SEM cross section contaminated during EBSD analysis (left); after plasma cleaning (right).

Successful imaging and analyses depends upon the quality of the sample preparation. An integral step in the sample preparation to imaging workflow is contamination removal. The simplest and most effective method for removing surface contamination is plasma cleaning, which removes hydrocarbons without causing sample damage. By integrating plasma cleaning into the electron microscopy workflow, imaging and accuracy of compositional microanalysis are enhanced. 

In this webinar, we will demonstrate how plasma cleaning is a critical step in the sample preparation and imaging workflow. We will show:

  • prevention and removal of contamination from TEM specimens;
  • removal of contamination build-up from SEM samples; and
  • surface modification of carbon supports for biological applications and cryo-EM.

Click HERE to register.