Anne Fallon

20 Mar 2012

Lambda Photometrics now provide a comprehensive range of equipment and measurement services for thin film characterisation and refractive index determination.

Click here for more information.

Metricon’s 2010/M instrument measures thickness and refractive index of thin films (~0.4 to 50 microns) using a prism coupling technique. It can also measure bulk refractive index at a number of specific laser wavelengths to yield Abbe Number and dispersion information. In addition measurement of liquids, polymers, waveguide loss, dual films and many more sample types is possible. For more information click here.

SemiconSoft’s MProbe system measures the thickness of single and multilayer translucent film stacks. It is uses a non-contact spectroscopic technique and can be configured to measure layer thicknesses from 1nm to 1mm. Powerful multilayer thin film software is supplied with each system allowing complete modelling and measurement flexibility. Laboratory, at-line and on-line measurement solutions can all be developed with the same equipment. For more information click here.

From M³ Measurement Solutions, we offer a measurement service for characterising refractive index, dispersion and dn/dT of optical materials.

• Wavelength range: 350nm to 14µm
• Temperature range: 77°K to 373°K

This service is particularly useful for manufacturers of optical glasses, chalcogenide glasses, crystals and plastics as well as manufacturers and designers of optical components and systems. Accurate knowledge of these critical parameters can be the key to an optical system performing well in a real world environment. For more information click here.

We have demonstration Metricon and SemiconSoft systems available for evaluation, so please contact us for solutions to your Thin Film Thickness and Refractive Index measurement needs.

For further information and assistance, click here to email or contact: Matthew Ball on 01582 764334

18 Jan 2012

We are delighted to announce Lambda Photometrics has been appointed the new UK & Ireland representative for CI Systems Electro-Optics Division. 

CI Systems have built up a solid reputation as a leading manufacturer of highly accurate and reliable Electro-Optic Test equipment for defence, scientific and industrial use. Customers include all the leading prime contractors, organisations and companies working in this field.

With a comprehensive line-up of standard products we can offer a "one-stop shop" for all E-O testing and remote sensing needs.

• Blackbodies & IR Targets
  
• Collimators & FLIR testers
  
• Laser Testers
  
• Multi-Sensor Payload Testers
  
• IR Field Testers
  
• Boresight Systems
  
• Missile Warning System Testers
  
• IR Simulators
  
• Remote Sensing Radiometers
  
• Customised E-O Test Systems
  
• Automatic Test Software  

For customised solutions, we can utilise the experience of CI's team of physicists, engineers and software experts, working together with customers to ensure projects are delivered to specification, on time and within budget.

We look forward to supporting the needs of all existing and future CI Systems customers in the UK & Ireland.

For more information, please check out our Electro-Optic Testing pages.

For further information and assistance, please contact Matthew Ball on 01582 764334 or click here to email 

20 Oct 2011

Zemetrics, Inc., a Zygo Corporation company, introduces the ZeGage™ non-contact optical profiler for quantitative shop floor measurements of 3D form and roughness on precision machined surfaces.

The ZeGage™ profiler eliminates the need for vibration isolation or specialized enclosures, resulting in footprint reduction, cost savings and increased ease of use. The industry-ready design produces fast, accurate metrology in a compact, cost-effective package. The ZeGage™'s proprietary SureScan™ technology enables high precision non-contact surface metrology while providing fast and accurate measurements in vibration-prone factory floor production environments.

Additionally, the ZeGage™ profiler offers an easy to use through-the-lens focus aid for rapid part setup, and a heavy-duty sample stage with standard T-slots for part fixturing and optimal gauge-capable metrology. System versatility and areal measurements are enhanced with a wide range of field-of-view options, including manual or motorized turret options for mounting multiple objective lenses. A standard high-resolution 1 million pixel image sensor provides excellent surface detail and visualization.

Windows® 7 64 bit-based ZeMaps™ analysis software, included with the ZeGage™ profiler, provides extensive 2D and 3D data analysis including form, step-height, and ISO/DIS 25178 compliant surface roughness parameters. ZeMaps™ interactive visualization tools enable fast, easy and thorough process characterization for a wide variety of surface metrology applications.

Commenting on the ZeGage™ profiler functionality, John Roth, Zygo’s Director, Profiler Marketing, said “The ZeGage™ profiler is a major advance in 3D optical metrology, delivering performance, price and productivity to a wide range of industries, enabling the transition from contact, 2D instruments to the next-generation of affordable non-contact, 3D instruments. This system offers superior ease-of-use, speed, repeatability and accuracy, without surface contact or concern for environmental vibrations. With these unique advantages, the ZeGage™ profiler outperforms incumbent and competing technologies such as mechanical stylus profilometers.”

With applications in industrial manufacturing, R&D, quality inspection, failure analysis and more, the ZeGage™ profiler provides advanced surface metrology for control of precision machining and micro-moulding processes across a wide range of industries, including automotive, medical and consumer electronics.
 
Click here for further details.

Please contact us for more information and to arrange a demo: click here to contact us by email or call:
 
Graeme Gibbons or David Chambers on 01582 764334

31 Oct 2011

Lambda Photometrics is pleased to be offering the unique measuring services of M³ Measurement Solutions

M³ Measurement Solutions provide measurement services for materials used for near to far infrared applications as well as down to the UV. They provide Refractive Index and Dispersions measurement services. They also provide RI as a function of temperature down to cryogenic temperatures to give dn/dT data. Optical materials which can benefit from such measurements include Silicon, Germanium, Zinc Sulphide, and Zinc Selenide as well as Chalcogenide glasses.

Through the combination of high-end precision technology and intelligent software design, M³ (M Cubed) optics metrology department now offers the following measurements:

Tests

•    Index of Refraction (RI)
•    dn/dT (Refractive Index vs. Temperature Measurement)
•    Dispersion (Refractive Index vs. Wavelength Measurement)
•    Birefringence (Refractive Index Measurement of Anisotropic Materials)

All of M³ instruments are calibrated and NIST traceable. M³ are currently in process of performing validation measurements with a SRM (Standard Reference Material) from NIST.

Measurement Ranges

M³ provides refractive index measurements at wavelengths from 350nm to 14um, and temperature ranges from 77°K to +100°C (373°K).

Measurement Method

Refractive index is measured via a modified minimum deviation technique. In utilizing this technique, a small prism must be manufactured from the material under test. M³ can sub-contract the prism manufacture or work with customers who wish to supply the finished prism substrate themselves.

Data

M³ can provide data in many different formats depending on your specific needs. M³ can supply various types of curve fitting and dispersion algorithms (e.g. Herzberger, Schott, Sellmeier etc). Full reports can be provided in Power Point, Word, PDF, and Excel formats.

Accuracies

M³ can reach accuracies to the fourth and fifth decimal place depending on material type and sample configuration.

To discuss your measurement requirements please contact Matthew Ball or Ken Middleton on 01582 764334.

For more information on our products and services relating to Refractive Index and Thin Films click here to visit our webpage.

15 Jun 2011

The Glacier T™ from B&W Tek is a new high resolution lab-grade TE-cooled CCD array mini spectrometer, specifically pre-configured for demanding Raman applications. With your choice of either 532nm or 785nm excitation, Glacier T is a robust and cost-effective solution for all members of the Raman community, whether in academia or industry.

Measuring only 200x100x100mm, Glacier T is one of the most compact TE cooled high resolution mini Raman spectrometers on the market, making it ideal for OEM partners developing next generation portable products. The small size does not compromise an impressive pre-configured specification, with spectral resolution as fine as 3 cm-1 over a range of up to 4000cm-1.

B&W Tek's proprietary TE Cooling technology allows the signal to be integrated for sufficient time to accumulate measurable spectra, without being saturated by dark noise. TE Cooling, combined with the Glacier T's fast F/2 spectrograph, makes it ideal for high performance modular Raman spectroscopy as well as for integration into larger systems.

The Glacier T – a highly cost effective lab-grade TE cooled Raman spectrometer, pre-configured to make your job easier. Please contact us for more information and a quotation:

Wing Ng or Matthew Ball on 01582 764334 or click here to contact us by email

19 April 2011
 
We are pleased to announce the QUEST series of high performance miniature fibre optic spectrometers from B&W Tek Inc.

Now featuring an ultra-low thermal drift spectrum of ~19 counts/°C (typical) and a faster readout speed of >2.0MHz. In addition, the QUEST series is now available with an optional RS232 communication interface for convenient integration into larger systems.

The new faster readout speed makes the QUEST ideal for high speed online production applications such as LED characterisation and sorting.

The QUEST series includes both a traditional crossed Czerny Turner spectrograph (Quest X), as well as an unfolded Czerny Turner spectrograph (Quest U) to minimise stray light in the UV region. Both are equipped with a 2048 element linear CCD array, built-in 16-bit digitizer, and an externally synchronized trigger.

Stay ahead of the game with Lambda Photometrics and B&W Tek.

For further information, please click here or alternatively click here to contact us by email  or call: Wing Ng or Matthew Ball on 01582 764334

17 Aug 2011
 
IGV-B6620 GigE / ICL-B6620 Camera Link IMPERX 29MP Camera

The IGV-B6620 for advanced high-speed progressive scan, fully programmable CCD camera designed for imaging applications that require high frame rates, high quality images, and powerful features and flexibility. The camera has a small size, light weight, and is built around Kodak's KAI-29050. ICL-B6620 is available with CameraLink output.

Click here for more information on the IGV-B6620 29MP Camera

For a free trial and price information, click here to contact us by email  or call:
 
Clive Phillips or Mark Bambrick on 01582 764334

26 Sept 2011
 
New Test and Laboratory Controller for LED Lighting

LATAB, the Swedish manufacturer of LED lighting and controllers for machine vision applications is proud to introduce a new multifunction controller which will be presented at "Vision", the international trade fair for image processing from 8-10 November in Stuttgart.

The controller has been specially developed for test and laboratory applications. It enables users the ability to optimize the LED lighting for an application very quickly. Simply use one of the two continuously variable adjustment buttons/knobs on the controller to find the optimum lighting conditions for your application and you are up and running. The system can be used in “continuous lighting” mode or “strobe” mode. In continuous mode the controller can drive LED’s at current ratings of up to 3 amperes. The brightness can be continuously adjusted using the control dial.

Using a variation of the continuous mode called “switched” mode the LED’s can be driven at increased brightness for a maximum of 5 seconds. The illumination in this mode can be twice as bright as in standard continuous mode without overloading the LEDs.

In strobe mode, the LEDs can be driven at up to 24 amperes current. The flash brightness can reach up to five times the value of that in continuous mode and can be continuously adjusted as can the frequency up to a maximum of 200 Hertz. The flash duration range is from one microsecond up to five milliseconds. It can be triggered either by an internal frequency generator, an external synchronization source or manually on the controller.

This controller can also operate LED lights made by other manufacturers.

LATAB offers a comprehensive range of standard LED controllers and lights, LATAB is also able to offer standard products modified to customer requirements and completely new customized solutions. This ability highlights LATAB’s expertise in the field of providing individual solutions to image processing applications.

Click here for further information.

Please contact us for more information and to arrange a demo:  click here to contact us by email or call:
 
Clive Phillips or Mark Bambrick on 01582 764334

28 Sept 2011

We are delighted to introduce the MProbe non-contact film thickness measurement system. Using well proven spectroscopic analysis methods MProbe can accurately measure the thickness of translucent multi-layer film stacks.

• Non-contact spectroscopy technique
• Multilayer film stacks
• 1nm to 1mm layer thickness (system dependent)
• Measure thickness, refractive index, surface roughness
• Cost effective solution

A family of MProbe systems are available from the UV to IR, satisfying all thickness range and resolution requirements. Our fully featured TFCompanion control and analysis software package allows users to build layer stack models from an extensive materials library, as well as add customised materials. Stand-alone versions of TFCompanion software are also available for end-users and system integrators.

MProbe is an ideal solution for at-line, on-line and OEM scenarios as well as academic and industrial R&D. Typical application examples include solar cell PV coatings, polymer films, semiconductors, photoresists, thin oxide and nitride films, LCD and flat panel displays, optical coatings ... and many more.

Click here for further details.

Please contact us for more information and to arrange a demo: click here to contact us by email or call:
 
Matthew Ball on
01582 764334

18 November 2010  

The Metricon 2010/M Prism Coupler’s key ability is to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films. The Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry.

For thin films in the range of 0.5 microns to >15 microns:

• It has a routine index accuracy of ±.0005, resolution of ±.0003 (accuracy of up to ±.0001, resolution ±.00005 achievable for many applications)
• It is completely general - no advance knowledge of thickness, index, or material type required
• It is applicable to a wide range of application areas - measures thin films on higher or lower index substrates, free standing flexible polymer films, waveguides, Surface Plasmon Resonance (SPR) structures
• It can provide rapid characterization of thin film or diffused optical waveguides including waveguide loss

For bulk materials and now liquids, using the new Liquid Cell Option:

• It can provide high accuracy determination of dispersion (index vs wavelength) and measure Abbe number.
• It can measure refractive index/birefringence measurement of bulk materials, including flexible polymers and now liquids.

For more information on the Metricon 2010/M Prism Coupler and Liquid Cell Option click here. To request further information by email click here or call:  

Ken Middleton on 01582 764334