Join us Tuesday, 12 November 2024 at 15.00

Successful correlative electron microscopy and atom probe tomography (APT) studies on metals require a surface and subsurface with minimal defects. The potential of these powerful analytical techniques can be hindered by surface damage during material processing, implanted Ga during focused ion beam (FIB) specimen preparation, or environmental degradation during specimen transfer in an ambient environment. Therefore, specimen preparation is a critical component of successful correlative analyses.
We will present sample preparation and analyses workflow under controlled environments using broad Ar ion beam milling and Ga FIB, followed by condensed Ar ion beam milling of metallic Mg APT specimens. Using Ar ion milling techniques (Model 1062 TrionMill and Model 1040 NanoMill® TEM specimen preparation system) on the bulk and APT specimens, surface damage and oxidation can be completely removed or reduced by specimen preparation under controlled environments. We will show improvement in APT yield using controlled environment workflow in combination with concentrated Ar ion beam milling.

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Join Cecile Bonifacio and Daniel Perea for this exciting webinar.

Cecile Bonifacio, Senior Applications Scientist, Fischione Instruments
Dr. Cecile Bonifacio focuses on the development of TEM applications for material science and provides application support for the TEM sample preparation products and cryo-transfer TEM holder product line through customer training and demonstrations.

Daniel Perea, Materials Scientist, Pacific Northwest National Laboratory
Dr. Daniel Perea is a materials scientist with the Structural Biology team in PNNL’s Environmental Molecular Sciences Division and the Environmental Molecular Sciences Laboratory (EMSL) user program. His research focus and expertise lie in using APT analysis to map the 3D atomic scale composition of materials.

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