Join us Tuesday, 12 November 2024 at 15.00
Successful correlative electron microscopy and atom probe tomography (APT) studies on metals require a surface and subsurface with minimal defects. The potential of these powerful analytical techniques can be hindered by surface damage during material processing, implanted Ga during focused ion beam (FIB) specimen preparation, or environmental degradation during specimen transfer in an ambient environment. Therefore, specimen preparation is a critical component of successful correlative analyses.
We will present sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by condensed Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation can be completely removed or reduced by specimen preparation under controlled environments. We will show improvement in APT yield using controlled environment workflow in combination with concentrated Ar ion beam milling.
Click HERE to register.
Join Cecile Bonifacio and Daniel Perea for this exciting webinar.
Cecile Bonifacio, Senior Applications Scientist, Fischione Instruments
Dr. Cecile Bonifacio focuses on the development of TEM applications for material science and provides application support for the TEM sample preparation products and cryo-transfer TEM holder product line through customer training and demonstrations.
Daniel Perea, Materials Scientist, Pacific Northwest National Laboratory
Dr. Daniel Perea is a materials scientist with the Structural Biology team in PNNL’s Environmental Molecular Sciences Division and the Environmental Molecular Sciences Laboratory (EMSL) user program. His research focus and expertise lie in using APT analysis to map the 3D atomic scale composition of materials.
Contact us on 01582 764334 to speak with one of our Product Specialists.
Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions
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Fischione Model 1040 NanoMill® TEM specimen preparation system
- Ultra-low energy ion source
- Concentrated ion beam
- Removes amorphous and implanted layers
- Ideal for post-focused ion beam processing and milling of conventionally prepared specimens
- Liquid nitrogen-cooled specimen stage
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Fischione Model 1062 TrionMill
Fischione Instruments’ Model 1062 TrionMill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analyses. The TrionMill’s three ion sources provide large-scale milling of planar and cross-section samples. High-energy operation allows rapid milling of large areas (up to 50 mm); low-energy operation allows gentle sample polishing.
- Three independently adjustable TrueFocus ion sources
- Planar sample sizes up to 50 mm diameter by 25 mm height
- Controllable beam diameter over a wide range of operating energies (100 eV to 10 keV)
- Liquid nitrogen-cooled sample stage (optional)
- Vacuum/inert gas/cryogenic transfer system protects environmentally sensitive samples (optional)
- Remote operation