The Luna LCA 500 is a fast and accurate component analyzer that is ideal for production test and quality control. Luna’s LCA 500 provides the high throughput and connectivity needed for the manufacturing floor while delivering extremely high resolution and sensitivity - critical when testing and validating modern photonic devices and network subsystems.
Highlights
- Simultaneous single scan measurement of IL, RL, and PDL
- Industry leading accuracy and sensitivity
- High resolution (1.6pm)
- High dynamic range (80dB)
- Fast scan times for higher test throughput
- Easy and simple to setup and use
- No need for an external tuneable laser
- Works in transmission or reflection
- Easy to use software
Applications
- Ideal for testing silicon photonics and modern PICs
- Good fit for verification & validation (V&V), production test, and quality control
Comparison with the Luna OVA 5000 Optical Vector Analyser
The OVA 5000 has a very high performance tuneable laser and interferometer system enabling it’s high phase/dispersion performance. The LCA 500 uses a different configuration to provide amplitude (non-phase) measurements, with significant cost savings compared to the OVA 5000.
PARAMETER | FAST MODE* | AVERAGING MODE* | UNITS |
Wavelength Range: | |||
LCA500 | 1525-1610 | nm | |
LCA513 | 1270-1340 | nm | |
Standard Resolution | 1.6 | pm | |
Accuracy1 | ±1.5 | pm | |
Repeatability | ±0.1 | pm | |
Optical Phase Error: | ±0.05 | ±0.0075 | radians |
Loss Characteristics: | |||
Dynamic range2 | 60 | 80 | dB |
Ripple | ±0.05 | ±0.01 | dB |
Resolution | ±0.05 | ±0.002 | dB |
Insertion loss accuracy | ±0.1 | ±0.05 | dB |
Return loss accuracy | ±0.2 | ±0.1 | dB |
PDL: | |||
Extinction ratio (dynamic range) | 40 | 50 | dB |
Accuracy | ±0.05 | ±0.03 | dB |
Measurement Timing: | |||
Laser sweep rate | 70 | nm/s | |
All-parameter measurement rate5 | 30 | ms/nm | |
Fully specified measurement time6 | 12 | 55 | s |
Real-time mode update rate (2.5 nm scan) | 1 | n/a | Hz |
Maximum Device Length (inc leads): | |||
Transmission | 150 | m | |
Reflection | 75 | m | |
Physical: | |||
Class 1 Laser | <10 | mW | |
Operating power | 100 | W | |
Weight (Processor not Included) |
35.8 (16.2) |
lbs (kg) |
|
Case Size (W X D X H) |
18.6 x 16.5 x 8.1 (47 x 42 x 21) |
in (cm) |
Notes:
- Fast Mode: No averaged calibration scans, 4 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length (accuracies verified using NIST certified artifacts except for IL). Expanded dynamic range option enabled.
- Averaging Mode: 4 averaged calibration scans, 64 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length (accuracies verified using NIST certified artifacts except for IL). Expanded dynamic range option enabled.
- Accuracy maintained by an internal NIST-traceable HCN gas cell.
- 80, 60 and 50 dB dynamic ranges in ‘Averaging Mode’ for IL and PMD are with the “Expanded Dynamic Range” option installed and enabled.
- Rate calculated from combined laser sweep and analysis time per scan.
- Measurement with full specification (see note 4) over Fast Mode: 40 nm range, and Averaging Mode: 2.5 nm range. Excludes calibration time.
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