Tuesday, 18 February at 6:00pm - 7:00pm GMT Join Fischione Instruments and NanoElectronic Imaging to learn more about a significant advancement in specimen preparation for STEM EBIC failure analysis. Electrical characterization and transmission electron microscopy (TEM) are crucial for semiconductor failure analysis. The scanning TEM electron beam-induced current (STEM-EBIC) imaging method integrates these techniques by performing electrical characterization at each STEM image pixel...
Lambda News
Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.
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Transmission Kikuchi Diffraction Analyses
Sample preparation techniques for large-area data acquisition Large-area transmission Kikuchi diffraction (TKD) analysis of nanostructured nickel. Inverse pole figure (IPF) color-coded orientation maps with 8 nm twin boundaries are shown. Data was collected from defect-free, ultrathin ~40 nm samples with a maximum of three grain layers. TKD analyses condition: 30 kV acceleration voltage and 1.6 nA beam current. To achieve optimal... -
EMC and Compliance International
19-21 May 2025 St Anne’s College, Oxford Universary,56 Woodstock Road, Oxford OX2 6HS he conference offers a dynamic platform for sharing the latest innovations and techniques in EMC, radio engineering, functional safety, electrical safety, and compliance. Featuring keynote sessions, workshops, tutorials and trainings, we’ll cover a broad range of topics, including measurement techniques, design for EMC, troubleshooting, and EMC for... -
UK Semiconductor 2025
2-3 July 2025 Owen Building, Sheffield Hallam University The UK Semiconductors Conferences was established in 2006 and we are the UK’s annual conference in Semiconductor Research. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting. -
Engineering Design Show 2025
8-9 October 2025 Coventry Building Society Arena EDS is THE show for design engineers looking for direct access to the sector's latest products, services, and innovations. Visitors can explore hundreds of UK and international suppliers, including those for CAD software, product design, mechanical design, and more. Alongside the exhibition, conference sessions and workshops will provide topical content on the challenges and opportunities for the engineering... -
MMC2025
1-3 July 2025 Manchester Central, Manchester The Microscience Microscopy Congress is back for 2025! One of the biggest events of its kind in Europe, mmc2025 incorporating EMAG 2025 will bring you the very best in microscopy, imaging and cytometry from across the globe. With six parallel conference sessions, a world-class exhibition, workshops, satellite meetings, an international Imaging Competition and more... -
ChemUK 2025
21-22 May 2025 NEC Birmingham, Hall 5 FREE TO ATTEND - The UK's largest Expo supporting the R&D, Engineering, Sourcing, Manufacturing & Management of chemicals & formulated products. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting. -
Farnborough International Space Show 2025
19-20 March 2025 Farnborough International Exhibition & Conference Centre Farnborough International Space Show connects the global space community across industry, defence, government and academia. The UK’s largest international and must-attend event in the aerospace calendar. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting. -
Roughness Measurements — Let’s Take a Closer Look
Surface roughness refers to the fine texture of a part’s surface. Every manufactured part’s surface has three key components—form, waviness, and roughness. Together, they influence how well a part performs. The characteristics of these components are tied to the manufacturing process or processes used to create the part. This could be polishing, grinding, cutting, or edging to name a few.Surface... -
Innovations in Vibration Control: Enhancing Semiconductor Manufacturing Efficiency
Moving stages are essential but challenging components in semiconductor and nanotechnology manufacturing. These stages, used in wafer inspection, lithography, metrology ,and other applications can cause significant vibration that can affect tool performance and throughput if it is not mitigated properly.In this interview, Elias Brassitos, Senior Control Systems Engineer at AMETEK, talks to AZoMaterials about these challenges and solutions. TMC works...