Technical Notes

  1. New developments in spark production of nanoparticles

    T.V. Pfeiffer, J. Feng, A. Schmidt-Ott Department of Chemical Engineering, Delft University of Technology, Delft 2628 BL, Netherlands The paper selects a number of recent developments in spark production of nanoparticles that are important for production of nanopowders and nanoparticulate materials. It explains the method, including recent improvements, and refers to theoretical considerations as well as practical experience in controlling...
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  2. SEM: types of electrons, their detection and the information they provide

    Electron microscopes are very versatile instruments, which can provide different types of information depending on the user’s needs. In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide. As the name implies, electron microscopes employ an electron beam for imaging...
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  3. How next-generation composite materials are manufactured and analysed

    The technical specifications of next-generation materials are taking our technology to a completely new level, allowing us to create products with outstanding properties that were impossible to achieve in the past. These materials are the result of a huge drive toward innovation in material science and could only be achieved because of the invention of the first composite materials and...
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  4. How to spot astigmatism in Scanning Electron Microscopy (SEM) images

    You may have heard of astigmatism as a medical condition that causes visual impairment in up to 40% of adults , but how is this applicable to electron microscopy? First of all, let’s talk about what the word astigmatism, in fact, means: It is derived from the negative prefix ‘a’ (without) + ‘stigmat-’ (mark, or point, in Ancient Greek...
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  5. Measure Latency in Optical Networks with Picosecond Accuracy

    In optical networks where action on a message or signal is time critical, latency becomes a critical design element. Latency in communications networks is comprised of the networking and processing of messages, as well as the transmission delay through the physical fibre. Measuring and optimising this optical transmission delay can be critical in diagnosing latency issues in a data centre...
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  6. Everything is nano these days:

    To improve the world of nanotechnology we make extremely fast SEM imaging and analysis accessible to everyone Imaging with a Scanning Electron Microscope (SEM) is a powerful tool for any materials scientist, though historically, accessing the technique was an issue. SEM involved using large, expensive systems that were only available to large research institutions. Even then, access was often difficult...
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  7. SEM automation guidelines for small script development: simulation and reporting

    Scripts are small automated software tools that can help a scanning electron microscope (SEM) user work more efficiently. In my previous blogs, I have explained how we can use the Phenom SEM with the Phenom programmable interface (PPI) to automate the process of acquiring, analysing and evaluating images. In this blog, I will add the Phenom PPI simulator to that and...
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  8. What is an FFT Spectrum Analyser?

    FFT Spectrum Analysers, such as the SRS SR760, SR770, SR780 and SR785, take a time varying input signal, like you would see on an oscilloscope trace, and compute its frequency spectrum. Fourier's theorem states that any waveform in the time domain can be represented by the weighted sum of sines and cosines.The FFT spectrum analyser samples the input signal, computes...
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  9. SEM automation guidelines for small script development: evaluation

    Scripts are small automated software tools that can help a scanning electron microscope (SEM) user work more efficiently In my previous two blogs, I wrote about image acquisition and analysis with the Phenom Programming Interface (PPI). In this blog I will explain how we can use the physical properties we obtained in the last blog in the evaluation step. SEM...
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  10. Buying a scanning electron microscope: how to select the right SEM

    You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long. You have made your case that your company could significantly improve their...
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