Home Thin Film Thickness & Refractive Index Thin Film Measurement System Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

Refractive Index and Thin Film Thickness Measurement - Metricon Model 2010/M

Product Code:
LP320
Manufacturer: Metricon

The Metricon M2010/M Prism coupling system offers unmatched ease and accuracy for measuring:

  • Refractive index and birefringence of bulk materials
  • Refractive index and thickness of thin films
  • Optical waveguide loss

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The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both thickness and the refractive index/birefringence of dielectric and polymer films. For many thin film and optical waveguide applications, the Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry The Model 2010/M represents a significant improvement over its predecessor, the Model 2010, offering compatibility with Windows XP/Vista/Seven, a greatly improved and user-friendly Windows based control program, and new measurement features such as the ability to make accurate thickness and index measurements of very thick films as well as an option to measure index vs. temperature (dn/dT). It also eliminates the need for the now–obsolete ISA interface card required by the 2010. Metricon Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide characterization since introducing the world's first commercial prism coupling instrument, the PC-200, in 1980. Over the years, more than 850 Metricon systems have been delivered to top universities, research institutes, and corporations in 38 countries and Metricon prism coupling systems have been referenced in hundreds of articles in scientific journals.

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