Applications

Constellation-and-eye-diagram-qpsk This paper depicts the strong contribution of the Apex Technolgoies Optical Complex Spectrum Analyser AP2441B/AP2443B in characterising and evaluating 43 Gb/s DQPSK (Differential Quadrature Shift Keying) modulators thanks to its ability to display the phase eye pattern and the constellation. Low-drive-voltage (3.5 V) and uniform modulation characteristics of MZIs (Mach Zehnder Modulators) were achieved with Z-cut dual-drive nested-MZIs...

MZI-time-resolved-chirp-and-inetensity-measurement The spectrum of a chirped optical NRZ data stream obtained by an external Mach-Zehnder Modulator (MZM) is analysed using the Apex Technologies Optical Complex Spectrum Analyzer AP2441B/AP2443B. We  demonstrate that it is possible to induce chirp without broadening the optical spectrum by employing a MZM with optical power unbalancing in the two waveguides. For standard chirped MZM (different...

Instensity-and-chirp-temporal-parameters-of-a-MZI-modulator The discussion exposed in this paper is based on a synthesis of several elements collected in some publications dealing with fundamental characteristics of Mach-Zehnder electro-optic travelling wave intensity modulators. We draw an analysis of the optical response of these modulators to a time varying drive voltage, modelised after a description of their technological conception. Then we review the...

40gbs-qpsk-modulationptical Complex Spectrum Analyzer Application Notes This application note proves the high efficiency of the Apex Technologies Optical Complex Spectrum Analyser AP2441B/AP2443B in measuring and testing any kind of usual modulation formats. Compared to a standard oscilloscope, the Optical Complex Spectrum Analyser AP2441B/AP2443B has a maximum bandwidth >6 THz due the complex spectral analysis principle giving access to the...

A frequency response analyser is a piece of test equipment designed to inject a sinewave into a circuit, and measure the frequency response of the circuit at multiple test points in order to generate a gain and phase response. This application provides Frequency Response Analysis (FRA) capabilities for the PicoScope instruments from Pico Technology. The FRA uses a common technique...

Metricon’s prism coupling instruments have been referenced in numerous scientific journal articles spanning a wide range of disciplines. This list of Journal References on the prism coupling technique is divided into the following categories: An initial short section entitled "Basic Theory of Prism Coupling" lists representative articles on the theory of thin film waveguides and the prism coupling technique. To...

Metricon’s Model 2010/M offers important advantages over ellipsometry for many applications - unmatched refractive index accuracy, dramatically simpler operation and data analysis, and greater tolerance of poor sample quality. Although prism couplers and ellipsometers can both be used to measure the index of bulk materials and to simultaneously measure film thickness and refractive index, there are major differences in the...

The Metricon Model 2010/M prism coupler offers unmatched ease and accuracy in measuring: Refractive index/birefringence of bulk materials Refractive index and thickness of thin films Loss of optical waveguides Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the Metricon 2010/M’s prism coupling technology provides unmatched index accuracy/resolution, and minimal sample preparation is required. The system also measures...

The Model 2010/M can be used to measure thickness and index for one or both films of a dual film structure (as many as four film parameters) provided the top film has a higher refractive index than the lower film. Dual film measurements on transparent substrates or underlying (third layer) films are even possible in many cases. Detailed specifications for...

The accuracy of the Model 2010/M’s refractive index measurement makes possible monitoring of the concentration of phosphorus (and potentially other dopants) in PSG and BPSG films with a combination of speed, simplicity, and sensitivity unmatched by other techniques. The phosphorus monitoring application is based on the fact that as phosphorus concentration in SiO2 increases, refractive index also increases. For the...