Lambda News

1-3 July 2025 Manchester Central, Manchester The Microscience Microscopy Congress is back for 2025! One of the biggest events of its kind in Europe, mmc2025 incorporating EMAG 2025 will bring you the very best in microscopy, imaging and cytometry from across the globe. With six parallel conference sessions, a world-class exhibition, workshops, satellite meetings, an international Imaging Competition and more...

21-22 May 2025 NEC Birmingham, Hall 5 FREE TO ATTEND - The UK's largest Expo supporting the R&D, Engineering, Sourcing, Manufacturing & Management of chemicals & formulated products. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting.

19-20 March 2025 Farnborough International Exhibition & Conference Centre Farnborough International Space Show connects the global space community across industry, defence, government and academia. The UK’s largest international and must-attend event in the aerospace calendar. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting.

Surface roughness refers to the fine texture of a part’s surface. Every manufactured part’s surface has three key components—form, waviness, and roughness. Together, they influence how well a part performs. The characteristics of these components are tied to the manufacturing process or processes used to create the part. This could be polishing, grinding, cutting, or edging to name a few.Surface...

Moving stages are essential but challenging components in semiconductor and nanotechnology manufacturing. These stages, used in wafer inspection, lithography, metrology ,and other applications can cause significant vibration that can affect tool performance and throughput if it is not mitigated properly.In this interview, Elias Brassitos, Senior Control Systems Engineer at AMETEK, talks to AZoMaterials about these challenges and solutions. TMC works...

The article "Vibration Control Solutions for Microscopy" focuses on the critical role of vibration control in ensuring accurate results in microscopy, especially for high-precision instruments like electron microscopes. Microscopes, particularly advanced models such as Scanning Electron Microscopes (SEM) or Atomic Force Microscopes (AFM), require extreme stability to capture high-resolution images. Even slight vibration from environmental factors such as nearby foot...

Lambda Photometrics is proud to serve as the exclusive B2B supplier of First Contact™ Polymer, further enhancing our product suite and reinforcing our commitment to comprehensive, high-quality solutions. This strategic partnership enriches Lambda's optical metrology portfolio by integrating a precise, reliable solution for optics cleaning, essential for accurate optical surface measurements. In this application note, we demonstrate the effectiveness of...

In this webinar, Fischione presented sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation...

Monday 11th November at 11amWe would like to invite you to join us for a live demonstration on the Near Field Probe Kit from Y.I.C. Technologies. The Near Field Probe Kit (NFPKit) is a unique and affordable solution to enhance product testing with reliable and accurate live scanning for highlighting EMC & EMI issues. The probes are used to locate...

Join us Tuesday, 12 November 2024 at 15.00 Successful correlative electron microscopy and atom probe tomography (APT) studies on metals require a surface and subsurface with minimal defects. The potential of these powerful analytical techniques can be hindered by surface damage during material processing, implanted Ga during focused ion beam (FIB) specimen preparation, or environmental degradation during specimen transfer in...