Characterisation, Measurement & Analysis
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Press Releases

Lambda's press releases

  • Dynamic Capability comes to (nearly) all new Zygo Verifire Interferometers

    DynaPhase® Dynamic Acquisition for Extreme Environments
    Confidence in metrology, no matter the conditions

    Fizeau Interferometry has become a trusted standard for precise metrology of optical components and systems. Traditionally, these instruments were required to be installed in lab environments, where conditions were carefully controlled, to ensure high precision measurements were not compromised. However, today a growing number of applications demand easy, cost-effective solutions for the use of interferometry in environments where metrology has been difficult or impossible in the past.

    Often, optical systems must be tested in locations that simulate their end-use environment. These environments can present challenges due to factors like large vibration and air turbulence, which can negatively affect or prevent the ability to acquire reliable optical measurements. Many of these challenges are addressed with less than optimal solutions, often suffering from drawbacks and issues related to usability, speed, reliability and precision.

    ZYGO's patented DynaPhase® data acquisition technology offers many differentiated benefits, without the limitations associated with alternative methods. Key attributes of DynaPhase include:

    • Highest vibration tolerance in a Fizeau interferometer, enabled by the ZYGO-manufactured high-power laser* and fast acquisition speeds
    • Patented in-situ calibration enables the highest precision, lowest measurement uncertainty measurements, and excellent correlation to temporal phase shifting interferometry (PSI)
    • Simple setup and calibration compared to alternative approaches
    • Cost-effective solution; available on nearly all ZYGO laser interferometers

    Comparison of Measurement Techniques Using an Identical Measurement Cavity

    DynaPhase offers the versatility and performance to address a wide range of challenging optical testing environments and applications, including:

    • Cryogenic and vacuum chamber testing
    • Telescope components and complex optical systems
    • Large tower, workstations and complex or unstable test stands

    DynaPhase is available on nearly all ZYGO laser interferometers. Features vary by model and enable users the flexibility to use capabilities that enhance efficiency in Production Mode, enable fast system alignment with LivePhase, or reveal temporal changes in data with Movie Mode.

    Get the most from your metrology investment with the unique capabilities and unmatched versatility of DynaPhase, now available on the entire interferometer line from ZYGO.
    Complete range of vibration tolerant metrology - check out ZYGO's patented QPSI vibration tolerant temporal phase shifting data acquisition enables metrology in the presence of common shop floor vibrations without the need for calibration.

    DynaPhase is inherent in the DynaFiz interferometer - and available as an optional extra software module on the new Verifire (1200 x 1200 pixel camera), Verifire HD and HDx systems. This means you can have DynaPhase capability on the entry level Verifire interferometer, which is pretty well specified to start with as it includes QPSI technology also.

    Click here to read further information on QPSI™ Technology Shrugs Off Vibration from Common Sources.

    To speak with a Sales & Applications Engineer please call 01582 764334 or click here to email.

  • New Baumer LX Cameras now with integrated JPEG compression

    We are pleased to announce that we are now delivering an on-board image compression video camera, which is able to transmit high-quality images and reduce the data output in real-time.

    Baumer is supplementing the hugely popular LX series with 2, 4 and 25 megapixel cameras with integrated JPEG image compression and frame rates of up to 140 fps. With the GigE cameras, your savings are continual: from bandwidth through CPU load to storage space – this simplifies the system structure design and reduces integration costs.

    Why not give us a call now on 01582 764334 if you would like a free trial of the camera or click here to email.

    Further information on our Machine Vision camera series click here.

    Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Electronic/Scientific and Analytical Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics and Microscopy.

  • SEM automation guidelines for small script development: evaluation

    Scripts are small automated software tools that can help a scanning electron microscope (SEM) user work more efficiently In my previous two blogs, I wrote about image acquisition and analysis with the Phenom Programming Interface (PPI). In this blog I will explain how we can use the physical properties we obtained in the last blog in the evaluation step.

    SEM automation workflows

    Typically, SEM workflows always consist of the same steps, see Figure 1. The four steps that can be automated using PPI are:

    1. Image acquisition
    2. Analysis
    3. Evaluation
    4. Reporting

    In the image acquisition step (1), images are automatically made using PPI and the Phenom SEM (read this blog for more information on this step). In the analysis step (2), the physical properties are extracted from the image (see this blog) .The images are evaluated based on these physical properties in the evaluation step (3). The final automated step (4) is reporting the results back to the user.

    Figure 1: Scanning Electron Microscopy workflow

    Image evaluation

    In the evaluation step, the physical quantities are evaluated and categorized. This can be done by:

    • Counting particles based on their morphology
    • Determining the coverage on a sample
    • Base actions on physical properties of the sample

    In this blog we will base action on the physical properties in an image to determine where the center of the copper aluminum stub is.

    To do this we will assume that the copper insert is perfectly round. The script will start at a location pstart within the copper part of the stub. From here it will move in both positive and negative x and y directions to find a set of four edges points of the copper insert. These points will be Schermafbeelding 2018-07-05 om 12.17.40. Because of the circular symmetry of the stub, the arithmetic average of the x positions of Schermafbeelding 2018-07-05 om 12.20.01 and the y-position of Schermafbeelding 2018-07-05 om 12.20.45 will yield the center Schermafbeelding 2018-07-05 om 12.21.08 of the stub. In Figure 2 all the points are shown.


    Figure 2: Definitions of the locations on the stub

    To find the edges, the stage is moved. In every step the image is segmented using the techniques explained in the previous blog. When less than 50% of the image consists of the copper part, the edge is located. The exact position of the edge point is then defined as the center of mass of the area that is neither copper nor aluminum.

    Figure 3: Definitions of the locations on the stub

    Code snippet 1 shows an example of how this can be done. First the stage is brought to its original starting point with the Phenom.MoveTo method. This position is retrieved back from the Phenom using the phenom. GetStageModeAndPosition command. After that, the step size is defined. A step of 250 µm is chosen, which is equal to half the image field width. Four vectors are defined in all directions to find the four edges. These vectors are combined into an iterable list, to be able to iterate over them in the for loop.

    In the for loop, the stage is first moved to an initial guess of the location of the center. Then, a while loop is started where the stage moves to one direction with the step size. At every step the image is segmented and checked if the area of copper is smaller than 50%. If the copper area is less than 50%, the edge has been found and the center location of the edge is determined using ndimage.measurements.center_of_mass method.

    The resulting center of mass is expressed in pixels and is converted to metric units using the metadata that is available in the Phenom acquisition objects. The centers of masses are stored in a list and from this list the Schermafbeelding 2018-07-05 om 13.09.38 and Schermafbeelding 2018-07-05 om 13.10.07 locations are determined. From the set of locations, the arithmetic averages are easily determined, and the stage is moved to its new improved center location.

    Code snippet 1: Code to find and to move to the center of the stub

    In Figure 4, the initial guess of the location of the center is shown on the left-hand side and the improved center location is shown on the right-hand side. Iterating this process a few times could improve the center location even further; this because the symmetry will improve towards the center of the stub.

    Figure 4: Definitions of the locations on the stub


    In code snippet 2, the complete code is shown, including the code from my two previous blogs.

    Code snippet 2: Complete code

    Click here to learn more about SEM automation and the Phenom Programming Interface

    Topics: Scanning Electron Microscope Automation, Industrial Manufacturing, Automation, PPI, Automated SEM Workflows

    About the author:

    Wouter Arts is Application Software Engineer at Thermo Fisher Scientific, the world leader in serving science. He is interested in finding new smart methods to convert images to physical properties using the Phenom desktop SEM. In addition, he develops scripts to help companies in using the Phenom desktop SEM for automated processes.

  • Buying a scanning electron microscope: how to select the right SEM

    You want to buy a new scanning electron microscope (SEM) because you know you need more SEM capability. Maybe you have a traditional floor model SEM, but it is slow and complicated to operate. Maybe you are using an outside service and the turn-around time is unacceptably long.

    You have made your case that your company could significantly improve their business performance and you could do your job better if SEM imaging and analysis were easier, faster and more accessible. Can a desktop SEM do what you need? This article provides the answers and helps you to select the right SEM.

    Floor model SEM vs. Desktop SEM

    The choice between a desktop SEM and a larger, floor model system is almost always primarily an economic one: desktops are much less expensive. But there are other factors that also argue in favor of a desktop solution, even when cost is not the primary consideration.

    Scanning electron microscopes: pricing & affordability

    Let’s deal first with SEM pricing. Desktop SEMs are typically priced at a fraction of their floor model relatives. And there are certainly situations in which the additional cost of the larger systems are justifiable, for example, when the resolution requirements are beyond those achievable in a desktop SEM system.

    However, today’s desktop SEM’s can deliver resolutions smaller than 10 nm, enough for 80%-90% of all SEM applications. So your first question has to be, is it enough for yours?

    Beyond the initial acquisition, there are significant additional costs for a floor model scanning electron microscope system:

    • facilities – typically at least a dedicated room (perhaps including specialized foundations and environmental isolation)
    • additional space and equipment for sample preparation; personnel – a dedicated operator, trained in instrument operation and sample preparation.

    It is worth noting that while the cost of the equipment and facility are primarily fixed costs of acquisition, the operator is an ongoing expense that will persist for the lifetime of the instrument.

    Clearly, a desktop SEM solution — less costly to acquire and with no requirement for a dedicated facility or operator — is the less expensive choice, as long as its capabilities satisfy the requirements of the application.

    Other decision factors when selecting and buying a scanning electron microscope

    • Microscope speed
      Desktop SEM systems require minimal sample preparation and their relaxed vacuum requirements and small evacuated volume allow the system to present an image much more quickly than a typical floor model system.Moreover, desktop SEMs are usually operated by the consumer of the information, eliminating the time required a dedicated operator to perform the analysis, prepare a report and communicate the result.In addition to faster answers, there is considerable intangible value in the immediacy of the analysis and the user’s ability to direct the investigation in real-time response to observations.Finally, in some applications, such as inspection, longer delays carry a tangible cost by putting more work-in-progress at risk.
    • Microscope applications
      Is the application routine well defined? If it is, and a desktop SEM can provide the required information, why spend more? Concerns about future requirements exceeding the desktop capability should be evaluated in terms of the certainty and timing of the potential requirements and the availability of outside resources for more demanding applications.Even in cases where future requirements will exceed desktop capability, the initial investment in a desktop SEM can continue to deliver a return as that system is used to supplement a future floor model system.Perhaps in a screening capacity or to continue to perform routine analyses while the floor model system is applied to more demanding applications.A desktop system may also serve as a step-wise approach to the justification of a larger system, establishing the value of SEM while allowing an experience-based evaluation of the need and cost of more advanced capability from an outside provider.
    • Microscope users
      How many individuals will be using the system? Are the users trained? If not, how much time are they willing to invest in training? Desktop SEMs are simple to operate and require little or no sample preparation. Obtaining an image can be as easy as pushing a couple of buttons.More advanced procedures can be accessed by users with specific needs who are willing to invest a little time in training. In general, the requirements for operator training are much lower with a desktop system and the system itself is much more robust. It is harder to break, and the potential repair cost is much lower.

    Buying a scanning electron microscope: take-aways

    Now a short recap. The primary decision factors when selecting a SEM are:

    • Pricing
    • Speed
    • Applications
    • Users

    The question to ask yourself while going over these factors is: does a desktop SEM meet my application requirements?

    From experience we can say that it will, in most scenarios. If a desktop SEM is indeed suitable for your application, you’re looking at an investment that’s significantly lower compared to a floor model SEM.

    Remember, desktop systems are typically priced at a fraction of their floor model relatives.

    As I stated earlier there are situations in which the additional cost of larger systems is justifiable. This is the case when the resolution requirements are beyond those achievable in a desktop system.

    However, today’s desktop SEMs can deliver resolutions less than 10 nm — enough for 80%-90% of all SEM applications. So the question will often be: is it enough for yours?

    If that’s a difficult question to answer — or if you’re still just in doubt which SEM to choose — we have an e-guide available that should be of help: how to choose a SEM.

    This guide takes an even deeper dive into the selection process of a SEM, and will help you select the right model for your process and applications.

    Topics: Research Productivity, Scanning Electron Microscope, Pricing

    About the author:

    Karl Kersten is head of the Application team at Thermo Fisher Scientific, the world leader in serving science. He is passionate about the Thermo Fisher Scientific product and likes converting customer requirements into product or feature specifications so customers can achieve their goals.

  • Sputter coating for SEM: how this sample preparation technique assists your imaging

    Scanning electron microscopes (SEMs) are very versatile tools that can provide information at the nanoscale of many different samples - with little or no sample preparation. In some cases though, sputter coating the samples prior to working with SEMs is recommended, or even necessary, in order to get a good SEM image. In this blog, we will explain how the sputter coating process works, and to which type of samples it should be applied.

    How does sputter coating work?

    As mentioned above, SEMs can image almost all kind of samples; ceramics, metals and alloys, semiconductors, polymers, biological samples and many more. However, certain types of samples are more challenging and require an extra step in sample preparation to enable the user to gather high-quality information from a SEM. This extra step involves coating your sample with an additional thin layer (~10 nm) of a conductive material, such as gold, silver, platinum or chromium etc.

    When a metallic target material is bombarded with heavy particles, the erosion of this material begins. Sputtering occurs when the erosion process takes place in conditions of glow discharge between an anode and a cathode. In this way, and by careful selection of the ionization gas and the target material, an additional thin layer (¬ 10nm) of a conductive material, such as gold, silver, platinum or palladium will coat your sample.

    Challenging samples that require sputter coating:

    • Beam-sensitive samples
      The first type of samples that are usually sputter-coated prior to loading in the SEM are the beam-sensitive samples. These are mainly biological samples, but they can also be other types, such as materials made from plastics. The electron beam in a SEM is highly energetic and, during its interaction with the sample, it carries part of its energy to the sample mainly in the form of heat. If the sample consists of a material that is sensitive to the electron beam, this interaction can damage part or their entire structure. In this case, sputter-coating with a material that is not beam-sensitive can act as a protective layer against such kind of damage.
    • Non-conductive materials
      Another class of materials that is frequently subjected to sputter coating is non-conductive materials. Due to their non-conductive nature, their surface acts as an electron trap. This accumulation of electrons on the surface is called “charging” and creates the extra-white regions on the sample that can be seen in Fig1a, which can influence the image information.

    In order to remove this artefact, a common approach is to lower the vacuum level inside the chamber. This introduces positively-charged molecules near the surface of the sample. These interact with the charging electrons and neutralise them, thereby removing this charging effect. This has proven to be an effective approach, however the air molecules that are introduced in the vacuum chamber interact with the primary electrons reducing the quality of the image.

    For this reason, if a high-quality electron image is required, the use of sputter coater is recommended; the conductive coating material acts as a channel that allows the charging electrons to be removed from the material. In Figure 1b you can see how the charging effect has been removed with the application of a gold coating.

    Figure 1: a) Charging effect on a non-conductive sample and b) BSD imaging of this sample after 10 nm gold coating.

    In some cases, the sputter coating sample preparation technique can be used to improve image quality and resolution. Due to their high conductivity, coating materials can increase the signal-to-noise ratio during SEM imaging and therefore produce better quality images.

    The drawbacks of sputter coating for SEM

    As can be easily understood, there are a few concerns when it comes to using sputter coating for SEM imaging. Initially, it requires additional time and effort by the user to define the optimal coating parameters.

    However, there is an even more important downside of sputter coating; the surface of the sample does not contain the original material but the sputter-coated one, and therefore the atomic number-contrast is lost.

    In some extreme cases, it may lead to altered surface topography or false elemental information about the sample. Nevertheless, in most cases, the parameters of the sputter coating procedure are carefully selected and these issues do not appear and therefore the user is able to acquire high-quality images that carry the type of information that is required.

    Which materials should you use to sputter-coat your sample?

    Historically, the most used sputter coating material has been gold, due to its high conductivity and its relatively small grain size that enables high-resolution imaging. Also, if EDX analysis is required, SEM users typically coat their samples with carbon because carbon’s X-ray peak does not conflict with the peak of any other element.

    Nowadays, people are also using other coating materials with even finer grain sizes such as tungsten, iridium or chromium when ultra-high resolution imaging is required. Other coating materials include, platinum, palladium and silver, with the latter having the advantage of reversibility.

    It goes without saying that certain type of samples need some extra steps of sample preparation to achieve the best possible result in the SEM.

    Topics: Sample Preparation, Sample Degradation

    About the author:

    Antonis Nanakoudis is Application Engineer at Thermo Fisher Scientific, the world leader in serving science. Antonis is extremely motivated by the capabilities of the Phenom desktop SEM on various applications and is constantly looking to explore the opportunities that it offers for innovative characterization methods.

  • Automated scanning electron microscopy (SEM) imaging: how it's used

    In a previous blog, we described how automating scanning electron microscopy (SEM) imaging saves researchers and operators valuable time. A lot of scanning electron microscope users use this for a wide range of purposes. This blog shows an example of how automated SEM imaging is used in the field: it details performing an automated Laser-Induced Damage Threshold test (LIDT).

    Automated SEM imaging: accelerating a Laser-Induced Damage Threshold test

    Intense laser light can damage optical components like mirrors, optical coatings, or fibers. For the selection of the right optical components, it is important to find out what dose of energy causes damage to a component, or permanently changes its optical characteristics.

    Figure 1: BSD SEM image of laser-induced damage on an optical coating

    To determine the exact effect of specific doses of energy, a Laser Induced Damage Threshold test is performed. The optical component is exposed to different intensities and wavelengths of laser light in a grid pattern.

    After being exposed to laser light, the component is inspected for damage using different types of optical microscopes and scanning electron microscopes. The grid can contain hundreds of different points — and each point has to be inspected.

    Performing this test manually would demand a lot of your time. In this situation, automated microscopy can be a solution that can help save valuable time.

    How to acquire SEM images automatically

    With a programmable interface, a script is created to acquire images automatically for each point with SEM. The script works by uploading a list of coordinates that is created by the laser. You then calibrate the stage on two points, after which the script proceeds to image each point at a selected magnification.

    Figure 2: User interface of the LIDT scan script: the small red and green dots represent points where the optical coating was exposed to laser light.

    All the acquired images are stored in the selected folder for you to inspect. If a specific point requires closer inspection, that point can easily be found by clicking on it in the user interface. This way, you can spend more time on the actual analysis than on the acquisition of your SEM images.

    Automating this process saves you time Now, you can just click on the images and check if there is any damage.

    If you would like to know how scanning electron microscopes with automation capabilities — click  Phenom XL and Programming Interface.

    Topics: Scanning Electron Microscope Automation, Automation, PPI, Automated SEM Workflows

    About the author:

    Karl Kersten is head of the Application team at Thermo Fisher Scientific, the world leader in serving science. He is passionate about the Thermo Fisher Scientific product and likes converting customer requirements into product or feature specifications so customers can achieve their goals.

  • Introducing the Latest Innovation in Fibre-optic MPO/MTP Polarity Testing Solutions

    We are pleased to announce the OP415 Polarity Analyser from OptoTest - the latest innovation in polarity testing solutions.

    This polarity tester was designed to test 24-fibre MTP/MPO cable assemblies efficiently, but is easily configured to test for 8-fibre and 12-fibre cables. It is pre-loaded with 12-fibre and 24-fibre polarity types A, B, and C plus the ability to create and store custom fibre mappings and channel configurations. Additionally the OP415 can learn polarity types from existing cables and store those for future use.

    Most customers will be interested in automatic testing, but the OP415 Polarity Analyzer also has a manual mode to step through a cable channel by channel - a useful feature for troubleshooting or routing fibres during ribbonizing. Bright red laser sources on each channel provide visual fault detection for ribbon cables.

    The full colour touchscreen display graphically shows if fibres are routed incorrectly or are not connected, and can even display a power level for each channel to detect poor connections. On-board data storage allows users to save results for later analysis.

    Based in Camarillo, California, OptoTest strives to be at the forefront of the fibre optics industry with solid fundamental measurement technologies for optical power, insertion loss, return loss, and launch condition. The company maintains a tradition of breakthrough products and innovative solutions for the testing and analysis of fibre optics components and systems. Lambda Photometrics are proud to represent OptoTest in the UK and welcome the opportunity to share our fibre testing experience with potential customers.

    If you would like more information, to arrange a demonstration or receive a quotation for the OP415 Polarisation Analyser, please contact us via email, our website or call us on 01582 764334.

  • PicoScope 5000D Series: “The complete all-rounder”

    New FlexRes® oscilloscopes deliver flexible resolution, deep capture memory and mixed signal capability in a USB 3.0 PC connected instrument.

    Pico Technology, market leader in PC oscilloscopes and data loggers, today introduced the PicoScope 5000D Series FlexRes oscilloscopes and MSOs that feature up to 16 bits of vertical resolution with up to 200 MHz bandwidth and 1 GS/s sampling speed. FlexRes hardware employs multiple high-resolution ADCs at the input channels in different time-interleaved and parallel combinations to optimise either the sampling rate to 1 GS/s at 8 bits, the resolution to 16 bits at 62.5 MS/s, or other combinations in between.

    PicoScope 5000D MSO models add 16 digital channels, providing the ability to accurately time-correlate analog and digital channels. Digital channels may be grouped and displayed as a bus with each bus value displayed in binary, hex, decimal or level (for DAC testing). Advanced triggers can be set across both the analog and digital channels.

    PicoScope 5000D Series oscilloscopes have waveform capture memory up to 512 megasamples - many times larger than competing scopes. Deep memory enables the capture of long-duration waveforms at maximum sampling speed. PicoScope’s DeepMeasure™ tool uses the deep memory to analyse every cycle contained in each triggered waveform acquisition. It displays results in a table, with the parameter fields shown in columns and waveform cycles shown in rows. The current version of the tool includes twelve parameters per cycle, and can display up to a million cycles.

    Serial decoding and analysis is included as standard. Decoding helps users to see what is happening in their design to identify programming errors and check for signal integrity issues. Key applications are addressed with support for 18 protocols:

    • Automotive: CAN, CAN-FD, FlexRay, LIN, SENT
    • Embedded: 1-Wire, I2C, I2S, SPI
    • Avionics: ARINC 429
    • Computer: Ethernet 10 & 100BASE-T, PS/2, UART / RS-232, USB
    • Industrial: IMODBUS RTU & ASCII
    • Lighting: DMX512
    • Hobby: DCC

    PicoScope 5000D Series oscilloscopes feature a SuperSpeed USB 3.0 connection, providing lightning-fast saving of waveforms while retaining compatibility with older USB standards. The PicoSDK® software development kit supports continuous streaming to the host computer at rates up to 125 MS/s.

    “The 5000D builds on the success of PicoScope 5000A/B Series flexible resolution oscilloscopes that were introduced back in 2013. The 5000D gives designers and test engineers the versatility they need to make measurements on the wide range of waveforms encountered in today’s embedded systems,” said Trevor Smith, Business Development Manager, Test & Measurement, at Pico Technology. “This allows users to capture and decode fast digital signals and to look for distortion in sensitive analog signals, all using the same oscilloscope.”

    PicoScope software takes advantage of modern PC processing power with an equation editor that allows users to define complex waveform mathematical functions. These include filters (lowpass, highpass, bandpass and bandstop), trigonometry, exponentials, logarithms, statistics, integrals and derivatives. Waveform maths can also be used to plot live signals alongside historic peak, averaged or filtered waveforms.

    Software Development Kit

    The PicoSDK software development kit enables users to write their own applications for the PicoScope 5000D hardware. Drivers for Microsoft Windows, Apple Mac (macOS) and Linux (including Raspberry Pi and Beaglebone) are included. Example code, hosted on the Pico Technology GitHub pages, shows how to interface to third-party software packages such as Microsoft Excel, National Instruments LabVIEW and MathWorks MATLAB and programming languages like C, C#, C++, and Visual Basic .NET.

    If you would like more information, arrange a demonstration or receive a quote for the PicoScope 5000D Series; you can contact us via email, through our website or call us on 01582 764334.

  • NEW FS740 GPS Time and Frequency System

    From Stanford Research Systems (SRS), the recently launched FS740 Time and Frequency system is much more than just a 10MHz frequency reference.  With powerful capabilities and eye-catching performance it is a highly cost effective and multi-functional lab tool.

    The SRS FS740’s GPS disciplined 10MHz reference delivers caesium equivalent stability and phase noise, but for a fraction of the cost. A host of additional features include a 12-digit/s frequency counter, a DDS synthesised source with adjustable frequency and amplitude, built-in distribution amplifiers and event time tagging to UTC or GPS. Optional OCXO and Rubidium timebase clocks reduce phase noise to better than -130dBc/Hz.

    • GPS/DNSS Disciplined 10MHz reference
    • TCXO, OCXO or Rb Timebase (better than -130dBC/Hz phase noise)
    • Time Tagging to GPS and UTC
    • 12 digit/s Frequency Counter
    • Sine, square, triangle & IRIG-B source outputs
    • Built-in distribution amplifiers
    • Ethernet/RS-232 connectivity


    From SRS, a leader in innovative scientific instrumentation solutions, the FS740 is a powerful multifunctional tool for any lab with time/frequency reference and measurement needs.

    Click here for further information.

    To speak with a sales/applications engineer please call 01582 764334 or click here to email.

  • New 48 MP LX Cameras based on ams (CMOSIS) CMV50000

    With the 48 MP global shutter CMOS sensor CMV50000 from ams (CMOSIS) Lambda Photometrics is now shipping the LX series with Dual GigE (LXG) and CameraLink (LXC).

    The cameras have outstanding high resolution, very good image quality and high frame rates of up to 15 fps. The further extension of the LX series takes place throughout 2018 based on the completely new development of the LXT with SONY CMOS Gen 2 sensors with 3-12 MP and 10 GigE.

    Further information on our Machine Vision camera series click here.

    To speak with a sales/applications engineer please call 01582 764334 or click here to email

    Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Electronic/Scientific and Analytical Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics and Microscopy.

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