GoGo Instruments ECH400V-EM Externally Adjustable Probe Station

The GoGo Instruments ECH400V-EM is a high-precision heating and cooling probe station engineered for temperature-dependent electrical characterisation of semiconductors, thin films, quantum materials, optoelectronic devices, and advanced functional materials. Designed around an externally adjustable micrometre-controlled probe platform, the system combines cryogenic capability, stable thermal control, and low-noise electrical measurement performance within a compact vacuum-compatible architecture.

The ECH400V-EM enables reliable probing and electrical analysis across a wide temperature range from −190 °C to +400 °C, supporting applications such as I–V, C–V, admittance spectroscopy, conductivity, dielectric, and low-noise device measurements.

Key Features

• Wide temperature range: −190 °C to +400 °C
• Temperature stability of ±0.1 °C
• Integrated vacuum chamber for controlled environmental testing
• External micrometre-adjustable XYZ probe positioning
• Probe travel range of ±6 mm
• Four gold-plated tungsten carbide coaxial probes
• Triaxial BNC interfaces for low-noise electrical measurements
• Reflection optical path configuration
• Removable fused silica optical window
• Compatible with external source meters and precision analysers
• Professional temperature control software included
• Customisable hardware and software configurations available 

Typical Applications
The ECH400V-EM is suitable for a broad range of advanced materials and semiconductor research applications, including:

• Semiconductor device characterisation
• Cryogenic electrical measurements
• Thin-film conductivity analysis
• Dielectric and ferroelectric testing
• Admittance spectroscopy
• Quantum material studies
• Photodetector and optoelectronic device testing
• Temperature-dependent I–V and C–V measurements
• Reliability and thermal cycling experiments