye
• Optical density of the sample, 0 – 4 (D)

Warranty: 2 years

Awards

2011 Best Innovative Product Medal
7th International Forum Optics-Expo 2011, October 2011, Moscow, Russia

2012 Laser Association Best Product Award 
7th International Exhibition "Photonics, World of Lasers and Optics 2012", April 17-20, 2012, Moscow, Russia. Nomination: "Laser technologies and instruments for technical measurements, diagnostics, process control and communication"