In this webinar, Fischione presented sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by concentrated Ar ion beam milling of metallic Mg APT specimens.
Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation can be completely removed or reduced by specimen preparation under controlled environments.
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Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions.
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Fischione Model 1040 NanoMill® TEM specimen preparation system
- Ultra-low energy ion source
- Concentrated ion beam
- Removes amorphous and implanted layers
- Ideal for post-focused ion beam processing and milling of conventionally prepared specimens
- Liquid nitrogen-cooled specimen stage
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Fischione Model 1062 TrionMill
Fischione Instruments’ Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses. The TrionMill’s three ion sources provide large-scale milling of planar and cross-section samples. High-energy operation allows rapid milling of large areas (up to 50 mm); low-energy operation allows gentle sample polishing.
- Three independently adjustable TrueFocus ion sources
- Planar sample sizes up to 50 mm diameter by 25 mm height
- Controllable beam diameter over a wide range of operating energies (100 eV to 10 keV)
- Liquid nitrogen-cooled sample stage (optional)
- Vacuum/inert gas/cryogenic transfer system protects environmentally sensitive samples (optional)
- Remote operation