LUNA LWA 7601 Reflectometer/Lightwave Analyser – Production Test
The Luna LWA7601 is a fast and simple-to-use analyser for passive optical components and modules. The LWA7601 measures and analyses the Insertion Loss (IL) and Return Loss (RL) distribution, as well as lengths and event locations, working in either reflection or transmission and providing results in the time and frequency (wavelength) domains.
- 20 μm sampling resolution
- Up to 500 m measurement range in reflection (1000m in transmission)
- 12 Hz scan/acquisition rate (80ms)
- 2pm wavelength accuracy
The LUNA LWA 7601-C instrument utilises optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance/time (or wavelength).
The extremely high sensitivity and sampling resolution (20 μm) make it an ideal analyser for photonic integrated circuits (PICs) and silicon photonics applications. When combined with the extended measurement range option, up to 500 m measurement range is achieved, making the testing of fibre networks an easy task.
The LWA 7601-C reduces the cost and complexity of test while increasing throughput by measuring RL, IL and length in reflection or transmission with a single instrument.
Key Features:
- Return loss (RL) and insertion loss (IL) analysis
- Analyse components in reflection and transmission
- Trace distributed RL over the entire optical path length
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 500 m)
- High speed, resolution and accuracy for optimising production test
- 20μm sampling resolution
- 12 Hz scan/acquisition rate (80 ms)
Applications:
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with sub-picosecond resolution (e.g. financial datacentres)
- PLCs, waveguide devices, AWGs, ROADMs, etc.
- Filters, couplers, switches, beam splitters, FBGs, specialty fibres
PARAMETER | SPECIFICATION | UNITS | ||
Measurement | ||||
LWA 7601-C | LWA 7601-C (with extended rage option) |
|||
Maximum measurement length | Reflection | 100 | 500 | m |
Transmission | 200 | 1000 | m | |
Sampling resolution (two point) | 20 | 80 | μm | |
Time-of-flight delay accuracy | ±0.01 | % | ||
Wavelength scanning range | 1546.69 ± 20 | 1546.69 ± 5 | nm | |
Measurement time (in continuous mode) | 0.08 (20 m) | 0.5 | s | |
0.4 (100 m) | ||||
RL dynamic range | 70 | dB | ||
Sensitivity | -135 | dB |
For full specifications, please download the data sheet.
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