Oscilloscopes are essential tools for engineers, technicians, and researchers working with electronic signals. Choosing the right oscilloscope and understanding its technical specifications can significantly impact measurement accuracy and efficiency. This FAQ addresses some of the most important aspects of oscilloscope performance and application. General QuestionsWhat is an oscilloscope?An oscilloscope is an electronic test instrument used for observing the precise shape...
Lambda News
Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.
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STT-MRAM device - Preparing specimens for imaging and analysis
Plan view TEM specimens from a fully fabricated spin-transfer torque magnetic random-access memory (STT-MRAM) device were prepared using a Ga FIB system. Post-FIB concentrated Ar ion beam milling using the Model 1080 PicoMill® TEM specimen preparation system of these plan view TEM specimens allowed controlled thinning and produced artifact-free TEM specimens. FIB plan view specimen preparation followed by concentrated Ar... -
WEBINAR: An easier, faster, and more accurate Ar ion milling technique for TEM specimen preparation
Join us for a webinar where we introduce an advanced Ar ion milling technique designed to make your work easier, faster, and more accurate. Click here to view a recording of the event. Traditional Ga focused ion beam (FIB) and Xe plasma FIB milling often cause amorphization and leave ion-implanted layers on TEM specimens. Fischione Instruments’ NanoMill® TEM specimen preparation system has... -
Shock Deformation Studies
Shear band and dynamic recovery of hexagonal close-packed materials.Mg corrodes very quickly when in contact with water, therefore it requires special precautions during mechanical and electrolytic polishing. Mg is also a very soft, which makes it difficult to obtain a deformation-free surface using standard sample preparation techniques. An alternative technique is to use broad ion beam milling, such as Fischione Instruments’ Model... -
Preparing thin films on silicon nitride-type TEM grids for atomic resolution imaging
Achieving atomic-resolution microscopy of Al-Cu thin films on electron-transparent silicon nitride TEM grids is hindered by the limitations of conventional preparation techniques. Dimpling, grinding, and standard ion milling are incompatible with the grid's fragile and stressed silicon nitride window. Additionally, the focused ion beam (FIB) lift-out technique risks rupturing the stressed windows, which can cause specimen loss. Ga contamination during FIB... -
LAS™ Lens Alignment Technology - The Basics
The Optical Alignment Lens Alignment Station (LAS™) employs a focused laser beam in reflection to measure the surface decenter and tilt. Following reflection from the lens surface, the laser beam is focused to a bright spot on the LAS™ camera at two distinct vertical locations - Normal (or Cat’s Eye) and Confocal. The Normal signal occurs when the focused laser reflects directly from the... -
Lambda Drop-in Day - EpiCentre Haverhill - 16th April 2025
Lambda Photometrics are thrilled to be working in close collaboration with the EpiCentre Haverhill in arranging the Lambda Drop-In Day taking place in the Boardroom. Lambda Product Specialists Trevor Groves, Jay Goho and Anthony Holland will be present to introduce you to a whole range of highly innovative solutions, provide live product demonstrations, and discuss specific applications & requirements. The... -
Defense Electronics: Using Next-Gen AWG/T in Aerospace and Defense
The aerospace and defense (A&D) industry is constantly evolving - new requirements and specifications to counter the next set of adversarial threats drive the need for advanced solutions and architectures. Defense electronics and the industry that serves this market always needs to be one step ahead, providing high precision instrumentation, subsystems and components for Radar, Electronic Warfare, Satellite and Communications... -
Gimbal Piston™ Air Isolators Overcome a Magnitude 5.0 Earthquake
Kenneth Bart, Director of the Microscopy & Imaging Facility at Hamilton College, Clinton, NY, was testing a sample preparation protocol when a magnitude 5.0 earthquake struck. At that moment he was using an environmental scanning electron microscope (ESEM) isolated on a TMC Floor Platform with Gimbal Piston™ air isolators to collect an image of a hydrated specimen of a firefly... -
Optical Profilers in an Argon Chamber Environment
Did you know that you can now use Zygo Optical Profilers within argon chambers? This groundbreaking capability allows for precise metrology in controlled argon environments, commonly referred to as Argon Gloveboxes. This unique and thoroughly tested feature enables optical profiling under argon conditions, opening new possibilities for research and manufacturing applications. Argon chambers are indispensable tools in various research and...