Home Optical T&M Optical Vector & Component Analysers LUNA LCA 500 Lightwave Component Analyser

LUNA LCA 500 Lightwave Component Analyser

Product Code:
LCA 500
Manufacturer: Luna Technologies
  • Production test and QC measurements of IL, RL, PDL and Min/Max (TE & TM) IL/RL in a quick single scan.
  • 1.6pm resolution and 80dB Dynamic range
  • Built-in Tuneable Laser Source

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The Luna LCA 500 is a fast and accurate component analyzer that is ideal for production test and quality control. Luna’s LCA 500 provides the high throughput and connectivity needed for the manufacturing floor while delivering extremely high resolution and sensitivity - critical when testing and validating modern photonic devices and network subsystems.

Highlights

  • Simultaneous single scan measurement of IL, RL, and PDL
  • Industry leading accuracy and sensitivity
  • High resolution (1.6pm)
  • High dynamic range (80dB)
  • Fast scan times for higher test throughput
  • Easy and simple to setup and use
  • No need for an external tuneable laser
  • Works in transmission or reflection
  • Easy to use software

Applications

  • Ideal for testing silicon photonics and modern PICs
  • Good fit for verification & validation (V&V), production test, and quality control

Comparison with the Luna OVA 5000 Optical Vector Analyser

The OVA 5000 has a very high performance tuneable laser and interferometer system enabling it’s high phase/dispersion performance. The LCA 500 uses a different configuration to provide amplitude (non-phase) measurements, with significant cost savings compared to the OVA 5000.

PARAMETER  FAST MODE* AVERAGING MODE* UNITS
Wavelength Range:
   LCA500 1525-1610 nm
   LCA513 1270-1340 nm
   Standard Resolution 1.6 pm
   Accuracy1 ±1.5 pm
   Repeatability   ±0.1 pm
Optical Phase Error: ±0.05 ±0.0075 radians
Loss Characteristics:      
   Dynamic range2  60 80 dB
   Ripple  ±0.05 ±0.01 dB
   Resolution  ±0.05 ±0.002 dB
   Insertion loss accuracy ±0.1 ±0.05 dB
   Return loss accuracy ±0.2 ±0.1 dB
PDL:      
   Extinction ratio (dynamic range) 40 50 dB
   Accuracy  ±0.05 ±0.03 dB
Measurement Timing:      
   Laser sweep rate 70 nm/s
   All-parameter measurement rate 30 ms/nm
   Fully specified measurement time6 12 55 s
   Real-time mode update rate (2.5 nm scan) 1 n/a Hz
Maximum Device Length (inc leads):      
   Transmission  150 m
   Reflection 75 m
Physical:      
   Class 1 Laser  <10 mW
   Operating power  100 W
   Weight (Processor not Included)

35.8 (16.2)

lbs (kg)

   Case Size (W X D X H)

18.6 x 16.5 x 8.1 (47 x 42 x 21)

in (cm)

 Notes:

  1. Fast Mode: No averaged calibration scans, 4 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length (accuracies verified using NIST certified artifacts except for IL). Expanded dynamic range option enabled.
  2. Averaging Mode: 4 averaged calibration scans, 64 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length (accuracies verified using NIST certified artifacts except for IL). Expanded dynamic range option enabled.
  3. Accuracy maintained by an internal NIST-traceable HCN gas cell.
  4. 80, 60 and 50 dB dynamic ranges in ‘Averaging Mode’ for IL and PMD are with the “Expanded Dynamic Range” option installed and enabled.
  5. Rate calculated from combined laser sweep and analysis time per scan.
  6. Measurement with full specification (see note 4) over Fast Mode: 40 nm range, and Averaging Mode: 2.5 nm range. Excludes calibration time.


 


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