Join us Thursday, 15 May 2025 at 18.00

Join us for a webinar where we introduce an advanced Ar ion milling technique designed to make your work easier, faster, and more accurate.

Traditional Ga focused ion beam (FIB) and Xe plasma FIB milling often cause amorphization and leave ion-implanted layers on TEM specimens. Fischione Instruments’ NanoMill® TEM specimen preparation system has a well-documented history of addressing these issues. The system's ultra-low energy (50 eV to 2 kV) and concentrated beam diameter (< 1 µm) allow you to create ultra-thin, high-quality specimens suitable for TEM imaging and analysis.

What’s new?
Our approach features a new specimen holder that allows a 15 to 20° tilt, enabling you to mill both sides of the specimen and eliminating the need to re-mount the specimen. The milling direction is from the bottom of the specimen up toward the area of interest. This bottom-up milling technique, combined with the high specimen tilt angle, offers better visibility and precise milling box placement, which can result in electron-transparent areas up to 10 µm wide.

Join us
Senior Applications Scientist Cecile Bonifacio will guide you through this milling approach, demonstrating how it can enhance your specimen preparation process without compromising on quality.

Don't miss this opportunity to advance your TEM specimen preparation quality.

Contact us on 01582 764334 to speak with one of our Product Specialists.

Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions

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