Home Tabletop SEM - Scanning Electron Microscope Semplor NANOS Tabletop SEM

Semplor NANOS Tabletop SEM

Product Code:
NANO
Manufacturer: Semplor

The NANOS offers high-resolution SEM imaging at a low cost of ownership, combining advanced imaging capabilities with integrated energy dispersive spectroscopy (EDS) for fast and accurate elemental analysis. Engineered for seamless installation, user-friendly operation, and simplified maintenance, it offers a convenient and efficient solution for a variety of applications.

  • High Performance SE & 4 quad BSE Detectors
  • EDS ‒ Point Analysis, Line Scan & Element Mapping
  • Low Vacuum Capability
  • Motorised XY Stage & Eucentric Tilt
  • Filament Performance Optimisation
  • 1-20 kV Acceleration Voltages
  • Low Service Costs

More info and finance questions

Request a Quote

NANOS ̶̶   the Microscope
The NANOS is a comprehensive and affordable tabletop scanning electron microscope (SEM). It is engineered using the latest technology, delivering fast and high-quality SEM images and elemental analysis. Its design is robust and modern, which makes it perfect for research & development, educational as well as industrial applications. The NANOS offers direct access to SEM imaging and analysis, eliminating the need for outsourcing. It also suits well for offloading routine analysis of common samples from floor model SEM instruments. With its excellent stability, robust design, and small footprint, it can be used in any laboratory environment without specific infrastructure.

High Performance Detectors
The NANOS comes equipped with both a Secondary Electron Detector (SED) and a Back-Scattered Electron Detector (BSD) as standard. The high-quality BSD is a 4-quadrant detector providing high resolution images that convey elemental contrast information.

The SED collects electrons emitted from the surface of the sample and thus provides crisp and high-resolution surface-sensitive imaging. Images generated with the SED convey surface topographical information and generally have higher resolution as a result of the smaller beam sample interaction volume.

An Energy Dispersive Spectroscopy (EDS) Silicon Drift Detector (SDD) is also installed as standard for Elemental Analysis.

Topographical mode
The high-quality NANOS BSE detector is a 4-quadrant detector with fully controllable independent segments. The standard BSE mode provides compositional details from the sample. By utilizing the segments in different combinations, topographical images with a ‘shading effect’ are generated, highlighting the surface from multiple directions. This provides a qualitative visualization of surface roughness.

Eucentric stage included as standard
The Eucentric Stage of the NANOS is truly the only one of its kind. It comes standard with the NANOS . The motorized XY movements can easily be controlled by a click of the mouse. Tilting the specimen while in SEM mode can be done by manually turning the stage. Thanks to the eucentric design, the sample stays in focus without the need for intermediate changes in SEM settings. On the monitor the exact tilt angle is indicated. Samples can be tilted up to angles of 55 degrees.

Full colour navigation camera
During sample loading, an optical image of the sample is captured which gives the user full control to easily navigate over the sample in-situ. When an SEM image is captured, the corresponding navigation image is also shown with crosshairs for traceability.

Intuitive to use
The ‘Discover App’ makes the NANOS simple and intuitive to operate and requires minimal training. The ease of use makes it perfect for users of any experience level and saves on downtime for training.

Low vacuum capability reduces sample charging
Specimens can be observed in high-vacuum or in low vacuum. The low vacuum is used to reduce or eliminate the effects of sample charging. When a non-conductive sample is observed under a high-vacuum state, electrons accumulate on the sample surface causing a charging phenomenon. The NANOS is equipped with low vacuum mode which allows some air molecules to be present in the chamber to interact with the accumulated electrons and overcome the charging effect. Switching from high to low vacuum can be done by just a click of the mouse. 

Accelerating voltages
Adjustable accelerating voltages between 1kV to 20kV ensures rapid EDS analysis and mapping for identifying elements in your samples. Selecting a low voltage helps to protect any beam sensitive specimen.

Embedded elemental analysis
The NANOS is equipped with an integrated EDS detector. The SEM column is designed to have the same optimal working distance for both EDS analysis and high-resolution imaging. This makes the workflow efficient and fast. The operator can select EDS Point Analysis, Line Scan or activate Elemental Mapping. The embedded EDS makes it independent from any third-party equipment and runs on the same PC. The NANOS is also available without EDS.

EDS mapping
Elemental mapping visualizes all elements present in a sample and allows researchers to see their samples in colour. Regions of interest that were previously invisible can become clear, contamination can be spotted, or information can be retrieved that can help develop an understanding of the sample.

Easily replaceable electron source
The thermionic electron source in the NANOS is a tungsten filament controlled by electro-magnetic coil lenses & electrostatic deflectors. Using the optional ‘eco’ setting, the filament lifetime can be extended up to 500 hours while still generating high-resolution images. Any user can replace the electron source with a simple alignment tool, ensuring minimum downtime. No need to wait for a service engineer to replace an expensive source.

Mixed mode - BSE & SE images
BSE and SE images can be simultaneously viewed in a single composite image. Images can either be overlaid or compared side by side. This can be carried out directly on the ‘Discover App’.

Low maintenance
The NANOS has been developed with service at the core of its design. Easily removable panels, modular components, a single control board and minimal moving parts keep service requirements to a minimum. Much can be undertaken by the user. There are no moving parts within the vacuum chamber which is unique to the NANOS. Due to this smart design - the risk of contamination has been eliminated.

Focusing in small screen mode:

Navigating a sample using the big and small navcam:

Loading a sample:

IMAGING MODES

Optical SEM

Resolution

Magnification range: 2 – 12x Magnification range: 50 – 200,000x

<10 nm

ILLUMINATION

Light Optical

Bright field

 

Electron Optical

Optimized thermionic source (tungsten)

Lifetime: 400+ operating hours in ECO-mode

 

Acceleration voltages

Default: 1, 2, 5, 7, 10, 15 & 20 kV

 

 

Adjustable range between 1 & 20kV

DETECTOR

 

Secondary electron detector (SED)

 

 

Backscattered electron detector (BSD) – 4 quadrant

 

 

Energy Dispersive Spectroscopy detector (EDS) – integrated

DIGITAL IMAGE DETECTION

Optical

Colour navigation camera

IMAGE FORMATS

 

JPEG, TIFF, PNG, BMP

USER INTERFACE

 

Communication, imaging and analysis use a single monitor with control via a wireless mouse & keyboard

 

 

Remote control (eg iPad) enabled

 

 

Basic & advanced modes

DATA STORAGE

 

Network, USB, workstation

SAMPLE STAGE

 

Eucentric tilt stage (-15 up to +40 ̊)

 

 

Computer-controlled motorized X, Y: 25 x 25 mm

SAMPLE SIZE

 

Up to 45 mm diameter (max +15° to -15° tilt)

 

 

Up to 14 mm height (optional 22 and 40 mm)

EDS SPECIFICATIONS

Detector type

Silicon Drift Detector (SDD), thermo-electrically cooled

 

Detector active area

30 mm²

 

Energy resolution

@ Mn Kα <132 eV

 

Max. input count rate

300,000 cps

 

Hardware integration

Fully embedded

SOFTWARE

 

Integrated in NANOS user interface

 

 

EDS analysis and mapping

 

 

Export functions

SYSTEM SPECIFICATIONS

Imaging module

280 (w) x 630 (d) x 550 (h)

 

Weight

60 kg

 

Pumps

Turbo molecular pump with oil free membrane pre-vacuum pump

 

Vacuum modes

High vacuum SEM (conventional SEM), and low vacuum (0.1 – 1 mbar) (low vac SEM)

 

 

Controlled vacuum levels via the User Interface

 

Workstation

Preconfigured All-in-One PC with a 27” monitor. SEM imaging and EDS Analysis software installed.

AMBIENT CONDITIONS           

Temperature

15°C – 25°C (59°F - 77°F)

 

Humidity

20 - 80% RH

 

Power

System in typical imaging mode: 110 W (max. 140 W)

Write Your Own Review
You're reviewing:Semplor NANOS Tabletop SEM
Your Rating
PhotoProduct Price