› EUR (Europe) Ask a question regarding a product
Lets the user request a quote for certain projects
The configuration of the PHOTON RT spectrophotometer in many respects changes the approach to the simplicity, versatility and speed of measurements. Unlike other instruments on the market, measurement of absolute reflection and transmission at variable 0-75 degree angles and S/P polarisation is carried out unattended and without any additional fixtures or assemblies.
Using an original optical design with the reference channel provides for a vast range of possibilities including measurements at different angles of incidence and calculation of the optical density in the range 0-4 (D). The minimum size of parts is 12x10mm, while the maximum can be up to 120mm in diameter.
Extensive QA/QC analysis, research and development of advanced thin film materials is supported with the built-in determination of refractive index dispersion, absorption index and layer thickness (n.k.d. parameters) in the UV-Vis-NIR range with spectrophotometric reverse engineering. The PHOTON RT spectrophotometer ensures accurate measurements with a spectral resolution up to 1.2 nm and photometric accuracy up to 0.0002 in transmission mode meeting the modern requirements for demanding R&D applications and routine control tests.
The powerful configuration of the instrument fits into a compact housing and is very convenient both for routine and sophisticated QA/QC procedures. The instrument’s housing has a large lid providing easy access to the measuring compartment, allowing the optical part to be easily placed on the sample table.
APPLICATIONS:
- Polarising and beamsplitters cubes, X-cubes
- Broadband antireflective coatings
- Laser mirrors and standard flat mirrors
- Interference filters:
- Long pass
- Shortpass
- Dichroic
- Multi-band coatings
- Prisms and wedges
FEATURES AND CAPABILITIES (no external assemblies are required):
- Unique wavelength range configuration up to 190-5200 nm
- Build-in broadband high-contrast polarisers covering 220-5200 nm wavelength range
- Unique polariser configuration: S, P, S+P+(S+P)/2, Random and user-defined S:P ratio for incident beam
- Absolute specular reflectance measurement (R, Rs, Rp) for 8-75 deg AOI
- Transmittance measurement (T, Ts, Tp) for 0-75 deg AOI
- Unattended measurement and calculation of random polarisation T(s+p)/2 and R(s+p)/2
- Absorptance measurement of bare substrates
- Built-in beam displacement compensation for angular transmittance measurement of thick samples at high angles
- Unattended batch measurements of single and multiple samples
- Determination of complex refractive index and layer thickness (n.k.d. parameters) for single-layer homogeneous coatings
- Average R and T values for user-selected wavelength range
- Integral R and T values adjusted for Type A illumination source and spectral sensitivity of human eye
- Optical density of the sample, 0 – 4 (D)
Warranty: 2 years
Awards
2011 Best Innovative Product Medal
7th International Forum Optics-Expo 2011, October 2011, Moscow, Russia
2012 Laser Association Best Product Award
7th International Exhibition "Photonics, World of Lasers and Optics 2012", April 17-20, 2012, Moscow, Russia. Nomination: "Laser technologies and instruments for technical measurements, diagnostics, process control and communication"
Additional Information
|
Parameter |
Value / Decription |
|
OPTICAL CONFIGURATION |
|
|
Optical scheme of monochromator |
Cherny-Turner |
|
Optics |
Mirror, Al+SiO2, AI+MgF2 |
|
Reference channel |
Yes |
|
Wavelength sampling pitch, nm |
0,25 to 100 |
|
Wavelength scanning speed, nm/min |
3000 (at 5 nm wavelength sampling pitch) |
|
Spot size, mm |
6х2 |
|
Photomentric functions |
%T, %R |
|
Variable angle measurement |
Transmittance: 0°-75° AOI Specular reflectance: 8°-75° AOI |
|
Tuning pitch angle of sample table |
0,01˚ |
|
Tuning pitch angle of photodetector |
0,01˚ |
|
Effective wavelength range, nm (instrument configuration options) |
185-1700, 185-3500, 190-4900, 380-1700, 380-3500, 380-5200. |
|
Ultimate Spectral resolution, nm * |
|
|
Wavelength accuracy, nm |
+/- 0,24 |
|
Wavelength repeat accuracy, nm |
+/- 0,12 |
|
Scattered light level, % min (@ 532 nm) |
< 0,2 |
|
Angle of beam divergence |
+/- 1º |
|
Photometric accuracy |
Certified according to NIST SRM 930: +/- 0.003 Abs (1 Abs) Certified according to NIST SRM 1930: +/- 0.003 Abs (0.33 Abs), +/- 0.006 (2 Abs) |
|
Photometric repeat accuracy |
Certified according to NIST SRM 930: 0.0004 Abs (1Abs) Certified according to NIST SRM 1930: 0.0001 Abs (0.33 Abs), 0.005 (2 Abs) Determined using 0.1-second accumulation, maximum deviation for 10 subsequent measurements |
|
Stability of baseline (UV-VIS), %/hour |
0,1 (1 hour warm-up time) |
|
Light sources |
Halogen lamp, Deuterium lamp, Hg-Ar wavelength verification calibration lamp |
|
Built-In broadband high-contrast polarisers, unattended operation |
S, P, S+P+(S+P)/2, Average, user-defined S:P ratio for incident beam. Wavelength ranges: 380-2200 nm, 220-2200 nm, 220-5200 nm, 380-5200 nm |
|
SAMPLE COMPARTMENT |
|
|
Sample table |
For measuring reflection and transmission of plane samples larger than 12x10 mm |
|
Independent setting |
Independent positioning for the sample table and photodetectors unit |
|
Synchronised setting |
Synchronised positioning for the sample table and photodetectors unit depending on the mode of measurement (R or T). |
|
Size of samples |
For angles of incidence less than 0-10 deg. - larger than 12х10 mm |
|
USER INTERFACE, WEIGHT AND DIMENSIONS |
|
|
Interface |
USB 2.0 |
|
Power consumption, VA |
110 |
|
Power input |
110/220 VAC, 50/60 Hz |
|
Dimensions Width x Depth x Height, mm (inches) |
420 х 610 х 270 (16.5" x 24" x 10.5") |
|
Net weight, kg (lbs) |
45 kg (99 lbs) |
|
Supply set |
PHOTON RT Spectrophotometer, Operation manual, USB cable, power cable, Software package, spare halogen lamps. |
EssentOptics Photon Spectrophotometer datasheet Customer Reviews
Write Your Own Review
| Photo | Product | |
|---|---|---|
|
LINZA 150 Spectrophotometer for Lenses and Lens Assemblies | › |
