GoGo Instruments ECH400V-EB Externally Adjustable Probe Station
- Temperature range: -190°C~400°C
- Temperature stability: ±0.1°C
- Vacuum chamber
- XYZ Travel: ±6mm
- High-precision temperature control
- Professional temperature control software
- Customisation available
The GoGo Instruments ECH400V-EB is an externally adjustable probe station designed for temperature-dependent electrical characterisation of advanced materials and semiconductor devices. Combining precise thermal control with high-stability probe positioning, the system enables reliable in-situ electrical measurements across extreme temperature conditions.
Key Features
- Temperature range from -190°C to 400°C.
- Temperature stability of ±0.1°C.
- Externally adjustable probe positioning system.
- XYZ probe travel of ±6 mm.
- Vacuum-compatible chamber design.
- High-precision thermal control for repeatable measurements.
- Professional temperature control software included.
- Customisation options available for specialised research requirements.
Integrated Thermal and Probe Control
The ECH400V-EB combines advanced thermal management with precision probe manipulation to support complex in-situ experiments. The system supports liquid nitrogen cooling and resistive heating, enabling controlled transitions across cryogenic and elevated temperature conditions.
Applications
The ECH400V-EB is suitable for a wide range of scientific and industrial research applications, including:
- Semiconductor device testing
- Temperature-dependent electrical measurements
- Dielectric material analysis
- Thin-film characterisation
- Quantum material research
- Low-temperature electrical probing
- Nanomaterials and advanced materials research
- In-situ microscopy and spectroscopy studies
Additional Information
| No. of Channels | 4 |
|---|---|
| Minimum Temperature | -190° |
| Maximum Temperature | 400°C |
| Sample Size | 23mm x 23mm |
| TYPE | ECH400V-EB |
| Cooling/Heating Method | Liquid nitrogen cooling,Resistance heating |
| Temperature Range | ﹣190℃~400℃ |
| Temperature Stability | ±0.1℃ |
| Heating/Cooling Rate | Maximum Heating Rate：150℃/min,Maximum Cooling Rate：40℃/min |
| Sample Holder | Silver；23mm*23mm |
| Optical Path | Reflection |
| Top Window Size | φ25mm*1mm |
| Window Material |
JGS2 Fused Silica Glass (Transmission Range: 220 nm - 2500 nm), manually removable and replaceable.
|
| Distance from Window Upper Surface to Sample Holder Upper Surface | 16.5mm |
| Chamber Height | 15mm |
| Probe | Gold-Plated Tungsten Carbide Coaxial Probes*4 |
| Probe Adjustment | XYZ Travel: ±6mm |
| Probe Port | Triaxial BNC*4 |
| Sample Stage Potential | Grounded / Electrically Floating |
| Chamber | Vacuum |
| Dimensions | 430mm*430mm*60mm |
| Net Weight | 10.5kg |
| Basic Configuration | GoGo TCS, Motorised Probe Station*1, Temperature controller*1, Cooling controller*1 ,Liquid Nitrogen Tank*1, Recirculating Chiller*1, Cables, Tubing and Accessories |
| Optional |
Customised Temperature Control Software |
GoGo Electrical Application Products Brochure| Photo | Product | No. of Channels | Minimum Temperature | Maximum Temperature | Sample Size | Price | |
|---|---|---|---|---|---|---|---|
 | GoGo EH1000V-EM Externally Adjustable High Temperature Probe Station | 4 | RT | 1000°C | 20mm x 20mm | > | |
 | GoGo EPE120 Peltier Electrical Heating and Cooling Stage | 4 | -25˚C | 125˚C | 40mm x 40mm | > | |
 | GoGo EH1000/EH1200 Ultra-High-T Electrical Heating Stage | 4 | RT | 1000°C | 30mm x 30mm | > | |
 | GoGo Instruments ECH400V-EC Motorised Probe Station | 2 | -190° | 400°C | 23mm x 23mm | > | |
 | GoGo Instruments ECH400V-EM Externally Adjustable Probe Station | 4 | -190° | 400°C | 23mm x 23mm | > | |
 | GoGo Instruments ECH600 Electrical Heating and Cooling Stage | 4 | -190° | 600°C | 23mm x 23mm | > | |
 | GoGo Instruments ECH600S Electrical Heating and Cooling Stage | 2/4 | -190° | 600°C | 23mm x 23mm | > |